The Effect of Structural Relaxation on the Diffusion of Au in Amorphous Pd80Si20
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ABSTRACTThe diffusivity of Au in sputter-deposited amorphous Pd80Si20 has been measured by Rutherford backscattering spectrometry (RBS) between 275°C and 380°C. A new method based on scaling of the evolution of the variance of the concentration profile was used to analyze the data. The diffusivity was found to be independent of the Au concentration below 3 at.%. Structural relaxation causes a time dependence that is evident at short times. The kinetics of this relaxation can be described by the bimolecular relaxation model used in the analysis of viscous flow.
1977 ◽
Vol 55
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pp. 2124-2132
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1996 ◽
Vol 194
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pp. 122-128
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1986 ◽
Vol 4
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pp. 2463-2469
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2002 ◽
Vol 82
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pp. 567-573
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