Stability and Relaxation of Point Defects in amorphous silicon

1992 ◽  
Vol 279 ◽  
Author(s):  
Raymond Lutz ◽  
Laurent J. Lewis

ABSTRACTWe have used molecular-dynamics to investigate the stability and relaxation of point defects — vacancies and interstitials — in a model of amorphous silicon, with the interactions between atoms described by the Stillinger-Weber empirical potential. The annihila-tion of point defects has been proposed as an important mechanism by which relaxation proceeds in amorphous silicon. Starting with a Wooten-Winer-Weaire model of a-Si, we “manually” create vacancies in the structure by removing a number of randomly-selected four-fold coordinated atoms. The system is then allowed to relax. Our calculations reveal unambiguously that, of a number of vacancies introduced in the model at low temperature, roughly a third are stable; these anneal out upon heating at room temperature. The vacancies seem, in most cases, to consist of a relatively large empty volume bounded by four atoms of which at least one is undercoordinated. Our study of interstitials seems to indicate that they diffuse through a “jump-and-bump” process, eventually annihilating when a large enough, properly coordinated, vacant volume is encountered.

2006 ◽  
Vol 527-529 ◽  
pp. 717-720 ◽  
Author(s):  
Sashi Kumar Chanda ◽  
Yaroslav Koshka ◽  
Murugesu Yoganathan

A room temperature PL mapping technique was applied to establish the origin of resistivity variation in PVT-grown 6H SiC substrates. A direct correlation between the native defect-related PL and resistivity was found in undoped (V-free) samples. In vanadium-doped samples with low vanadium content, the resistivity showed a good correlation with the total PL signal consisting of contributions from both vanadium and native point defects. Well-known UD1 and UD3 levels were revealed by low-temperature PL spectroscopy. Some correlation was observed between these low-temperature PL signatures and the resistivity distribution.


1995 ◽  
Vol 378 ◽  
Author(s):  
P. M. Fauchet ◽  
G. W. Wicks ◽  
Y. Kostoulas ◽  
A. I. Lobad ◽  
K. B. Ucer

AbstractThe presence of point defects is expected to influence the properties of free carrier in semiconductors. We have used the techniques of ultrafast laser spectroscopy to characterize the dynamics of photoinjected carriers in several III–V semiconductors grown at low temperature. The initial scattering time and the lifetime of the carriers become very short at low growth temperatures. Results obtained with low-temperature grown III–Vs are compared to those obtained with III–Vs grown at normal temperatures and amorphous silicon.


1997 ◽  
Vol 467 ◽  
Author(s):  
S. Sugiyama ◽  
J. Yang ◽  
S. Guha

ABSTRACTWe have studied light-induced degradation in hydrogenated and deuterated amorphous silicon alloy solar cells in which intrinsic layers were deposited by using SiH4+H2 and SiD4+D2 gas mixtures respectively. Replacing hydrogen with deuterium in the intrinsic layer of the cell improves stability against light exposure. On the other hand, cells in which intrinsic layers were deposited from SiD4+H2 and SiH4+D2 do not show any improvement in stability. This result shows that improved stability in deuterated cell does not originate from simple replacement of hydrogen with deuterium. From deuterium/hydrogen effusion measurements, we found similar effusion at low temperature (400 °C) in both deuterated film and hydrogenated film prepared with heavy dilution. The latter film was shown to have oriented microstructure which was correlated with higher stability. This correlation strongly indicates that microstructure of the material plays a key role in improving the stability.


1986 ◽  
Vol 71 ◽  
Author(s):  
Y. Shih ◽  
J. Washburn ◽  
R. Gronsky ◽  
E.R. Weber

AbstractAmorphization of silicon due to implantation of boron ions which is the lightest element used for I.C. fabrication processes, has been systematically studied for various temperatures, voltages and dose rates. A model for formation of amorphous silicon by light ion implantation is proposed. It is suggested that accumulation of point defects and/or clusters is required at the initial stage of amorphization process. Diinterstitial -divacancy pairs are suggested to be the embryos of amorphous zones formed during implantation at room temperature. Out -diffusion of highly mobile interstitials during amorphization is thought to explain differences in the critical energy for amorphization with low and high energy implantation at liquid nitrogen temperature.


2007 ◽  
Vol 131-133 ◽  
pp. 253-258 ◽  
Author(s):  
A. Carvalho ◽  
R. Jones ◽  
C. Janke ◽  
Sven Öberg ◽  
Patrick R. Briddon

The properties of point defects introduced by low temperature electron irradiation of germanium are investigated by first-principles modeling. Close Frenkel pairs, including the metastable fourfold coordinated defect, are modelled and their stability is discussed. It is found that damage evolution upon annealing below room temperature can be consistently explained with the formation of correlated interstitial-vacancy pairs if the charge-dependent properties of the vacancy and self-interstitial are taken into account. We propose that Frenkel pairs can trap up to two electrons and are responsible for conductivity loss in n-type Ge at low temperatures.


2018 ◽  
Vol 19 (11) ◽  
pp. 3513 ◽  
Author(s):  
Haiyan Duan ◽  
Jiao Shi ◽  
Kun Cai ◽  
Qing-Hua Qin

By bending a straight carbon nanotube and bonding both ends of the nanotube, a nanoring (or nano-wheel) is produced. The nanoring system can be driven to rotate by fixed outer nanotubes at room temperature. When placing some atoms at the edge of each outer tube (the stator here) with inwardly radial deviation (IRD), the IRD atoms will repulse the nanoring in their thermally vibration-induced collision and drive the nanoring to rotate when the repulsion due to IRD and the friction with stators induce a non-zero moment about the axis of rotational symmetry of the ring. As such, the nanoring can act as a wheel in a nanovehicle. When the repulsion is balanced with the intertubular friction, a stable rotational frequency (SRF) of the rotor is achieved. The results from the molecular dynamics simulation demonstrate that the nanowheel can work at extremely low temperature and its rotational speed can be adjusted by tuning temperature.


1999 ◽  
Vol 557 ◽  
Author(s):  
Xiao Liu ◽  
R.O. Pohl ◽  
R.S. Crandall

AbstractWe observe an increase of the low-temperature internal friction of hydrogenated amorphous silicon prepared by both hot-wire and plasma-enhanced chemical-vapor deposition after extended light-soaking at room temperature. This increase, and the associated change in sound velocity, can be explained by an increase of the density of two-level tunneling states, which serves as a measure of the lattice disorder. The amount of increase in internal friction is remarkably similar in both types of films although the amount and the microstructure of hydrogen are very different. Experiments conducted on a sample prepared by hot-wire chemical-vapor deposition show that this change anneals out gradually at room temperature in about 70 days. Possible relation of the light-induced changes in the low-temperature elastic properties to the Staebler-Wronski effect is discussed.


2017 ◽  
Vol 2017 ◽  
pp. 1-7 ◽  
Author(s):  
Shu-Ling Huang ◽  
Yung-Sheng Lin

Few studies have discussed the stability of gelled alginate bead size. Therefore, the present study investigated the dynamic shrinkage of gelled alginate beads affected by two common ionic crosslinkers at different concentrations and temperatures. The results indicate that the gelled alginate beads gradually shrank with longer gelling times. The beads incubated in a Ca2+ solution shrank more dramatically than those incubated in a Ba2+ solution. Those incubated at room temperature exhibited greater shrinkage than those incubated at a low temperature. A 25% size reduction occurred in the 1% Ca2+ solution at room temperature after 300 minutes of gelling time. The alginate beads gelled took at least 120 minutes to become stable after the ionic gelation process.


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