Enhancement in Adhesion of Pt Films on Ceramics by Helium Ion and Electron Irradiation, and a Study of their Electrochemical Behaviour.

1983 ◽  
Vol 27 ◽  
Author(s):  
D.K. Sood ◽  
P.D. Bond ◽  
S.P.S. Badwal

ABSTRACTThe adhesion of Pt films (10–330nm thick) sputter deposited on prepared substrates of yttria stabilized zirconia (YSZ) and alumina has been observed to be remarkably enhanced after irradiation with 2 MeV He++ ions and 5–30 keV electrons. The adhesion enhancement has been studied as a function ot beam energy, dose and film thickness. Thermal stability of adhesion enhancement and of the microstructure of ‘stitched’ films has been investigated. The electrochemical behaviour of ‘stitched’ Pt electrodes on YSZ has been studied by complex impedance spectroscopy.

2008 ◽  
Vol 28 (6) ◽  
pp. 1161-1167 ◽  
Author(s):  
I-Ming Hung ◽  
Kuan-Zong Fung ◽  
De-Tsai Hung ◽  
Min-Hsiung Hon

Author(s):  
David L. West ◽  
Fred C. Montgomery ◽  
Timothy R. Armstrong

Development of NOx sensing elements intended for operation at T ∼600 °C are described. The elements were fabricated by depositing co-planar La1-x Srx BO3 (B = Cr, Fe) and Pt electrodes on yttria-stabilized zirconia substrates. Characterization of the elements included response to NO2 and NO as well as the [O2] dependence of the NO2 response. Much stronger (∼ 40 mV for 450 ppm NO2 in 7 vol% O2 at 600 °C) sensing responses were observed for NO2 than NO, indicating these elements are best suited for detection of NO2. Pronounced asymmetries were observed between the NO2 step response and recovery times for the elements, with temperature being the primary variable governing the recovery times in the temperature range 500–700 °C.


2012 ◽  
Vol 18 (2) ◽  
pp. 371-378 ◽  
Author(s):  
Laxmikant V. Saraf

AbstractElectron backscatter diffraction (EBSD) is a powerful technique for surface microstructure analysis. EBSD analysis of cubic yttria-stabilized zirconia (YSZ) is demonstrated. The statistics related to EBSD indexing reliability shows that the probability of accurate grain orientation detection increased significantly when the electron beam energy was increased from 10 to 30 kV. As a result of better sampling with increased interaction volume, a disparity between local and average grain misorientation angle also exhibited the dependence of the electron beam energy to determine the accuracy of grain orientation. To study EBSD indexing reliability as a function of surface roughness and overlayer formation, rapid EBSD measurement tests were performed on (a) YSZ surfaces ion-polished at ion beam energies of 65 nA at 30 kV and 1 nA at 30 kV and (b) carbon-coated versus uncoated YSZ surfaces. The EBSD results at both 10 and 30 kV electron beam energies indicate that EBSD indexing reliability is negatively affected by higher ion beam milling current and amorphous overlayer formation.


2009 ◽  
Vol 483 (1-2) ◽  
pp. 437-441 ◽  
Author(s):  
M.A. Domínguez Crespo ◽  
A. García Murillo ◽  
A.M. Torres-Huerta ◽  
C. Yañez-Zamora. ◽  
F.de.J. Carrillo-Romo

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