Neutron Induced Autoradiography and Pixe Analysis

1992 ◽  
Vol 267 ◽  
Author(s):  
W. Stanley Taft ◽  
James W. Mayer ◽  
Howard C. Aderhold ◽  
Matt Keller ◽  
Gia Rizzo
Keyword(s):  
Neutron Activation ◽  
Linseed Oil ◽  
Ion Beam ◽  
Activation Process ◽  
Air Analysis ◽  
Binding Medium ◽  
Pixe Analysis ◽  
Triga Reactor ◽  
X Ray ◽  
Transparency Film

ABSTRACTWe have used the TRIGA reactor and the Ion Beam Facility at Cornell to illustrate neutron induced autoradiography and PIXE analysis of known pigments in demonstration paintings made for our undergraduate course, ‘Art, Isotopes and Analysis’. A group of pigments were chosen containing elements with half-lives detectable by the neutron activation process. The pigments (suspended in a binding medium of linseed oil) were first painted on test swatches of acetate and their characteristic x-ray lines measured with a 5 Mev beam of protons directed through a thin Kapton film for external (in air) analysis (PIXE).Three layers of images, each painted with a different pigment, overlay one another. The painting is then taken to the TRIGA reactor for neutron activation. After activation, the painting is placed in contact with sheets of Polaroid type AR positive transparency film at different times after exposure. The gamma spectra during the sequence are also measured to provide identification of the ‘active’ isotopes during each film exposure.

Micro-PIXE analysis system at NIRS-electrostatic accelerator facility for various applications

2015 ◽  
Vol 25 (03n04) ◽  
pp. 217-225 ◽  
Author(s):  
Masakazu Oikawa ◽  
Noriyoshi Suya ◽  
Teruaki Konishi ◽  
Takahiro Ishikawa ◽  
Tsuyoshi Hamano ◽  
...  
Keyword(s):  
Environmental Science ◽  
Ion Beam ◽  
Elemental Distribution ◽  
Accelerator Facility ◽  
Pixe Analysis ◽  
Electrostatic Accelerator ◽  
X Ray ◽  
Beam Analysis ◽  
Analysis System

A micro-PIXE analysis system based on the ion beam analysis system by Oxford Microbeams Ltd. has been developed at the NIRS-electrostatic accelerator facility. The introduction of the CdTe X-ray detector dramatically improved the detection efficiencies for heavy elements that are important in the life sciences and environmental science. This system has been used for various projects and has provided several meaningful results, thus establishing the micro-PIXE system as an effective tool for the determination of elemental distribution with a high spatial resolution. In this paper, outline of the features of the micro-PIXE system at NIRS along with its recent application in research are introduced.

scholarly journals Particle Induced X-ray Emission (PIXE): A Tool of Qualitative Elemental Analysis for Biological Sample

2013 ◽  
Vol 39 ◽  
pp. 1-10
Author(s):  
M Hasnat Kabir
Keyword(s):  
Detection Limit ◽  
Elemental Analysis ◽  
Biological Sample ◽  
Ion Beam ◽  
Internal Standard ◽  
Energy Calibration ◽  
Pixe Analysis ◽  
X Ray ◽  
University Of Technology ◽  
Good Detection Limit

The facility of ion beam laboratory at Kochi University of Technology (KUT) has been extended by installing the Particle Induced X-ray Emission (PIXE) technique, in order to provide qualitative and quantitative elemental analysis and in-air micro-PIXE analysis. This paper is a description of PIXE setup and its application in biological sample for qualitative elemental analysis. The energy calibration of the system shows linearity. The minimum detection limit indicates that the system has good detection limit. The homogeneity shows uniformity of the sample itself and the internal standard within the sample. A 4 MeV He++ ion beam was used to analyze shellfish samples. Analyzing samples, it was found that the lower Z elements as well as some trace elements were detected. DOI: http://dx.doi.org/10.3329/rujs.v39i0.16538 Rajshahi University J. of Sci. 39, 01-10 (2011)

POTENTIALITY OF PIXE TO MEASURE MULTILAYER FILM THICKNESS THROUGH COMPUTER SIMULATION

1997 ◽  
Vol 07 (03n04) ◽  
pp. 277-285
Author(s):  
Z. N. DAI ◽  
J. C. Soares ◽  
M. F. Silva
Keyword(s):  
Computer Simulation ◽  
Film Thickness ◽  
Multilayer Film ◽  
Ion Beam ◽  
Incident Beam ◽  
Absolute Calibration ◽  
Geometrical Parameters ◽  
X Rays ◽  
Pixe Analysis ◽  
X Ray

In this paper a method concerning the measurement of film thickness using PIXE analysis through computer simulation is described. Because of continuously decreasing cross sections for X-ray production by irradiation with the decreasing energy of the incident beam, PIXE has some potentiality to measure film thickness through computer simulation. Ratio of intensities of X-rays of two different elements is sensitive to the changes of energy and geometrical parameters, therefore by changing ion beam energy or the geometrical parameters, we can determine the film thickness to a good accuracy. This method doesn't require any kind of absolute calibration of experimental parameters, as only the ratios of X-ray intensities are taken into consideration. Therefore the inaccuracy in the procedure is only of statistical origin. A titanium film on molybdenum substrate is used as an example of the method. Preliminary result on a very thin Cr/Nd/Fe multilayer film on silicon substrate is presented to show the advantages and possible use of the method. More complex samples, such as multilayer samples with several elements in each layer, can be dealt with the same means too.

2 MeV-PIXE TECHNIQUE FOR COASTAL MATERIAL ANALYSIS

2011 ◽  
Vol 21 (03n04) ◽  
pp. 75-86 ◽  
Author(s):  
E. MANIKANDAN ◽  
BHARATH PRITHIVIRAJ ◽  
G. KAVITHA ◽  
P. MAGUDAPATHY ◽  
B. RAJAMANNAN
Keyword(s):  
East Coast ◽  
Ion Beam ◽  
Computer Code ◽  
Coastal Sediments ◽  
Coastal Sediment ◽  
Radiation Hazard ◽  
Pixe Analysis ◽  
Sediment Samples ◽  
X Ray ◽  
Interactive Mode

Ion beam analysis (IBA) is a group of PIXE (particle induced X-ray emission) techniques dedicated to the analysis of material for geological sample of coastal sediment samples. Coastal/Beach samples collected from South East Coast of Tamilnadu were analyzed by PIXE technique and obtain the elemental composition of coastal sediments. The PIXE analysis was carried out using 1.7 MV Tandem accelerators with the energy of 2 MeV protons at Indira Gandhi Centre for Atomic Research (IGCAR), Kalpakkam, Tamilnadu, India. The data analysis is normally done in an interactive mode of GUPIX analytical software computer code. The identified elements are present in the fingerprint X-ray spectrum in the range of ppm to ppb level. Therefore in this paper, introductory results concerning determination of concentration of chosen elements such as K , P , Ca , Ti , Fe , Cr , Co , Zn , Mn , Ni , Cu , Rb , Sr , As , Zr , Hf , Pb and Hg of coastal sediment samples from the east coast of Tamilnadu, India are presented. The validation of the technique is assessed using standard reference material (SRM) NIST 1646a estuarine sediment and the result shows the good agreement with the certified one. The results were used to assess environmental toxicity of heavy metals and radiation hazard in the study area.

DEVELOPMENT OF WAVELENGTH-DISPERSIVE MICRO-IBIL FOR THE CHEMICAL STRUCTURE ANALYSIS OF MICROMETER-SIZED PARTICLES

2012 ◽  
Vol 22 (01n02) ◽  
pp. 21-27 ◽  
Author(s):  
WATARU KADA ◽  
AKIHITO YOKOYAMA ◽  
MASASHI KOKA ◽  
TAKAHIRO SATOH ◽  
TOMIHIRO KAMIYA
Keyword(s):  
Background Noise ◽  
Chemical Structure ◽  
Ion Beam ◽  
Pixe Analysis ◽  
X Ray ◽  
Carbon Plate ◽  
Wavelength Resolution ◽  
Chemical States ◽  
Analysis System ◽  
Small Targets

Ion-Beam-Induced Luminescence (IBIL) spectra and images for the chemical states and crystal structures of micrometer-sized mineral targets were obtained by wavelength-dispersive IBIL analysis. A wavelength resolution of approximately 2 nm was achieved with a remote-controlled compact monochromator installed on an IBIL analysis system using a 3 MeV H+ microbeam. Several particulate mineral targets and aerosol samples were prepared on a carbon-plate sample holder that was selected to reduce the background noise and achieve a high S/N ratio in both the IBIL and Particle-Induced X-ray Emission (PIXE) analyses. The chemical composition of small targets that could not be well determined using micro-PIXE analysis was successfully visualized by the proposed IBIL analysis.

scholarly journals Trace Elements Analysis by Pixe Spectroscopy

2018 ◽  
Vol 26 (43) ◽  
pp. 25-32
Author(s):  
Matúš Beňo ◽  
Jozef Dobrovodský ◽  
Dušan Vaňa ◽  
Stanislav Minárik ◽  
Róbert Riedlmajer
Keyword(s):  
Trace Element ◽  
Detection System ◽  
Ion Beam ◽  
Trace Element Analysis ◽  
Sample Holder ◽  
Element Analysis ◽  
Pixe Analysis ◽  
X Ray ◽  
First Results ◽  
Analysis System

Abstract The trace element analysis system is presented using Proton Induced X-ray Emission (PIXE) analysis at a new Ion Beam Centre in Trnava. Standard PIXE system dedicated to the measurement of thick solid samples was extended by a new application for trace element analysis in aerosol samples. The sample holder was modified with respect to the dimensions of the aerosol filters, and a new sample holder and a Faraday cup (FC) were made. The first results of the PIXE aerosol analysis are presented in this paper. Furthermore, the geometric efficiency of the detection system was verified using 55Fe radioactive source emitting monoenergetic Mn X-ray lines. The measured data were compared with the Monte Carlo simulations regarding/disregarding the X-ray attenuation.

XRF and PIXE Analysis of light and Dark Adapted Ocular Tissue

1982 ◽  
Vol 40 ◽  
pp. 190-191
Author(s):  
B. J. Panessa ◽  
H. W. Kraner ◽  
J. B. Warren ◽  
K. W. Jones
Keyword(s):  
Trace Metals ◽  
Pigment Epithelium ◽  
Nerve Impulse ◽  
Light Response ◽  
Ocular Tissue ◽  
Emission Spectrometry ◽  
Retinol Dehydrogenase ◽  
Pixe Analysis ◽  
X Ray ◽  
Optimal Function

During photoexcitation the retina requires specific electrolytes and trace metals for optimal function (Na, Mg, Cl, K, Ca, S, P, Cu and Zn). According to Hagins (1981), photoexcitation and generation of a nerve impulse involves the movement of Ca from the rhodopsin-ladened membranes of the rod outer segment (ROS) to the plasmalemma, which in turn decreases the in-flow of Na into the photoreceptor, resulting in hyperpolarization. In toad isolated retinas, the presence of Ba has been found to increase the amplitude and prolong the delay of the light response (Brown and Flaming, 1978). Trace metals such as Cu, Zn and Se are essential for the activity of the metalloenzymes of the retina and retina pigment epithelium (RPE) (i.e. carbonic anhydrase, retinol dehydrogenase, tyrosinase, glutathione peroxidase, superoxide dismutase...). Therefore the content and fluctuations of these elements in the retina and choroid are of fundamental importance for the maintenance of vision. This paper presents elemental data from light and dark adapted frog ocular tissues examined by electron beam induced x-ray microanalysis, x-ray fluorescence spectrometry (XRF) and proton induced x-ray emission spectrometry (PIXE).

The Basic Physical Principles of Ion, Electron, and X-Ray Detectors and Their Application to Microanalysis

1985 ◽  
Vol 43 ◽  
pp. 154-157
Author(s):  
A.J. Tousimis
Keyword(s):  
Ion Beam ◽  
Depth Resolution ◽  
Sample Surface ◽  
High Energy ◽  
X Rays ◽  
X Ray ◽  
Electrons And Ions ◽  
Spatial Depth ◽  
Minimum Surface Area ◽  
Physical Principles

An integral and of prime importance of any microtopography and microanalysis instrument system is its electron, x-ray and ion detector(s). The resolution and sensitivity of the electron microscope (TEM, SEM, STEM) and microanalyzers (SIMS and electron probe x-ray microanalyzers) are closely related to those of the sensing and recording devices incorporated with them.Table I lists characteristic sensitivities, minimum surface area and depth analyzed by various methods. Smaller ion, electron and x-ray beam diameters than those listed, are possible with currently available electromagnetic or electrostatic columns. Therefore, improvements in sensitivity and spatial/depth resolution of microanalysis will follow that of the detectors. In most of these methods, the sample surface is subjected to a stationary, line or raster scanning photon, electron or ion beam. The resultant radiation: photons (low energy) or high energy (x-rays), electrons and ions are detected and analyzed.

3D Observation of Elemental Distribution of Si-Device using a Dedicated FIB/STEM System

2005 ◽  
Author(s):  
T. Yaguchi ◽  
M. Konno ◽  
T. Kamino ◽  
M. Ogasawara ◽  
K. Kaji ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Three Dimensional ◽  
Elemental Distribution ◽  
Multivariate Statistical ◽  
X Ray ◽  
Sample Rotation ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Elemental Maps

Abstract A technique for preparation of a pillar shaped sample and its multi-directional observation of the sample using a focused ion beam (FIB) / scanning transmission electron microscopy (STEM) system has been developed. The system employs an FIB/STEM compatible sample rotation holder with a specially designed rotation mechanism, which allows the sample to be rotated 360 degrees [1-3]. This technique was used for the three dimensional (3D) elemental mapping of a contact plug of a Si device in 90 nm technology. A specimen containing a contact plug was shaped to a pillar sample with a cross section of 200 nm x 200 nm and a 5 um length. Elemental analysis was performed with a 200 kV HD-2300 STEM equipped with the EDAX genesis Energy dispersive X-ray spectroscopy (EDX) system. Spectrum imaging combined with multivariate statistical analysis (MSA) [4, 5] was used to enhance the weak X-ray signals of the doped area, which contain a low concentration of As-K. The distributions of elements, especially the dopant As, were successfully enhanced by MSA. The elemental maps were .. reconstructed from the maps.

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