Mosaic Spread of the Heteroepitaxial Structures from Renninger Scan

1992 ◽  
Vol 262 ◽  
Author(s):  
S. L. Morelhão ◽  
L. P. Cardoso

ABSTRACTIn this work, a method of obtaining mosaic spread of the heteroepitaxial structures using Renninger scan (RS) peak profiles is reported. A simulation program was developed in order to account for the influence of the wavelengths, incident beam divergence, sample mosaic spread (layer and substrate) in the profile of the RS peaks. Surface three beam multiple diffraction cases with a forbidden or even very weak primary reflections are used to provide simpler intensity expressions and high intensity in RS. GaAs/Si samples have been analyzed as an application of this method.

2001 ◽  
Vol 34 (2) ◽  
pp. 157-165 ◽  
Author(s):  
E. Rossmanith ◽  
A Hupe ◽  
R. Kurtz ◽  
H. Schmidt ◽  
H.-G. Krane

In a previous paper by Rossmanith [J. Appl. Cryst.(2000),33, 1405–1414], expressions for the calculation of multiple-diffraction patterns observed in ω–ψ scans of Bragg reflections were derived within the framework of the kinematical theory, taking into account the divergence and wavelength spread of the incident beam, as well as the mosaic structure of the crystal sample. Agreement with CuKα experiments was demonstrated. In this paper, it is shown that the theoretical expressions are also suitable for synchrotron radiation experiments.


1980 ◽  
Vol 118 (3) ◽  
pp. 375-381 ◽  
Author(s):  
B. R. Brown ◽  
M. A. G. Halliwell ◽  
B. J. Isherwood

2000 ◽  
Vol 33 (2) ◽  
pp. 323-329 ◽  
Author(s):  
Elisabeth Rossmanith

The `intensity' (power) profiles obtained with the rotating-crystal method are derived in the framework of the kinematical theory for a spherically shaped crystal bathed in a parallel monochromatic incident beam. It is shown that in the case of the ψ scanning technique, the `particle size effect' can cause appreciable broadening of the Bragg intensity profiles.


1985 ◽  
Vol 7 (5) ◽  
pp. 499-507
Author(s):  
Dhananjai Pandey ◽  
S Lele ◽  
Lalita Prasad ◽  
J P Gauthier

Author(s):  
V.B. Nguyen ◽  
Л.А. Губанова ◽  
D.B. Bui

Spectral characteristics of narrow-band optical filters based on frustrated total internal reflection is analyzed considering the Gaussian distribution of angle of incidence. The spectral characteristics were calculated with and without incident beam divergence. We showed that when the spectral characteristics of these optical filters is measured, the incident beam divergence should not exceed a certain limit value, which is a few angular minutes.


2014 ◽  
Vol 777 ◽  
pp. 105-111 ◽  
Author(s):  
Hiroshi Suzuki ◽  
Stefanus Harjo ◽  
Jun Abe ◽  
Koichi Akita

Effects of beam divergence on pseudo-strains observed in time-of-flight (TOF) neutron diffraction, which overlapped with the neutron attenuation effect and the surface-effect, were investigated. The through-surface strain scanning on an annealed steel plate was performed in different instrument resolutions by controlling the incident beam divergence. Typical pseudo-strain distributions were observed, but they showed different trend according to the beam divergence. Furthermore, it was demonstrated that the pseudo-strains induced in strain scanning measurements of coarse grain materials can be suppressed by controlling the incident beam divergence. Therefore, the incident beam divergence must be carefully considered to reduce pseudo-strains in time-of-flight neutron diffractometry.


2000 ◽  
Vol 33 (6) ◽  
pp. 1405-1414 ◽  
Author(s):  
Elisabeth Rossmanith

Expressions for the calculation of multiple-diffraction patterns observed in ω–ψ scans of Bragg reflections are derived within the framework of the kinematical theory, taking into account the divergence and wavelength-spread of the incident beam as well as the mosaicity of the crystal sample. The theoretical results can be applied to X-ray tube radiation as well as synchrotron radiation experiments. A 189.9° experimental CuKα \bar2\bar2\bar2 ω–ψ scan of diamond is compared with the corresponding theoretical multiple-diffraction pattern.


2020 ◽  
Vol 53 (4) ◽  
pp. 1073-1079
Author(s):  
Danae Prokopiou ◽  
James McGovern ◽  
Gareth Davies ◽  
Simon Godber ◽  
Paul Evans ◽  
...  

A new approach to parafocusing X-ray diffraction implemented with an annular incident beam is demonstrated for the first time. The method exploits an elliptical specimen path on a flat sample to produce relatively high intensity maxima that can be measured with a point detector. It is shown that the flat-specimen approximation tolerated by conventional Bragg–Brentano geometries is not required. A theoretical framework, simulations and experimental results for both angular- and energy-dispersive measurement modes are presented and the scattering signatures compared with data obtained with a conventional pencil-beam arrangement.


1983 ◽  
Vol 27 ◽  
pp. 149-158 ◽  
Author(s):  
Marc Barral ◽  
Jean-Michel Sprauel ◽  
Jean-Lou Lebrun ◽  
Gérard Maeder ◽  
Stephan Megtert

The study of the mechanical behaviour of materials by X-ray measurements in a classical laboratory is limited by the possibilities of the X-ray tubes used. Some crystallographic planes are not conducive to good diffraction conditions and the radiation characteristics' may not be optimum. The use of synchrotron radiation resolves many of these problems by providing a continuously variable wavelength which allows measurements of stress and stress gradients to be carried out in very good conditions. The high intensity and perfectly monochromated radiation with a small beam divergence are very helpful for microstrain measurements.


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