Subgap Absorption and Electrical Properties of Compositional Multilayers of a-Si:H and Alloys

1992 ◽  
Vol 258 ◽  
Author(s):  
Norbert Bernhard ◽  
Gottfried H. Bauer

ABSTRACTUrbach tails and midgap absorption, as determined by PDS, and temperature dependent coplanar and sandwich conductivity were systematically investigated on compositional multilayers of a-Si:H and its alloys with Ge and C, under the main aspect of a critical evaluation with respect to a possible existence of quantum size effects. Both electronic well and barrier widths were varied, with and without keeping the mean composition of the multilayers constant. Neither the overall dependences of the Urbach slopes, nor of the conductivity activation energies and room temperature αdark values are consistent with a quantization picture. Other effects, as imposing on each other the own sublayer's degree of structural disorder, and adjustment of the Fermi level by charge transfer, play a dominant role and may feign quantum size effects, if in a multilayer series only variation of the well widths is considered.

MRS Bulletin ◽  
2000 ◽  
Vol 25 (11) ◽  
pp. 66-71 ◽  
Author(s):  
George Christou ◽  
Dante Gatteschi ◽  
David N. Hendrickson ◽  
Roberta Sessoli

Magnets are widely used in a large number of applications, and their market is larger than that of semiconductors. Information storage is certainly one of the most important uses of magnets, and the lower limit to the size of the memory elements is provided by the superparamagnetic size, below which information cannot be permanently stored because the magnetization freely fluctuates. This occurs at room temperature for particles in the range of 10–100 nm, owing to the nature of the material. However, even smaller particles can in principle be used either by working at lower temperatures or by taking advantage of the onset of quantum size effects, which can make nanomagnets candidates for the construction of quantum computers.


1991 ◽  
Vol 16 (6) ◽  
pp. 623-638 ◽  
Author(s):  
P.A. Badoz ◽  
F. Arnaud d'Avitaya ◽  
E. Rosencher

1983 ◽  
Vol 44 (C10) ◽  
pp. C10-375-C10-378 ◽  
Author(s):  
P. Ahlqvist ◽  
P. de Andrés ◽  
R. Monreal ◽  
F. Flores

1968 ◽  
Vol 96 (9) ◽  
pp. 61-86 ◽  
Author(s):  
B.A. Tavger ◽  
V.Ya. Demikhovskii

1997 ◽  
Vol 229 (6) ◽  
pp. 401-405 ◽  
Author(s):  
A. Crépieux ◽  
C. Lacroix ◽  
N. Ryzhanova ◽  
A. Vedyayev

2006 ◽  
Vol 100 (11) ◽  
pp. 114905 ◽  
Author(s):  
M. Cattani ◽  
M. C. Salvadori ◽  
A. R. Vaz ◽  
F. S. Teixeira ◽  
I. G. Brown

1993 ◽  
Vol 97 (37) ◽  
pp. 9493-9498 ◽  
Author(s):  
Ladislav Kavan ◽  
Tiziana Stoto ◽  
Michael Graetzel ◽  
Donald Fitzmaurice ◽  
Valery Shklover

1992 ◽  
Vol 283 ◽  
Author(s):  
R. Tsu ◽  
L. Ioriatti ◽  
J. F. Harvey ◽  
H. Shen ◽  
R. A. Lux

ABSTRACTThe reduction of the dielectric constant due to quantum confinement is studied both experimentally and theoretically. Angle resolved ellipsometry measurements with Ar- and He-Ne-lasers give values for the index of refraction far below what can be accounted for from porosity alone. A modified Penn model to include quantum size effects has been used to calculate the reduction in the static dielectric constant (ε) with extreme confinement. Since the binding energy of shallow impurities depends inversely on ε2, the drastic decrease in the carrier concentration as a result of the decrease in ε leads to a self-limiting process for the electrochemical etching of porous silicon.


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