New Results on Enhanced Deuterium Diffusion Under Illumination in Amorphous Silicon

1992 ◽  
Vol 258 ◽  
Author(s):  
Howard M. Branz ◽  
Sally E. Asher ◽  
Brent P. Nelson

ABSTRACTWe measure the light-enhancement of D diffusion in hydrogenated amorphous silicon and determine that the mechanism for the effect is an increase of the rate of Si-D bond breaking under illumination. We exclude light-induced heating of the sample and light-induced excitation of D between dissimilar materials as sources of the light-enhancement. It is a bulk effect, most likely caused by excess carriers. We are able to observe the light-induced effect with 380 mW-cm-2 of red light, an intensity only slightly larger than the intensity normally used to induce the Staebler-Wronski effect. At room temperature, the effect is unobservable and we derive an upper bound of 2 × 10-8 photon-1 for the efficiency of light-induced Si-D bond breaking. Implications for the Staebler-Wronski effect are discussed.

1998 ◽  
Vol 227-230 ◽  
pp. 1164-1167 ◽  
Author(s):  
Oleg Gusev ◽  
Mikhail Bresler ◽  
Alexey Kuznetsov ◽  
Vera Kudoyarova ◽  
Petr Pak ◽  
...  

1992 ◽  
Vol 258 ◽  
Author(s):  
J. Fan ◽  
J. Kakalios

ABSTRACTThe room temperature non-radiative efficiency, defined as the ratio of the heat released per absorbed photon for doped and undoped hydrogenated amorphous silicon (a-Si:H) has been measured using photo-pyroelectric spectroscopy (PPES) for photon energies ranging from 2.5 to 1.6 eV. There is a fairly sharp minimum in the non-radiative efficiency when the a-Si:H is illuminated with near bandgap photons. We describe a model wherein this minimum arises from the variation in the amount of heat generated by free carrier thermalization as the incident photon energy is varied, and report measurements of the excitation kinetics of the non-radiative efficiency which support this proposal.


1991 ◽  
Vol 219 ◽  
Author(s):  
A. Wynveen ◽  
J. Fan ◽  
J. Kakalios ◽  
J. Shinar

ABSTRACTStudies of r.f. sputter deposited hydrogenated amorphous silicon (a-Si:H) find that the light induced decrease in the dark conductivity and photoconductivity (the Staebler-Wronski effect) is reduced when the r.f. power used during deposition is increased. The slower Staebler-Wronski effect is not due to an increase in the initial defect density in the high r.f. power samples, but may result from either the lower hydrogen content or the smaller optical gap found in these films.


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