The Influence of the Void Structure on Deuterium Diffusion in a-Si:H

1992 ◽  
Vol 258 ◽  
Author(s):  
M. J. Van Den Boogaard ◽  
S. J. Jones ◽  
Y. Chen ◽  
D. L. Williamson ◽  
R. A. Hakvoort ◽  
...  

ABSTRACTWe have used small-angle X-ray scattering (SAXS) and Doppler-broadening measurements of positron-annihilation radiation to study changes in the microvoid distribution in PECVD a-Si:H films during annealing. From a comparison of data on deuterium diffusion with information obtained from SAXS we conclude that changes, during annealing, in the dispersive character of deuterium diffusion are likely to be caused by void formation through clustering of smaller structural defects.

1981 ◽  
Vol 26 (12) ◽  
pp. 4175-4192 ◽  
Author(s):  
S. Kaneko ◽  
J. E. Frederick ◽  
D. McIntyre

2016 ◽  
Vol 84 ◽  
pp. 100-110 ◽  
Author(s):  
Sandeep K. Sharma ◽  
Jyoti Prakash ◽  
Jitendra Bahadur ◽  
Manjulata Sahu ◽  
Subhashish Mazumder ◽  
...  

1991 ◽  
Vol 227 ◽  
Author(s):  
M.I. Tsapovestsky ◽  
V.K. Lavrentiev ◽  
S.A. Tishin

ABSTRACTThe behavior of glassy polymers was studied with the aid of mechanical tests on the basis of free volume. Three types of experiments were carried out and interpreted using modern ideas about the structure of free volume. They were: 1. The study of changes in the total free volume occurring as a result of deformation (by measurement of density) 2. The study of micro voids and their changes on deformation using small angle X-ray scattering (SAXS) and positron annihilation 3. The study of mobile regions by the measurement of dielectric loss (using an original interpretation) during deformation. This allows several parts of the total free volume to be distinguished and investigated. A model for the free volume relaxation during deformation is proposed.


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