A Comparison of Electron Energy Loss Spectroscopy and Electron Diffraction for Polycrystalline and Xe+ Irradiated Nickel Silicides
Keyword(s):
ABSTRACTVariations in the valence and core level electron energy loss spectroscopy (EELS) peaks are studied as a function of nickel silicide composition.Analysis of the EELS spectra in comparison with the electron diffraction patterns show the plasmon energies fingerprint the silicide phases. The EELS core level spectra reflect the Si bonding and the electronic density of states in each phase.Irradiated Ni 2Si becomes amorphous causing a change in the plasmon peak energy and the Si L23peaks.
1995 ◽
Vol 99
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pp. 479-490
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1998 ◽
Vol 58
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pp. 11970-11981
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1988 ◽
Vol 36
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pp. 2597-2604
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2000 ◽
Vol 470
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pp. 171-185
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1986 ◽
Vol 60
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pp. 257-260
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1987 ◽
Vol 87
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pp. 7332-7340
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