Facet Formation on Single Crystal TiO2 Surfaces Studied by Atomic Force Microscopy

1991 ◽  
Vol 237 ◽  
Author(s):  
M. D. Antonik ◽  
J. C. Edwards ◽  
R. J. Lad

ABSTRACTAtomic force microscopy (AFM) and low energy electron diffraction (LEED) have been used to study the faceting behavior on (001) and (100) surfaces of a TiO2 single crystal. On the TiO2 (001) surface, LEED patterns characteristic of {011} facet planes develop after annealing below 900 °C in agreement with previous studies, but AFM shows a complex surface morphology consisting of a large distribution of facet sizes and orientations. After annealing at 1300 °C, facets do not form but rather a network of 5 – 30 nm high ridges develops over the entire surface. These ridges may be the result of surface defects produced by changes in bulk stoichiometry during annealing. On the TiO2 (100) surface, facets are also observed after annealing below 900 °C. However, these facets have extremely small height to width aspect ratios and are not discernible with LEED.

Microbiology ◽  
2011 ◽  
Vol 157 (11) ◽  
pp. 3049-3058 ◽  
Author(s):  
Jun Dong ◽  
Karla S. L. Signo ◽  
Elizabeth M. Vanderlinde ◽  
Christopher K. Yost ◽  
Tanya E. S. Dahms

Atomic force microscopy was used to investigate the surface ultrastructure, adhesive properties and biofilm formation of Rhizobium leguminosarum and a ctpA mutant strain. The surface ultrastructure of wild-type R. leguminosarum consists of tightly packed surface subunits, whereas the ctpA mutant has much larger subunits with loose lateral packing. The ctpA mutant strain is not capable of developing fully mature biofilms, consistent with its altered surface ultrastructure, greater roughness and stronger adhesion to hydrophilic surfaces. For both strains, surface roughness and adhesive forces increased as a function of calcium ion concentration, and for each, biofilms were thicker at higher calcium concentrations.


1999 ◽  
Vol 150 (1-4) ◽  
pp. 125-130 ◽  
Author(s):  
L.M Sánchez-Brea ◽  
J.A Gómez-Pedrero ◽  
E Bernabeu

1995 ◽  
Vol 148 (1-2) ◽  
pp. 201-206 ◽  
Author(s):  
Kazuo Onuma ◽  
Atsuo Ito ◽  
Tetsuya Tateishi ◽  
Tetsuya Kameyama

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