ArF Excimer Laser Doping into Amorphous Silicon thin films

1991 ◽  
Vol 219 ◽  
Author(s):  
M. Elliq ◽  
A. Slaoui ◽  
E. Fogarassy ◽  
H. Pattyn ◽  
R. Stuck ◽  
...  
Keyword(s):  
Amorphous Silicon ◽  
Excimer Laser ◽  
Polycrystalline Silicon ◽  
Surface Concentration ◽  
Silicon Thin Film ◽  
Molten Layer ◽  
Silicon Thin Films ◽  
One Step ◽  
Arf Excimer Laser ◽  
Rate Limiting

ABSTRACTDoping of amorphous silicon (a-Si or a-Si:H) coated by a spin-on oxide film containing the dopant (phosphorus or boron) using an ArF excimer laser has been investigated as a function of laser fluence, number of pulses and dopant film thickness. From these results, it is found that the surface concentration and the junction depth vary with the number of pulses, and that the doping process is rate limiting. Sheet resistance lower than 10 kΩ/□ have been obtained. It is also shown that for a-Si:H films, laser irradiation produces exodiffusion of hydrogen from the molten layer resulting in rough surface. This one-step process seems suitable for polycrystalline silicon thin film transistors (TFT's) fabrication.

One-step growth of polycrystalline silicon thin films at low-temperature by ArF excimer laser-induced photo-CVD

1992 ◽  
Vol 54 ◽  
pp. 35-40 ◽  
Author(s):  
M. Elliq ◽  
E. Fogarassy ◽  
C. Fuchs ◽  
J.P. Stoquert ◽  
S. de Unamuno ◽  
...  
Keyword(s):  
Thin Films ◽  
Low Temperature ◽  
Excimer Laser ◽  
Polycrystalline Silicon ◽  
Silicon Thin Films ◽  
One Step ◽  
Step Growth ◽  
Arf Excimer Laser

Threshold voltage of excimer-laser-annealed polycrystalline silicon thin-film transistors

2000 ◽  
Vol 76 (17) ◽  
pp. 2442-2444 ◽  
Author(s):  
C. T. Angelis ◽  
C. A. Dimitriadis ◽  
F. V. Farmakis ◽  
J. Brini ◽  
G. Kamarinos ◽  
...  
Keyword(s):  
Thin Film ◽  
Excimer Laser ◽  
Threshold Voltage ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film

A Center-Offset Polycrystalline-Silicon Thin-Film Transistor With ${\rm n}^{+}$ Amorphous-Silicon Contacts

2009 ◽  
Vol 30 (1) ◽  
pp. 36-38 ◽  
Author(s):  
J. H. Oh ◽  
D. H. Kang ◽  
W. H. Park ◽  
J. Jang ◽  
Y. J. Chang ◽  
...  
Keyword(s):  
Thin Film ◽  
Amorphous Silicon ◽  
Polycrystalline Silicon ◽  
Thin Film Transistor ◽  
Silicon Thin Film

Phosphorus and Boron Doping of Silicon Thin Films Using ArF Excimer Laser

1991 ◽  
Vol 236 ◽  
Author(s):  
A. Slaoui ◽  
M. Elliq ◽  
H. Pattyn ◽  
E. Fogarassy ◽  
S. De Unamuno ◽  
...  
Keyword(s):  
Sheet Resistance ◽  
Excimer Laser ◽  
Silicon Film ◽  
Boron Doping ◽  
Electrical Characteristics ◽  
Silicon Thin Films ◽  
Shallow Junctions ◽  
Doping Technique ◽  
Arf Excimer Laser ◽  
B Doping

AbstractThis work describes phosphorus (P) and boron (B) doping of polysilicon filns deposited on quartz. Doping is achieved by means of a pulsed ArF excimer laser to melt a controlled thickness of amorphous or polycristalline silicon film coated with a spinon silicate glass (SOG) film containing the dopant (P or B). We have investigated the influence of doping parameters such as laser fluence, number of shots and dopant film thickness on the sheet resistance and the incorporation rate. From these results, we have shown that high doped, shallow junctions presenting sheet resistance lower than 5 kΩ/∠ can be obtained. Poly-Si TFT's with good electrical characteristics were successfully fabricated using this doping technique.

In situ excimer laser irradiation as cleaning tool for solid phase epitaxy of laser crystallized polycrystalline silicon thin films

2013 ◽  
Vol 210 (12) ◽  
pp. 2729-2735 ◽  
Author(s):  
Ingmar Höger ◽  
Thomas Schmidt ◽  
Anja Landgraf ◽  
Martin Schade ◽  
Annett Gawlik ◽  
...  
Keyword(s):  
Thin Films ◽  
Laser Irradiation ◽  
Excimer Laser ◽  
Polycrystalline Silicon ◽  
Solid Phase ◽  
Solid Phase Epitaxy ◽  
Silicon Thin Films ◽  
Excimer Laser Irradiation
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