scholarly journals In-Situ Derivative Cyclic Voltabsorptometric Studies On Poly-3-Methylthiophene

1990 ◽  
Vol 214 ◽  
Author(s):  
Sally N. Hoier ◽  
David S. Ginley ◽  
Su-Moom Park

ABSTRACTSpectroscopic behavior of poly-3-methylthiophene (P3MT) has been studied employing derivative cyclic volt-absorptometric (DCVA) techniques. In the DCVA technique, the derivative absorption signal (dA/dt) is recorded as a function of the applied potential. The dA/dt signals, the spectroscopic analog of electrochemical currents in cyclic voltammetry, are capable of monitoring the potential dependency for the absorption band effectively discriminating against nonfaradaic signals. The DCVA studies on the P3MT system show that the neutral form of P3MT, absorbing at 490 nm (at less than 0.3 V vs. Ag), changes to the radical cation form, which absorbs at 760 nm. Initially, the formation of the radical cation goes through an isosbestic point, indicating that the conversion of the neutral to radical (polaron) form is chemically reversible. However, upon increasing the electrode potential, the rate of the radical formation at 760 nm starts to decrease, with the formation of another band at about 1250 nm, attributable to a quinoid (bipolaron) form. This trend begins above about 0.6 V, shifting to a more positive voltage as the thickness of the film grows. This observation indicates that the electrochemical conversion of the neutral to radical form, followed by the quinoid form, is a slow process controlled by the diffusion of counter ions through the film. In-situ conductivity measurements as a function of applied potentials support the observed spectroscopic behavior.

2002 ◽  
Vol 126 (2-3) ◽  
pp. 193-198 ◽  
Author(s):  
P.-H. Aubert ◽  
L. Groenendaal ◽  
F. Louwet ◽  
L. Lutsen ◽  
D. Vanderzande ◽  
...  

2016 ◽  
Vol 437 ◽  
pp. 43-47 ◽  
Author(s):  
C.B. Bragatto ◽  
D.R. Cassar ◽  
O. Peitl ◽  
J.-L. Souquet ◽  
A.C.M. Rodrigues

2010 ◽  
Vol 663-665 ◽  
pp. 542-545 ◽  
Author(s):  
Bing Jie Zhu ◽  
Xin Wei Wang ◽  
Mei Fang Zhu ◽  
Qing Hong Zhang ◽  
Yao Gang Li ◽  
...  

The PANI/ITO conducting nanocomposites have been synthesized by in-situ polymerization. The obtained nanocomposites were characterized by X-ray diffraction pattern, scanning electron microscopy and Fourier transform infrared. Electrical conductivity measurements on the samples pressed into pellets showed that the maximum conductivity attained 2.0 ± 0.05 S/cm for PANI/ITO nanocomposites, at ITO doping concentration of 10 wt%. The results of the present work may provide a simple, rapid and efficient approach for preparing PANI/ITO nanocomposites.


1989 ◽  
Vol 28 (1-2) ◽  
pp. 165-170 ◽  
Author(s):  
L. Olmedo ◽  
I. Chanteloube ◽  
A. Germain ◽  
M. Petit ◽  
E.M. Geniès

2003 ◽  
Vol 10 (06) ◽  
pp. 963-980 ◽  
Author(s):  
SHUJI HASEGAWA ◽  
ICHIRO SHIRAKI ◽  
FUHITO TANABE ◽  
REI HOBARA ◽  
TAIZO KANAGAWA ◽  
...  

For in-situ measurements of the local electrical conductivity of well-defined crystal surfaces in ultrahigh vacuum, we have developed two kinds of microscopic four-point probe methods. One involves a "four-tip STM prober," in which four independently driven tips of a scanning tunneling microscope (STM) are used for measurements of four-point probe conductivity. The probe spacing can be changed from 500 nm to 1 mm. The other method involves monolithic micro-four-point probes, fabricated on silicon chips, whose probe spacing is fixed around several μm. These probes are installed in scanning-electron-microscopy/electron-diffraction chambers, in which the structures of sample surfaces and probe positions are observed in situ. The probes can be positioned precisely on aimed areas on the sample with the aid of piezoactuators. By the use of these machines, the surface sensitivity in conductivity measurements has been greatly enhanced compared with the macroscopic four-point probe method. Then the conduction through the topmost atomic layers (surface-state conductivity) and the influence of atomic steps on conductivity can be directly measured.


2000 ◽  
Vol 07 (05n06) ◽  
pp. 533-537 ◽  
Author(s):  
ICHIRO SHIRAKI ◽  
TADAAKI NAGAO ◽  
SHUJI HASEGAWA ◽  
CHRISTIAN L. PETERSEN ◽  
PETER BØGGILD ◽  
...  

For in-situ measurements of surface conductivity in ultrahigh vacuum (UHV), we have installed micro-four-point probes (probe spacings down to 4 μm) in a UHV scanning electron microscope (SEM) combined with scanning reflection–high-energy electron diffraction (RHEED). With the aid of piezoactuators for precise positioning of the probes, local conductivity of selected surface domains of well-defined superstructures could be measured during SEM and RHEED observations. It was found that the surface sensitivity of the conductivity measurements was enhanced by reducing the probe spacing, enabling the unambiguous detection of surface-state conductivity and the influence of surface defects on the electrical conduction.


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