scholarly journals X-Ray Reflectivity Measurements of Surface Roughness Using Energy Dispersive Detection

1990 ◽  
Vol 208 ◽  
Author(s):  
E. Chason ◽  
D. T. Warwick
Keyword(s):  
Surface Roughness ◽  
Excellent Agreement ◽  
Ion Bombardment ◽  
Energy Dispersive ◽  
New Technique ◽  
Scattering Angle ◽  
X Ray ◽  
Growth Chambers ◽  
A New Technique ◽  
Better Than

ABSTRACTWe describe a new technique for measuring X-ray reflectivity using energy dispersive X-ray detection. The benefits of this method are the use of a fixed scattering angle and parallel detection of all energies simultaneously. These advantages make the technique more compatible with growth chambers and useable with laboratory X-ray sources. We find excellent agreement between the calculated Fresnel reflectivity and the reflectivity obtained from a smooth Ge (001) surface. Reflectivities obtained during 500 eV Xe ion bombardment of Ge surfaces demonstrate the sensitivity of the technique to be better than 1 Å.

Energy Dispersive Near Edge X-Ray Absorption Fine Structure in the Soft X-Ray Region: A New Technique to Investigate Surface Reactions

2001 ◽  
Vol 40 (Part 2, No. 7B) ◽  
pp. L718-L720 ◽  
Author(s):  
Kenta Amemiya ◽  
Hiroshi Kondoh ◽  
Akira Nambu ◽  
Masaoki Iwasaki ◽  
Ikuyo Nakai ◽  
...  
Keyword(s):  
Fine Structure ◽  
Surface Reactions ◽  
Energy Dispersive ◽  
New Technique ◽  
X Ray ◽  
Absorption Fine ◽  
A New Technique ◽  
X Ray Absorption

A new technique for measuring the polarization from celestial X-ray sources

1993 ◽  
Author(s):  
Robert Austin ◽  
Takahisa Minamitani ◽  
Brian Ramsey
Keyword(s):  
New Technique ◽  
X Ray ◽  
A New Technique

scholarly journals Pinning down the superfluid and measuring masses using pulsar glitches

2015 ◽  
Vol 1 (9) ◽  
pp. e1500578 ◽  
Author(s):  
Wynn C. G. Ho ◽  
Cristóbal M. Espinoza ◽  
Danai Antonopoulou ◽  
Nils Andersson
Keyword(s):  
Observational Data ◽  
New Technique ◽  
Timing Behavior ◽  
Fundamental Physics ◽  
X Ray ◽  
The Core ◽  
Timing Precision ◽  
A New Technique

Pulsars are known for their superb timing precision, although glitches can interrupt the regular timing behavior when the stars are young. These glitches are thought to be caused by interactions between normal and superfluid matter in the crust of the star. However, glitching pulsars such as Vela have been shown to require a superfluid reservoir that greatly exceeds that available in the crust. We examine a model in which glitches tap the superfluid in the core. We test a variety of theoretical superfluid models against the most recent glitch data and find that only one model can successfully explain up to 45 years of observational data. We develop a new technique for combining radio and x-ray data to measure pulsar masses, thereby demonstrating how current and future telescopes can probe fundamental physics such as superfluidity near nuclear saturation.

scholarly journals A new technique of the X-ray photography of the forearm (The 4th report)

1996 ◽  
Vol 52 (10) ◽  
pp. 1401
Author(s):  
T Naoi ◽  
T Ugajin ◽  
Y Hishikawa ◽  
S Mori ◽  
T. Itou ◽  
...  
Keyword(s):  
New Technique ◽  
X Ray ◽  
A New Technique

Balloon Tamponade of the Pharynx in Transnasosphenoidal Operations

Neurosurgery ◽  
1981 ◽  
Vol 8 (5) ◽  
pp. 567-568 ◽  
Author(s):  
Djacir Gurgel de Figueiredo ◽  
Francisco Flavio Leitão de Carvalho
Keyword(s):  
Nasal Cavity ◽  
Balloon Catheter ◽  
Image Intensifier ◽  
New Technique ◽  
Blood Gas ◽  
X Ray ◽  
Balloon Tamponade ◽  
A New Technique ◽  
Television Image ◽  
Nasopharyngeal Mucosa

Abstract The authors present a new technique for tamponade of the nasopharynx after the performance of a transnasosphenoidal approach to the hypophysis. This technique consists of placing a Foley balloon catheter in each nasal cavity, extending to the nasopharynx. The position of the balloons and the adequacy of the amount of radiopaque substance used to fill them is determined with x-ray films or a television image intensifier. Among the advantages of the method over tamponade with Vaseline-covered gauze are: (a) better tamponade; (b) the possibility of testing the position and volume of tamponade; (c) the absence of trauma to the nasopharyngeal mucosa upon removal of the catheters after deflation of the balloons; (d) the availability of two airways for respiration in addition to the mouth; and (e) the absence of blood gas alterations and infections.

scholarly journals Bowen Fluorescence from Companion Stars in X-Ray Binaries

2004 ◽  
Vol 194 ◽  
pp. 21-22
Author(s):  
J. Casares ◽  
D. Steeghs ◽  
R. I. Hynes ◽  
P. A. Charles ◽  
R. Cornelisse ◽  
...  
Keyword(s):  
Black Hole ◽  
New Technique ◽  
X Ray ◽  
Preliminary Results ◽  
A New Technique ◽  
X Ray Binaries ◽  
Mass Functions

AbstractThis paper will review a new technique of detecting companion stars in LMXBs and X-ray transients in outburst using the Bowen fluorescence NIII lines at 4634-4640. These lines are very efficiently reprocessed in the atmospheres of the companion stars and, thereby, provide estimates of the K2 velocities and mass functions. The method has been applied to Sco X-1, X1822-371 and GX339-4 which, in the latter case, provides dynamical evidence for the presence of an accreting black hole. Preliminary results from a VLT campaign on V801 Ara, V926 Sco and XTE J1814-338 are also presented.

X-RAY REFLECTIVITY STUDY OF TETRAHEDRAL AMORPHOUS CARBON FILMS

2000 ◽  
Vol 14 (02n03) ◽  
pp. 181-187 ◽  
Author(s):  
B. K. Tay ◽  
X. Shi ◽  
S. P. Lau ◽  
Q. Zhang ◽  
H. C. Chua ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Amorphous Carbon ◽  
Mass Density ◽  
Ion Bombardment ◽  
Carbon Films ◽  
Vacuum Arc ◽  
Amorphous Carbon Films ◽  
X Ray ◽  
Tetrahedral Amorphous Carbon ◽  
Bombardment Energy

Hydrogen-free amorphous carbon films were deposited at different deposition bais voltage on a single silicon wafer by a process known as Filtered Cathodic Vacuum Arc (FCVA). The influences of different deposition bias voltages on the microstructure and the properties of thin tetrahedral amorphous carbon (ta-C) films, such as surface roughness, film mass density and thickness, have been studied by means of the x-ray reflectivity technique (XRR) for the first time. The microstructure of these films deposited on silicon wafers was stimulated by a four-layer model consisting of a ta-C layer, a mixed ta-C:Si layer, Si-O layer and the silicon subtrate. The mixed ta-C:Si layer consisting of the mixture of ta-C and silicon simulates the carbon ion impinging / diffusion into the surface of the silicon substrate. The mass density and the roughness of the film are found to be dependent on the impinging ion bombardment energy. The mass density increases with increase in ion bombardment energy up to 100 eV. Beyond 100 eV, the mass density decreases with further increase in ion bombardment energy up to 100 eV. Beyond 100 EV, the mass density decreases with further increase in ion bombardment energy. The surface roughness decreases with increasing ion bambardment energy to a minimum value at 100 eV, after which it increases with further increase in ion bombardment energy. The thickness of the films obtained by XRR technique correlates well with the thickness measurement obtained by spectral reflectometry. The existence of the Si-O layer was verified by Auger depth profiling.

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