Grain-Oriented Lithium Niobate Thin-Layers Prepared by Sol-Gel Methods

1990 ◽  
Vol 200 ◽  
Author(s):  
Daniel S. Hagberg ◽  
D. A. Payne
Keyword(s):  
Lithium Niobate ◽  
Sol Gel ◽  
Preferred Orientation ◽  
Thin Layers ◽  
X Ray Diffraction ◽  
Rocking Curve ◽  
X Ray ◽  
Polycrystalline Platinum ◽  
Dielectric Data

ABSTRACTThin-layers of lithium niobate were deposited on polycrystalline platinum and (001) sapphire. Preferred orientation was observed by x-ray diffraction measurements, and confirmed by x-ray rocking curve studies. The orientation was [006] LiNbO3 with [111] Pt and [001] Al2O3. Dielectric data are reported for grain oriented LiNbO3 as a function of frequency for layer thicknesses from 0.15 to 0.70 μm.

Raman and Impedance Spectroscopy of Blend Polycarbonate and Zinc Oxide Layers Grown by Sol-Gel Method

2013 ◽  
Vol 200 ◽  
pp. 22-26 ◽  
Author(s):  
Pawel Popielarski ◽  
Kazimierz Paprocki ◽  
Waclaw Bala ◽  
Agnieszka Banaszak-Piechowska ◽  
Karolina Walczyk ◽  
...  
Keyword(s):  
Sol Gel ◽  
Thin Layers ◽  
X Ray Diffraction ◽  
Confocal Raman Spectroscopy ◽  
Gel Method ◽  
X Ray ◽  
Sol Gel Method ◽  
Si Substrates ◽  
Surface Spectroscopy ◽  
Different Content

Confocal Raman spectroscopy has been applied to investigate blend polycarbonate and ZnO thin layers with different thicknesses and different content of ZnO. The admittance spectroscopy have been applied to correlation of optical and electrical properties of these layers used in electroluminescence diodes and photovoltaic cells. The I-V (DC and AC) characteristics and thermally stimulated current (TSC) have been applied to the study of the deep levels in ZnO thin films grown by sol-gel method onto Si substrates. The surface spectroscopy morphology of the samples were investigated by scanning microscopy and X ray diffraction.

scholarly journals Preparation and Characterization of ZnO Thin Layers with Various Percentages of Gallium Impurities

2017 ◽  
Vol 7 (3) ◽  
Author(s):  
Mohammad Hossein Manzari
Keyword(s):  
Spin Coating ◽  
Sol Gel ◽  
Good Choice ◽  
Thin Layers ◽  
X Ray Diffraction ◽  
X Ray ◽  
Glass Substrates ◽  
Diffraction Peaks ◽  
Doped Zno

In this study, thin films of pure ZnO and  doped ZnO with different percentages of gallium (0.5, 1, 2 and 4vt. %) on the glass substrates were deposited by using sol-gel method via spin coating technique at 2500 rpm, and all layers were annealed at 200°C for 1h and then Were examined their electrical, optical and structural properties. Concentration of all solution was 0.1M. The results show that the optimized layer is 0.5% GZO. By examining the transmittance spectrums we find that by doping the transparency of samples were improved and all samples in the visible areas 400-800nm are transparent. The electrical conductivity of all samples has been measured by four-point probe technique. The electrical conductivitys of pure ZnO sample and 0.5% GZO are 910-5 S/cm and 110-4 S/cm respectively. It can be a good choice for optoelectronic applications. Also X-ray diffraction results showed that diffraction peaks of 0.5% GZO sample have a small changes towards lower angles compared to the diffraction peaks of ZnO.

Fast quantitative analysis of strong uniaxial texture using a March–Dollase approach

2013 ◽  
Vol 46 (6) ◽  
pp. 1877-1879 ◽  
Author(s):  
Emil Zolotoyabko
Keyword(s):  
Quantitative Analysis ◽  
Intensity Ratio ◽  
Preferred Orientation ◽  
Diffraction Peak ◽  
X Ray Diffraction ◽  
Rocking Curve ◽  
X Ray ◽  
Diffraction Peaks ◽  
Analytical Expressions

Interrelations between the degree of uniaxial preferred orientation and the intensities and widths of selected X-ray diffraction peaks are analyzed within the March–Dollase approach. Simple analytical expressions are developed which relate the degree of preferred orientation to the rocking curve width of the strongest diffraction peak or the intensity ratio of two diffraction peaks, one of them being originated in the preferably orientated atomic planes.

A Study on the Microstructure of Preferred Orientation of Lead Zirconate Titanate (PZT) Thin Films

1997 ◽  
Vol 12 (4) ◽  
pp. 1043-1047 ◽  
Author(s):  
Chang Jung Kim ◽  
Dae Sung Yoon ◽  
Joon Sung Lee ◽  
Chaun Gi Choi ◽  
Kwangsoo No
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Lead Zirconate Titanate ◽  
Sol Gel ◽  
Lead Zirconate ◽  
Preferred Orientation ◽  
X Ray Diffraction ◽  
Pzt Thin Films ◽  
X Ray ◽  
Zirconate Titanate

The lead zirconate titanate (PZT) thin films were fabricated using sol-gel spin coating onto Pt/Ti/glass substrates. Effects of the holding time for pyrolysis and the coating cycle on the preferred orientation of the PZT thin films were studied. The films were fabricated with different coating cycles (3, 5, 7, 9, 11), dried at 330 °C for different holding times (5, 30, 60 min), and then annealed at the same temperature of 650 °C using rapid thermal annealing (RTA). The preferred orientations of the films were investigated using x-ray diffraction and glancing angle x-ray diffraction. The microstructure and the selected area diffraction pattern of the PZT thin films were also investigated using scanning electron microscopy (SEM) and transmission electron microscopy (TEM), respectively.

Characterisation of Thin Lattice Mismatched Heteroepitaxial Layers by XRD

1991 ◽  
Vol 240 ◽  
Author(s):  
Mary A. G. Halliwell
Keyword(s):  
Layer Thickness ◽  
Critical Thickness ◽  
Growth Conditions ◽  
Thin Layers ◽  
X Ray Diffraction ◽  
Rocking Curve ◽  
X Ray ◽  
Small Factor ◽  
Highly Strained ◽  
Heteroepitaxial Layers

ABSTRACTMany advanced III - V devices require highly strained heteroepitaxial layers less than 25 nm in thickness, with tight specifications on both the layer thickness and composition. In many cases the layers required are close to the critical thickness.The growth conditions for these thin layers are often extrapolated from established conditions for thicker layers. This method can result in layers which have the incorrect thickness and composition because of the transients which occur as growth commences. To minimise this problem it is desirable to establish growth conditions for layers which are as close to device requirements as possible. X-ray diffraction is capable of measuring layer thicknesses and compositions non-destructively. The minimum measurable layer thickness is usually within a small factor (typically 0.5 to 5 times) of device requirements.A single x-ray rocking curve is required to determine the thickness and composition of an unrelaxed (strained) layer. At least two rocking curves are required when relaxation is present. This paper discusses the appropriate choice of measurement conditions for a given sample.

X-ray diffraction evidence for transient composition effects in MOVPE multilayer growth for Ga1−x Al x As alloys

1987 ◽  
Vol 20 (3) ◽  
pp. 230-234 ◽  
Author(s):  
S. Bensoussan ◽  
C. Malgrange ◽  
M. Sauvage-Simkin ◽  
K. N'Guessan ◽  
P. Gibart
Keyword(s):  
Vapour Phase ◽  
Thin Layers ◽  
X Ray Diffraction ◽  
Vapour Phase Epitaxy ◽  
Rocking Curve ◽  
X Ray ◽  
Layer Stacking ◽  
Metal Organic ◽  
Organic Vapour ◽  
Ray Methods

X-ray rocking-curve analysis is applied to the detection of artifacts in multilayer epitactic growth of III–V ternary compounds by metal–organic vapour-phase epitaxy (MOVPE). Transient spikes in the composition result in unwanted additional thin layers whose presence disturbs the interference pattern expected from the designed heterostructures, thus modifying the oscillating part of the reflection profile. X-ray methods and secondary-ion mass spectroscopy (SIMS) lead to descriptions of the actual layer stacking in good agreement with each other.

X-ray diffraction properties of curved crystal diffractors

1992 ◽  
Vol 50 (2) ◽  
pp. 1734-1735
Author(s):  
W. Z. Chang ◽  
D. B. Wittry
Keyword(s):  
Diffraction Theory ◽  
X Rays ◽  
Diffraction Image ◽  
X Ray Diffraction ◽  
Rocking Curve ◽  
X Ray ◽  
Bent Crystal ◽  
Diffraction Geometry ◽  
Crystal Parameter ◽  
Quantitative Procedure

Since Du Mond and Kirkpatrick first discussed the principle of a bent crystal spectrograph in 1930, curved single crystals have been widely utilized as spectrometric monochromators as well as diffractors for focusing x rays diverging from a point. Curved crystal diffraction theory predicts that the diffraction parameters - the rocking curve width w, and the peak reflection coefficient r of curved crystals will certainly deviate from those of their flat form. Due to a lack of curved crystal parameter data in current literature and the need for optimizing the choice of diffraction geometry and crystal materials for various applications, we have continued the investigation of our technique presented at the last conference. In the present abstract, we describe a more rigorous and quantitative procedure for measuring the parameters of curved crystals.The diffraction image of a singly bent crystal under study can be obtained by using the Johann geometry with an x-ray point source.

Raman spectroscopy and X-ray diffraction of lithium niobate at temperatures up to 1300○-4.80pt○C

2005 ◽  
Vol 126 ◽  
pp. 101-105 ◽  
Author(s):  
B. Moulin ◽  
L. Hennet ◽  
D. Thiaudière ◽  
P. Melin ◽  
P. Simon
Keyword(s):  
Raman Spectroscopy ◽  
Lithium Niobate ◽  
X Ray Diffraction ◽  
X Ray

PENGGUNAAN TiO2 PARTIKEL NANO HASIL SINTESIS BERBASIS AIR MENGGUNAKAN METODA SOL-GEL PADA BAHAN KAPAS SEBAGAI APLIKASI UNTUK TEKSTIL ANTI UV

Arena Tekstil ◽  
2013 ◽  
Vol 28 (1) ◽  
Author(s):  
Maya Komalasari ◽  
Bambang Sunendar
Keyword(s):  
Fourier Transform ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Sol Gel ◽  
Crosslinking Agent ◽  
X Ray Diffraction ◽  
Nano Tio2 ◽  
X Ray ◽  
Infra Red ◽  
Scanning Electron

Partikel nano TiO2 berbasis air dengan pH basa telah berhasil disintesis dengan menggunakan metode sol-gel dan diimobilisasi pada kain kapas dengan menggunakan kitosan sebagai zat pengikat silang. Sintesis dilakukan  dengan prekursor TiCl4 pada konsentrasi 0,3 M, 0,5 M dan 1 M, dan menggunakan templat kanji dengan proses kalsinasi pada suhu 500˚C selama 2 jam. Partikel nano TiO2 diaplikasikan ke kain kapas dengan metoda pad-dry-cure dan menggunakan kitosan sebagai crosslinking agent. Berdasarkan hasil Scanning Electron Microscope (SEM),diketahui bahwa morfologi partikel TiO2 berbentuk spherical dengan ukuran nano (kurang dari 100 nm). Karakterisasi X-Ray Diffraction (XRD) menunjukkan adanya tiga tipe struktur kristal utama, yaitu (100), (101) dan (102) dengan fasa kristal yang terbentuk adalah anatase dan rutile. Pada karakterisasi menggunakan SEM terhadap serbuk dari TiO2 yang telah diaplikasikan ke permukaan kain kapas, terlihat adanya imobilisasi partikel nano TiO2 melalui ikatan hidrogen silang dengan kitosan pada kain kapas. Hasil analisa tersebut kemudian dikonfirmasi dengan FTIR (Fourier Transform Infra Red) yang hasilnya memperlihatkan puncak serapan pada bilangan gelombang 3495 cm-1, 2546 cm-1, dan 511 cm-1,  yang masing-masing diasumsikan sebagai adanya vibrasi gugus fungsi O-H, N-H dan Ti-O-Ti. Hasil SEM menunjukkan pula bahwa kristal nano yang terbentuk diantaranya adalah fasa rutile , yang berdasarkan literatur terbukti dapatberfungsi sebagai anti UV.

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