Recognizing the Limits of Archaeological Applications of Non-Destructive Energy-Dispersive X-Ray Fluorescence Analysis of Obsidians

1990 ◽  
Vol 185 ◽  
Author(s):  
Paul D. Bouey
Keyword(s):  
Thin Film ◽  
Fluorescence Analysis ◽  
Volcanic Field ◽  
Energy Dispersive ◽  
X Ray ◽  
Archaeological Artifact ◽  
Analytical Potential ◽  
Non Destructive

AbstractApplication of a non-destructive energy-dispersive XRF technique, involving use of analytc/Compton net peak ratios, has greatly increased the analytical potential for the study of obsidians in archaeological assemblages. Contrary to reported conclusions for obsidians from the Coso Volcanic Field of southeastern California, however, the method lacks the precision associated with powdered-specimen, thin film, and other more rigorous techniques. Tests have shown that changing the orientation and/or placement of an archaeological artifact in a sample slot will produce widely divergent determinations of ppm concentrations for most specimens. These results indicate that discriminating between some chemical subsources at Coso cannot be accomplished reliably.

Correlation of Thin Film Measurement Techniques for Device Packaging Processes

2014 ◽  
Author(s):  
J. Walter ◽  
W. Mack ◽  
C.Y. Lee ◽  
C. Gspan
Keyword(s):  
Thin Film ◽  
Semiconductor Industry ◽  
Measurement Techniques ◽  
Fluorescence Analysis ◽  
Thin Layers ◽  
Layer System ◽  
Tem Analysis ◽  
X Ray ◽  
The Individual ◽  
Non Destructive

Abstract The analysis of thin layers in semiconductor components represents a central point in the quality control of semiconductor companies. Not only to control production processes, but to successfully operate also reverse engineering, reliable thin-film measurement methods are essential. In this work, non-destructive thin film EDX (energy dispersive X-ray micro analysis) software and μXRF (micro x-ray fluorescence analysis) were compared with TEM analysis. These methods ensure a high lateral resolution which is essential in the analysis of semiconductor structures. As an example, four different, for the semiconductor industry interesting, very thin coating systems in the nanometer range have been tested. In the individual cases best TEM detector contrast settings could be found, as well as optimum fluorescence lines settings on the EDX to minimize the errors. The TEM measurements, in thickness and composition, were compared to the thin film EDX software and the μXRF method results to determine their accuracy. It turns out that depending on the layer system recalibration with multilayer standards or at least with elemental standards is recommended. It could be shown that with μXRF and thin film EDX a reliable, rapid and non-destructive layer analysis is possible.

Basic Studies of Multi-Layer Thin Film Analysis Using Fundamental Parameter Method

1989 ◽  
Vol 33 ◽  
pp. 213-223
Author(s):  
Y. Kataoka ◽  
T. Arai
Keyword(s):  
Thin Film ◽  
Fluorescence Analysis ◽  
Parameter Method ◽  
Fundamental Parameter ◽  
X Ray ◽  
Basic Studies ◽  
Layer Thin Film ◽  
Non Destructive ◽  
Fundamental Parameter Method

X-ray fluorescence analysis is the most suitable method, for the characterization of the thickness and the chemical composition of thin film samples. It is non-destructive, rapid, precise, and accurate for both metal and oxide samples.

Energy-Dispersive X-ray Fluorescence Analysis as a Rapid Method for Identifying Tephras

1983 ◽  
Vol 19 (2) ◽  
pp. 201-211 ◽  
Author(s):  
A. B. Cormie ◽  
D. E. Nelson
Keyword(s):  
Reliable Method ◽  
Fluorescence Analysis ◽  
Energy Dispersive ◽  
Bulk Glass ◽  
X Ray ◽  
Additional Tool ◽  
White River ◽  
Routine Identification ◽  
Weathering Effects ◽  
Mount St Helens

AbstractThe use of energy-dispersive X-ray fluorescence analysis (XES) for the routine identification of three tephras (Mazama, Bridge River, Mount St. Helens Yn) commonly found in archeological sites in British Columbia has been investigated. Researchers have often assumed that chemical analysis of bulk samples of glass separates would be hampered by contamination and weathering effects. Our results indicate that XES of bulk glass separates provides a very reliable method for rapidly identifying the three tephras in question, even with a very simple sample preparation. This should enable persons not skilled in geology or in tephrochronology to collect and to identify samples of these tephras. Finally, as a part of the study, similar measurements were made on the separated glass portions of these three tephras and of three others (Glacier Peak B and G, White River) from northwest North America. The results suggest that this method may provide tephrochronologists with a useful additional tool for studying tephras in other regions.

scholarly journals Energy dispersive X-ray diffraction (EDXRD) for operando materials characterization within batteries

2020 ◽  
Vol 22 (37) ◽  
pp. 20972-20989 ◽  
Author(s):  
Amy C. Marschilok ◽  
Andrea M. Bruck ◽  
Alyson Abraham ◽  
Chavis A. Stackhouse ◽  
Kenneth J. Takeuchi ◽  
...  
Keyword(s):  
Materials Characterization ◽  
Energy Dispersive ◽  
System Level ◽  
X Ray Diffraction ◽  
X Ray ◽  
Non Destructive ◽  
Non Destructive Characterization

This review highlights the efficacy of EDXRD as a non-destructive characterization tool in elucidating system-level phenomena for batteries.

scholarly journals Non-destructive handheld XRF study of archaeological composite silver objects—the case study of the late Roman Seuso Treasure

2021 ◽  
Vol 13 (5) ◽  
Author(s):  
Viktória Mozgai ◽  
Bernadett Bajnóczi ◽  
Zoltán May ◽  
Zsolt Mráv
Keyword(s):  
Fluorescence Analysis ◽  
The Body ◽  
High Quality ◽  
X Ray ◽  
Composite Objects ◽  
Mechanical Attachment ◽  
Non Destructive ◽  
Made In ◽  
Late Roman

AbstractThis study details the non-destructive chemical analysis of composite silver objects (ewers, situlas, amphora and casket) from one of the most significant late Roman finds, the Seuso Treasure. The Seuso Treasure consists of fourteen large silver vessels that were made in the fourth–early fifth centuries AD and used for dining during festive banquets and for washing and beautification. The measurements were systematically performed along a pre-designed grid at several points using handheld X-ray fluorescence analysis. The results demonstrate that all the objects were made from high-quality silver (above 90 wt% Ag), with the exception of the base of the Geometric Ewer B. Copper was added intentionally to improve the mechanical properties of soft silver. The gold and lead content of the objects shows constant values (less than 1 wt% Au and Pb). The chemical composition as well as the Bi/Pb ratio suggests that the parts of the composite objects were manufactured from different silver ingots. The ewers were constructed in two ways: (i) the base and the body were made separately, or (ii) the ewer was raised from a single silver sheet. The composite objects were assembled using three methods: (i) mechanical attachment; (ii) low-temperature, lead-tin soft solders; or (iii) high-temperature, copper-silver hard solders. Additionally, two types of gilding were revealed by the XRF analysis, one with remnants of mercury, i.e. fire-gilding, and another type without remnants of mercury, presumably diffusion bonding.

ANALYSIS OF COPPER COINS BY EDXRF TECHNIQUE

2004 ◽  
Vol 14 (03n04) ◽  
pp. 133-139 ◽  
Author(s):  
T. R. RAUTRAY ◽  
V. VIJAYAN ◽  
P. K. NAYAK ◽  
S. JENA
Keyword(s):  
Trace Elements ◽  
Major And Trace Elements ◽  
Spectroscopic Technique ◽  
Energy Dispersive ◽  
Historical Events ◽  
Trade Routes ◽  
X Ray ◽  
Edxrf Technique ◽  
Non Destructive ◽  
Archaeological Objects

Coins are important archaeological objects that can provide useful information regarding preparation methodology and provenance. Their classification plays a fundamental role in dating historical events, in constructing trade routes and in establishing the welfare of population. Several Indian copper coins of different periods have been studied using Energy Dispersive X-ray Fluorescence (EDXRF) spectroscopic technique. The method is rapid, efficient, multi elemental and non-destructive in nature. Concentrations of the major and trace elements like Ca , Ti , V , Cr , Mn , Fe , Co , Ni , Cu , Zn , As and Pb have been estimated in these copper coins. In the present investigation, an attempt has been made to characterize some Indian copper coins of different periods using EDXRF technique.

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