Modified Line-of-Sight Model for Deposition of Tungsten Silicide Barrier Layers
Keyword(s):
ABSTRACTA modified line-of-sight model for transport and deposition during LPCVD is used to predict step coverage and film composition uniformity of tungsten silicide barrier layers. Predictions are compared with experimental results for 2 μim wide by 6 μm deep trenches with barrier layers of 0.2 μm nominal thickness. Model predictions are in quantitative agreement with those of a diffusion-reaction model and are in qualitative agreement with experiment.
2015 ◽
Vol 30
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pp. 372-378
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1935 ◽
Vol 31
(4)
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pp. 604-608
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2006 ◽
Vol 57
(15)
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pp. 4215-4224
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2005 ◽
Vol 35
(1)
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pp. 26-39
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Keyword(s):
2014 ◽
pp. 639-648
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2021 ◽