Raman Scattering as a Temperature Frobe for Laser Heating of Si

1982 ◽  
Vol 17 ◽  
Author(s):  
Dimitry Kirillov ◽  
James L. Merz

ABSTRACTThe frequency of the phonon line in the Raman scattering spectrum recorded during CW laser-beam heating of Si was used as a characteristic of the lattice temperature inside the laser spot. It is shown that Raman scattering is a good temperature probe up to the laser power approaching optical damage of Si.

1998 ◽  
Vol 42 (5) ◽  
pp. 809-816 ◽  
Author(s):  
D. Abbott ◽  
B. Davis ◽  
B. Gonzalez ◽  
A. Hernandez ◽  
K. Eshraghian

2002 ◽  
Vol 93 (2) ◽  
pp. 252-256 ◽  
Author(s):  
N. P. Andreeva ◽  
A. F. Bunkin ◽  
S. M. Pershin

2012 ◽  
Vol 39 (5) ◽  
pp. 0504004
Author(s):  
刘书朋 Liu Shupeng ◽  
朱鸿飞 Zhu Hongfei ◽  
陈娜 Chen Na ◽  
陈振宜 Chen Zhenyi ◽  
胡玲 Hu Ling

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