Soft X‐Ray Studies of Y‐Ba‐Cu‐O Thin Films Prepared by Laser Ablation

1989 ◽  
Vol 169 ◽  
Author(s):  
A. Krol ◽  
C.J. Sher ◽  
D.R. Storch ◽  
L.W. Song ◽  
Y.H. Kao ◽  
...  
Keyword(s):  
Thin Films ◽  
Laser Ablation ◽  
Parallel Plate ◽  
Surface Region ◽  
Angular Variation ◽  
Near Surface ◽  
X Ray ◽  
20 Nm ◽  
First Time ◽  
Oxygen Atoms

AbstractAngular variation of x‐ray fluorescence due to oxygen atoms in high‐T Y‐Ba‐Cu‐O thin films is measured for the first time by using a new parallel plate avalanche chamber. This technique allows the possibility of nondestructive probing of the depth‐profile of oxygen atoms in the superconducting materials. Our preliminary results indicate that the near surface region of the Y‐Ba‐Cu‐O film may contain an oxygen‐depleted layer of thickness around 20 nm.

Fabrication of CaWO4:Eu3+ Thin Films via Electrochemical Methods Assisted by a Novel Post Treatment

2011 ◽  
Vol 194-196 ◽  
pp. 2458-2461 ◽  
Author(s):  
Lian Ping Chen ◽  
Yuan Hong Gao ◽  
Jian Xiong Yuan ◽  
Qing Hua Zhang ◽  
Yan Hong Yin ◽  
...  
Keyword(s):  
Thin Films ◽  
Room Temperature ◽  
Electrochemical Techniques ◽  
Surface Region ◽  
Luminescent Properties ◽  
Emission Peak ◽  
X Ray Diffraction ◽  
Near Surface ◽  
X Ray ◽  
Rare Earth Doped

It is hardly possible to obtain rare earth doped CaWO4 thin films directly through electrochemical techniques. A novel post processing has been proposed to synthesize CaWO4:Eu3+ thin films at room temperature. X-ray diffraction, X-ray photoelectron spectrometry, spectrophotometer were used to characterize their phase, composition and luminescent properties. Results reveal that Eu3+-doped CaWO4 films have a tetragonal phase; the content of Eu in the near surface region is much higher than that of the bulk; under the excitation of 310 nm, a sharp emission peak at 616 nm has been observed for Ca0.9WO4:Eu0.13+ thin films.

Reactions at the interface between multi-component glasses and metallic lithium films

1989 ◽  
Vol 4 (4) ◽  
pp. 978-989 ◽  
Author(s):  
K. R. Zavadil ◽  
N. R. Armstrong ◽  
C. H. F. Peden
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Surface Region ◽  
Alloy Formation ◽  
Sodium Potassium ◽  
Near Surface ◽  
Network Modifier ◽  
X Ray ◽  
Metallic Lithium

The reactions of vacuum deposited thin films of lithium with various complex glasses have been explored using x-ray photoelectron spectroscopy (XPS). In contrast to lithium reactions with simple glasses such as silica or boron oxides, the reactions are predominantly those of the network modifiers such as sodium, potassium, and magnesium. XPS and x-ray induced Auger lineshapes indicate the migration of the network modifier to the near surface region followed by its reduction. In the case of magnesium, there is evidence for stable alloy formation with unreacted lithium following these migration and reduction steps.

Microstructures in Y-Ba-Cu-O Thin Films Investigated by XAFS Techniques

1990 ◽  
Vol 209 ◽  
Author(s):  
A. Krol ◽  
Z. H. Ming ◽  
C. S. Lin ◽  
Y. L. Soo ◽  
C. X. Gu ◽  
...  
Keyword(s):  
Thin Films ◽  
Fine Structure ◽  
Laser Ablation ◽  
Local Environment ◽  
Superconducting Films ◽  
X Ray ◽  
Absorption Fine ◽  
Local Disorder ◽  
X Ray Absorption ◽  
Oxygen Atoms

ABSTRACTSuperconducting films of YBa2Cu3O7−6 obtained by laser ablation on MgO and ZrO2 substrates were investigated by soft x-ray absorption fine structure technique (XAFS) at O K-edge. Local environment around oxygen atoms was probed and information on the distribution of the nearestneighbors was obtained. Much higher degree of local disorder than that in a bulk YBa2Cu3O7−δ sample was observed.

Structural analysis of coexisting tetragonal and rhombohedral phases in polycrystalline Pb(Zr0.35Ti0.65)O3 thin films

2003 ◽  
Vol 18 (1) ◽  
pp. 173-179 ◽  
Author(s):  
Maxim B. Kelman ◽  
Paul C. McIntyre ◽  
Bryan C. Hendrix ◽  
Steven M. Bilodeau ◽  
Jeffrey F. Roeder ◽  
...  
Keyword(s):  
Thin Films ◽  
Depth Profiling ◽  
Chemical Vapor ◽  
Surface Region ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
Near Surface ◽  
X Ray ◽  
Scattering Geometry ◽  
Pzt Films

Structural properties of polycrystalline Pb(Zr0.35Ti0.65)O3 (PZT) thin films grown by metalorganic chemical vapor deposition on Ir bottom electrodes were investigated. Symmetric x-ray diffraction measurements showed that as-deposited 1500 íthick PZT films are partially tetragonal and partially rhombohedral. Cross-section scanning electron microscopy showed that these films have a polycrystalline columnar microstructure with grains extending through the thickness of the film. X-ray depth profiling using the grazing-incidence asymmetric Bragg scattering geometry suggests that each grain has a bilayer structure consisting of a near-surface region in the etragonal phase and the region at the bottom electrode interface in the rhombohedral hase. The required compatibility between the tetragonal and rhombohedral phases in he proposed layered structure of the 1500 Å PZT can explain the peak shifts observed n the symmetric x-ray diffraction results of thicker PZT films.

scholarly journals A novel and potentially scalable CVD-based route towards SnO2:Mo thin films as transparent conducting oxides

2021 ◽  
Author(s):  
Tianlei Ma ◽  
Marek Nikiel ◽  
Andrew G. Thomas ◽  
Mohamed Missous ◽  
David J. Lewis
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Mixed Valence ◽  
Chemical Vapour ◽  
X Ray Diffraction ◽  
X Ray ◽  
Conducting Oxides ◽  
Valence States ◽  
3 Omega ◽  
First Time

AbstractIn this report, we prepared transparent and conducting undoped and molybdenum-doped tin oxide (Mo–SnO2) thin films by aerosol-assisted chemical vapour deposition (AACVD). The relationship between the precursor concentration in the feed and in the resulting films was studied by energy-dispersive X-ray spectroscopy, suggesting that the efficiency of doping is quantitative and that this method could potentially impart exquisite control over dopant levels. All SnO2 films were in tetragonal structure as confirmed by powder X-ray diffraction measurements. X-ray photoelectron spectroscopy characterisation indicated for the first time that Mo ions were in mixed valence states of Mo(VI) and Mo(V) on the surface. Incorporation of Mo6+ resulted in the lowest resistivity of $$7.3 \times 10^{{ - 3}} \Omega \,{\text{cm}}$$ 7.3 × 10 - 3 Ω cm , compared to pure SnO2 films with resistivities of $$4.3\left( 0 \right) \times 10^{{ - 2}} \Omega \,{\text{cm}}$$ 4.3 0 × 10 - 2 Ω cm . Meanwhile, a high transmittance of 83% in the visible light range was also acquired. This work presents a comprehensive investigation into impact of Mo doping on SnO2 films synthesised by AACVD for the first time and establishes the potential for scalable deposition of SnO2:Mo thin films in TCO manufacturing. Graphical abstract

scholarly journals Reactive Dual Magnetron Sputtering: A Fast Method for Preparing Stoichiometric Microcrystalline ZnWO4 Thin Films

Surfaces ◽  
2021 ◽  
Vol 4 (2) ◽  
pp. 106-114
Author(s):  
Yannick Hermans ◽  
Faraz Mehmood ◽  
Kerstin Lakus-Wollny ◽  
Jan P. Hofmann ◽  
Thomas Mayer ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetron Sputtering ◽  
Photoelectron Spectroscopy ◽  
Fast Method ◽  
X Ray Diffraction ◽  
X Ray ◽  
Glass Substrates ◽  
Post Annealing ◽  
Rf Signal ◽  
First Time

Thin films of ZnWO4, a promising photocatalytic and scintillator material, were deposited for the first time using a reactive dual magnetron sputtering procedure. A ZnO target was operated using an RF signal, and a W target was operated using a DC signal. The power on the ZnO target was changed so that it would match the sputtering rate of the W target operated at 25 W. The effects of the process parameters were characterized using optical spectroscopy, X-ray diffraction, and scanning electron microscopy, including energy dispersive X-ray spectroscopy as well as X-ray photoelectron spectroscopy. It was found that stoichiometric microcrystalline ZnWO4 thin films could be obtained, by operating the ZnO target during the sputtering procedure at a power of 55 W and by post-annealing the resulting thin films for at least 10 h at 600 °C. As FTO coated glass substrates were used, annealing led as well to the incorporation of Na, resulting in n+ doped ZnWO4 thin films.

Electronic Impact of Inclusions in Diamond

2009 ◽  
Vol 1203 ◽  
Author(s):  
Erik M. Muller ◽  
John Smedley ◽  
Balaji Raghothamachar ◽  
Mengjia Gaowei ◽  
Jeffrey W. Keister ◽  
...  
Keyword(s):  
Charge Trapping ◽  
Secondary Phase ◽  
Surface Region ◽  
Phase Region ◽  
Electron Trapping ◽  
Near Surface ◽  
X Ray ◽  
Photoconductive Gain ◽  
Single Crystal Diamond ◽  
Topography Data

AbstractX-ray topography data are compared with photodiode responsivity maps to identify potential candidates for electron trapping in high purity, single crystal diamond. X-ray topography data reveal the defects that exist in the diamond material, which are dominated by non-electrically active linear dislocations. However, many diamonds also contain defects configurations (groups of threading dislocations originating from a secondary phase region or inclusion) in the bulk of the wafer which map well to regions of photoconductive gain, indicating that these inclusions are a source of electron trapping which affect the performance of diamond X-ray detectors. It was determined that photoconductive gain is only possible with the combination of an injecting contact and charge trapping in the near surface region. Typical photoconductive gain regions are 0.2 mm across; away from these near-surface inclusions the device yields the expected diode responsivity.

scholarly journals Anomalous Grazing X-ray Reflectometry for Determining the Number Density of Atoms in the Near-Surface Region

1996 ◽  
Vol 37 (1) ◽  
pp. 39-44 ◽  
Author(s):  
Masatoshi Saito ◽  
Eiichiro Matsubara ◽  
Yoshio Waseda
Keyword(s):  
Surface Region ◽  
Number Density ◽  
Near Surface ◽  
X Ray

scholarly journals Nitrogen and Bromide Co-Doped Hydroxyapatite Thin Films with Antimicrobial Properties

Coatings ◽  
2021 ◽  
Vol 11 (12) ◽  
pp. 1505
Author(s):  
Simona Liliana Iconaru ◽  
Carmen Steluta Ciobanu ◽  
Daniela Predoi ◽  
Mikael Motelica-Heino ◽  
Constantin Cătălin Negrilă ◽  
...  
Keyword(s):  
Thin Films ◽  
Antimicrobial Activity ◽  
Spin Coating ◽  
Thin Layers ◽  
Precipitation Method ◽  
X Ray ◽  
Co Precipitation ◽  
First Time ◽  
Co Doped

Hydroxyapatite (Ca10(PO4)6(OH)2, HAp), due to its high biocompatibility, is widely used as biomaterial. Doping with various ions of hydroxyapatite is performed to acquire properties as close as possible to the biological apatite present in bones and teeth. In this research the results of a study performed on thin films of hydroxyapatite co-doped with nitrogen and bromine (NBrHAp) are presented for the first time. The NBrHAp suspension was obtained by performing the adapted co-precipitation method using cetyltrimethylammonium bromide (CTAB). The thin layers of NBrHAp were obtained by spin-coating. The stability of the NBrHAp suspension was examined by ultrasound measurements. The thin layers obtained by the spin-coating method were examined by scanning electron microscopy (SEM), optical microscopy (OM), and metallographic microscopy (MM). The presence of nitrogen and bromine were highlighted by energy-dispersive X-ray spectroscopy (EDS) and X-ray photoelectron spectroscopy (XPS) studies. Fourier transform infrared spectroscopy (FTIR) was used to highlight the chemical status of nitrogen and bromine. In addition, the powder obtained from the NBrHAp suspension was analyzed by XRD. Moreover, the in vitro antimicrobial activity of the NBrHAp suspensions and coatings was investigated using the reference microbial strains Staphylococcus aureus ATCC 25923, Escherichia coli ATCC 25922, and Candida albicans ATCC 10231. The results highlighted the successful obtainment of N and Br co-doped hydroxyapatite suspension for the first time by an adapted co-precipitation method. The obtained suspension was used to produce pure NBrHAp composite thin films with superior morphological properties. The NBrHAp suspensions and coatings exhibited in vitro antimicrobial activity against bacterial and fungal strains and revealed their good antimicrobial activity.

scholarly journals The First Find of Cr2O3 Eskolaite Associated with Marble-Hosted Ruby in the Southern Urals and the Problem of Al and Cr Sources

Minerals ◽  
2020 ◽  
Vol 10 (2) ◽  
pp. 101
Author(s):  
Aleksander Kissin ◽  
Irina Gottman ◽  
Sergei Sustavov ◽  
Valery Murzin ◽  
Daria Kiseleva
Keyword(s):  
Granite Gneiss ◽  
Southern Urals ◽  
X Ray Diffraction ◽  
The Southern Urals ◽  
Near Surface ◽  
X Ray ◽  
Gneiss Domes ◽  
Electron Probe Microanalyzer ◽  
Formation Zone ◽  
First Time

The results of the study of eskolaite associated with marble-hosted ruby found for the first time in the Kuchinskoe occurrence (Southern Urals) are presented. Here, eskolaite was located on the surface and near-surface regions of ruby crystals. Eskolaite diagnostics was confirmed by powder X-ray diffraction (URS-55). The morphology and chemical composition of eskolaite and associated ruby was studied using a JSM-6390LV scanning electron microscope and a Cameca SX 100 electron probe microanalyzer. The eskolaite crystals were hexagonal and tabular, up to 0.2 mm in size. Ruby mineralization was formed during prograde and retrograde dynamothermal metamorphism. The eskolaite associated with the prograde stage ruby contained Al2O3 (9.1–23.62 wt %), TiO2 (0.52–9.66 wt %), V2O3 (0.53–1.54 wt %), FeO (0.03–0.1 wt %), MgO (0.05–0.24 wt %), and SiO2 (0.1–0.21 wt %). The eskolaite associated with the retrograde stage ruby was distinguished by a sharp depletion in Ti and contained Al2O3 (12.25–21.2 wt %), TiO2 (0.01–0.07 wt %), V2O3 (0.32–1.62 wt %), FeO (0.01–0.08 wt %), MgO (0.0–0.48 wt %), and SiO2 (0.01–0.1 wt %). The associated rubies contained almost equal amounts of Cr2O3 (2.36–2.69 wt %) and were almost free from admixtures. The identification of the eskolaite associated with the marble-hosted rubies from the Kuchinskoe occurrence is a new argument in favor of introduction of Al and Cr into the mineral formation zone. The mineralization was localized in the metamorphic frame of the granite gneiss domes and was formed synchronously with them.

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