Spin Polarized Inelastic Electron Scattering From Ni (110)

1989 ◽  
Vol 151 ◽  
Author(s):  
H. Hopster ◽  
D. L. Abraham ◽  
D. P. Pappas
Keyword(s):  
Electron Scattering ◽  
Low Energy ◽  
Energy Losses ◽  
Inelastic Electron ◽  
Small Energy ◽  
Loss Mechanism ◽  
Spin Asymmetries ◽  
Spin Polarized ◽  
Low Energy Electron ◽  
Exchange Scattering

ABSTRACTThe spin dependent energy loss mechanisms in low-energy electron scattering from a ferromagnetic Ni(110) surface are studied. It is shown that exchange scattering can be the dominant loss mechanism for small energy losses. The energy-, angle and temperature dependence of spin asymmetries are studied in detail.

Spin Asymmetries in Low-Energy Electron Scattering from Cesium Atoms

1999 ◽  
Vol 82 (6) ◽  
pp. 1128-1131 ◽  
Author(s):  
G. Baum ◽  
W. Raith ◽  
B. Roth ◽  
M. Tondera ◽  
K. Bartschat ◽  
...  
Keyword(s):  
Electron Scattering ◽  
Low Energy ◽  
Energy Electron ◽  
Spin Asymmetries ◽  
Low Energy Electron ◽  
Cesium Atoms

A Tilting Procedure to Enhance Compositional Contrast and Reduce Residual Bragg Contrast in EFTEM Imaging of Planar Interfaces

2000 ◽  
Vol 6 (S2) ◽  
pp. 156-157
Author(s):  
K.T. Moore ◽  
E.A. Stach ◽  
J.M. Howe ◽  
D.C. Elbert ◽  
D.R. Veblen
Keyword(s):  
Electron Scattering ◽  
Planar Interface ◽  
Zone Axis ◽  
Crystalline Material ◽  
Energy Losses ◽  
Inelastic Electron ◽  
Diffraction Contrast ◽  
Background Removal ◽  
Intensity Changes ◽  
Elemental Maps

When acquiring energy-filtered TEM (EFTEM) images of a crystalline material, the detrimental effects of diffraction contrast can often be seen in raw energy-filtered images (EFI) (i.e., pre-edge and post-edge images), jump-ratio images and elemental maps as residual diffraction contrast. Residual diffraction contrast occurs in raw EFI because of plural scattering (i.e., inelastic-elastic and elastic-inelastic electron scattering) and in jump-ratio images and elemental maps because background removal procedures often are unable to completely account for intensity changes due to dynamical effects (elastic scattering) that occur between pre-edge and post-edge images acquired at different energy losses.It is demonstrated in these experiments that, when examining a planar interface, EFTEM images have increased compositional contrast and decreased residual diffraction contrast when the sample is oriented so that the interface is parallel to the electron beam, but not directly on a zone axis.

scholarly journals Low-energy electron scattering fromC4H9OH isomers

2010 ◽  
Vol 82 (6) ◽  
Author(s):  
M. H. F. Bettega ◽  
C. Winstead ◽  
V. McKoy
Keyword(s):  
Electron Scattering ◽  
Low Energy ◽  
Energy Electron ◽  
Low Energy Electron
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