Diffusion, Segregation, and Recrystallization in High-Dose Ion-Implanted Si

1989 ◽  
Vol 147 ◽  
Author(s):  
S. J. Pennycook
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
High Dose ◽  
Growth Interface ◽  
Dopant Incorporation ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
The Stability ◽  
Z Contrast

AbstractUsing the new technique of Z-contrast scanning transmission electron microscopy (STEM), we have been able to study the segregation of Sb at an advancing SPE growth interface and the resulting interface breakdown. The first direct information is obtained on Sb diffusion in the amorphous phase, which is many orders of magnitude enhanced over tracer crystalline values. This controls both the dopant incorporation and the stability of the resulting supersaturated alloy. These results are compared to the behavior of the low melting point substitutional diffusers and the interstitial diffusers.

Aberration-corrected scanning transmission electron microscopy: from atomic imaging and analysis to solving energy problems

2009 ◽  
Vol 367 (1903) ◽  
pp. 3709-3733 ◽  
Author(s):  
S. J. Pennycook ◽  
M. F. Chisholm ◽  
A. R. Lupini ◽  
M. Varela ◽  
A. Y. Borisevich ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Single Atom ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Z Contrast ◽  
Contrast Image ◽  
Aberration Corrected

The new possibilities of aberration-corrected scanning transmission electron microscopy (STEM) extend far beyond the factor of 2 or more in lateral resolution that was the original motivation. The smaller probe also gives enhanced single atom sensitivity, both for imaging and for spectroscopy, enabling light elements to be detected in a Z-contrast image and giving much improved phase contrast imaging using the bright field detector with pixel-by-pixel correlation with the Z-contrast image. Furthermore, the increased probe-forming aperture brings significant depth sensitivity and the possibility of optical sectioning to extract information in three dimensions. This paper reviews these recent advances with reference to several applications of relevance to energy, the origin of the low-temperature catalytic activity of nanophase Au, the nucleation and growth of semiconducting nanowires, and the origin of the eight orders of magnitude increased ionic conductivity in oxide superlattices. Possible future directions of aberration-corrected STEM for solving energy problems are outlined.

scholarly journals Nucleoid Structure of Escherichia coli as Revealed by Scanning Transmission Electron Microscopy (STEM) and by 3D-Reconstruction of Z-Contrast Images of Serial Sections

2013 ◽  
Vol 19 (S2) ◽  
pp. 144-145
Author(s):  
B. Reiner ◽  
Y. Guo ◽  
E.W. Roth ◽  
N.H. Yazdi ◽  
R.C. Johnson ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Escherichia Coli ◽  
Transmission Electron Microscopy ◽  
3D Reconstruction ◽  
Scanning Transmission Electron Microscopy ◽  
Serial Sections ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Nucleoid Structure ◽  
Z Contrast

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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