Measurements of Strain Induced Resistivity by the Eddy-Current Decay Method
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AbstractThe eddy-current decay method developed by Bean for electrical resistivity measurements is well-suited for bulk metal characterization studies. The technique can be applied to investigations of low temperature plastic strain in pure aluminum.
2009 ◽
pp. 157-157-16
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1968 ◽
Vol 39
(7)
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pp. 1019-1026
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2010 ◽
Vol 63
(5)
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pp. 773-777
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1991 ◽
Vol 63
(5)
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pp. 849-856
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1985 ◽
Vol 54
(9)
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pp. 3406-3414
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1969 ◽
Vol 40
(3)
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pp. 420-422
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2006 ◽
Vol 519-521
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pp. 1391-1396
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