X-Ray Diffraction analysis of Au/Ni Multilayers

1988 ◽  
Vol 132 ◽  
Author(s):  
J. Chaudhuri ◽  
S. Shah ◽  
A. F. Jankowski
Keyword(s):  
Diffraction Analysis ◽  
Volume Fraction ◽  
Kinematic Model ◽  
Coherency Strain ◽  
X Ray Diffraction ◽  
Strain Profile ◽  
X Ray ◽  
Depth Profiles ◽  
Experimental Diffraction Pattern ◽  
Multilayered Materials

ABSTRACTX-ray diffraction is a useful method to measure the microscopic strain profile in multilayered materials. Depth profiles of strain in the modulation direction are obtained by an iterative fitting of the experimental diffraction pattern with a kinematic model. This approach was used to characterize the coherency strain profile in Au/Ni superlattices.The accommodation of coherency strain through the superlattice is dependent upon the atomic misfit between the component materials and the thickness of each layer. The depth profile of strain was determined for multilayers with repeat periodicities of 2.92 nm and 4.26 nm. A significant volume fraction of interfaces is present in these nanometric dimensioned laminates.

X-RAY DIFFRACTION ANALYSIS OF EPITAXIAL STRUCTURES

1985 ◽  
Vol 56 ◽  
Author(s):  
BRUCE M. PAINE
Keyword(s):  
Diffraction Analysis ◽  
Kinematic Model ◽  
Single Layer ◽  
Epitaxial Layers ◽  
X Ray Diffraction ◽  
Double Crystal ◽  
X Ray ◽  
Depth Profiles ◽  
Atomic Displacements ◽  
Structure Factors

AbstractThe technique is described for use of x-ray double crystal diffractometry for analysis of epitaxial structures. This method has been shown to be very useful for characterizing a wide variety of configurations, ranging from single epitaxial layers to damaged superlattices. It yields depth profiles of structure factors and strains relative to the substrate, which can be directly related to layer thicknesses and compositions. Information about dislocations and random atomic displacements is also present. The key to this technique is computer fitting of the x-ray data with a model for the diffraction process, utilizing trial profiles for the strain and structure factors of the epitaxial layers. In the work to be presented a kinematic model for the diffraction is used. The technique is demonstrated with analyses of an Alx Ga(1−x) As single layer on GaAs, an AlSb/GaSb superlattice on GaSb, epitaxial CoSi2 on Si, and ion-implanted and annealed AlxGa(1−x)As superlattices on GaAs.

Analysis of the Strain Profile in Thin Au/Ni Multilayers by X-Ray Diffraction

1990 ◽  
Vol 208 ◽  
Author(s):  
J. Chaudhuri ◽  
V. Gondhalekar ◽  
A. F. Jankowski
Keyword(s):  
Diffraction Pattern ◽  
Diffraction Theory ◽  
Metallic Multilayers ◽  
X Ray Diffraction ◽  
Strain Profile ◽  
X Ray ◽  
Depth Profiles

ABSTRACTA dynamical x-ray diffraction theory has been used to obtain microscopic strain profiles in thin Au/Ni multilayers. Depth profiles of strains in these multilayers, with repeat periodicities varying from 0.82 nm to 9.0 nm, are obtained by an iterative fitting of the calculated diffraction pattern with the experimental one. Interfacial coherency is found to play an important role in understanding the origin of the supermodulus effect in metallic multilayers.

Irreversible hydrogenation of solid C60 with and without catalytic metals

1999 ◽  
Vol 14 (5) ◽  
pp. 2138-2146 ◽  
Author(s):  
Eric L. Brosha ◽  
John Davey ◽  
Fernando H. Garzon ◽  
Shimshon Gottesfeld
Keyword(s):  
Diffraction Analysis ◽  
Volume Fraction ◽  
Evolved Gas Analysis ◽  
Amorphous Material ◽  
Single Layer ◽  
Gas Analysis ◽  
X Ray Diffraction ◽  
Evolved Gas ◽  
X Ray ◽  
Graphite Sheets

The dehydrogenation of C60 · H18.7 was studied using thermogravimetric and powder x-ray diffraction analysis. C60 · H18.7 was found to be stable up to 430 °C in Ar at which point the release of hydrogen initiated the collapse of a fraction of fullerene molecules. X-ray diffraction analysis performed on C60 · H18.7 samples dehydrogenated at 454, 475, and 600 °C displayed an increasing volume fraction of amorphous material. The decomposition product comprises randomly oriented, single-layer graphite sheets. Evolved gas analysis using gas chromatograph (GC) mass spectroscopy confirmed the presence of both H2 and methane upon dehydrogenation. Attempts to improve reversibility or reduce hydrogenation/ dehydrogenation temperatures by addition of Ru and Pt catalysts were unsuccessful.

Determination of Composition and Phase Depth-Profiles in Multilayer and Gradient Solid Solution Photovoltaic Films Using Grazing Incidence X-ray Diffraction

1994 ◽  
Vol 38 ◽  
pp. 269-276
Author(s):  
B. L. Ballard ◽  
X. Zhu ◽  
P. K. Predecki ◽  
D. Albin ◽  
A. Gabor ◽  
...  
Keyword(s):  
Solid Solution ◽  
Volume Fraction ◽  
Thick Layer ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
Layer Film ◽  
X Ray ◽  
Phase Volume Fraction ◽  
Depth Profiles ◽  
Multi Layer Film

Abstract A method for using grazing incidence x-ray diffraction (GIXD) for profiling composition changes with depth of photovoltaic quality thin films is presented. The average thickness of the first layer in a multi-layer film of CuIn2Se3.5/CuInSe2/Mo and the variation in solid solution composition of a Cu(In1-xGax)Se2 (CIGS) film with depth are solved using this method. The phase volume fraction and the phase composition profiles are developed from peak intensity and d-spacing measurements respectively at a series of fixed incident angles corresponding to a set of increasing 1/e penetration depths, τ. Inverse Laplace and numerical methods are applied to the τ profiles converting them to true depth profiles. Vegard's law is applied to the d-spacing vs z-profile to obtain x in the formula Cu(In1-xGax)Se2. The results show that an ∼1 μm thick layer of CuIn2Se3.5 is present on the surface of the multi-layer film and that the CIGS film consists of a Ga rich surface layer ∼2000 Å thick followed by a gradual decrease in Ga content with increasing depth. This gradient appears to be desirable for producing photovoltaic quality CIGS films.

Surface and Ultra-Thin Film Characterization by Grazing-Incidence Asymmetric Bragg Diffraction

1989 ◽  
Vol 33 ◽  
pp. 91-100 ◽  
Author(s):  
T. C. Huang
Keyword(s):  
Thin Film ◽  
Diffraction Analysis ◽  
Grazing Incidence ◽  
Bragg Diffraction ◽  
Dead Layer ◽  
X Rays ◽  
X Ray Diffraction ◽  
X Ray ◽  
Depth Profiles ◽  
Radiation Sources

AbstractAn effective technique using grazing-incidence X-rays and asymmetric-Bragg diffraction (GIABD) for the characterization of crystalline phases on surfaces and structural depth-profiles in thin films is described. The application of the GIABD using both X-ray and synchrotron radiation sources for the analysis of an iron-oxide magnetic thin film previously reported to have an unexpected magnetically-dead layer is discussed. The X-ray diffraction analysis using the GIABD and the conventional θ-2θ scanning techniques detected an anti-ferromagnetic hexagonal α-Fe2O3 on the surface and a ferromagnetic tetragonal γ-Fe2O3 in the bulk of the film, respectively. The synchrotron diffraction analysis using incident angles below and above the critical angle of total reflection quantitatively determined the structural depth-profiles of α-Fe2O3 and γ-Fe2O3 in the film.

Ten-Vertex Polyhedral Monocarbaborane Chemistry. The Novel High-Yield Formation of the Ten-Vertex closo Compound [6-(PMe2Ph)-closo-1-CB9H9] from the Thermolysis of [8,8-(PMe2Ph)2-nido-8,7-PtCB9H11]

1993 ◽  
Vol 58 (12) ◽  
pp. 2924-2935 ◽  
Author(s):  
Jane H. Jones ◽  
Bohumil Štíbr ◽  
John D. Kennedy ◽  
Mark Thornton-Pett
Keyword(s):  
Nmr Spectroscopy ◽  
Diffraction Analysis ◽  
High Yield ◽  
Monoclinic Space Group ◽  
The Novel ◽  
X Ray Diffraction ◽  
Metal Centre ◽  
X Ray ◽  
Yield Formation ◽  
Boiling Toluene

Thermolysis of [8,8-(PMe2Ph)2-nido-8,7-PtCB9H11] in boiling toluene solution results in an elimination of the platinum centre and cluster closure to give the ten-vertex closo species [6-(PMe2Ph)-closo-1-CB9H9] in 85% yield as a colourles air stable solid. The product is characterized by NMR spectroscopy and single-crystal X-ray diffraction analysis. Crystals (from hexane-dichloromethane) are monoclinic, space group P21/c, with a = 903.20(9), b = 1 481.86(11), c = 2 320.0(2) pm, β = 97.860(7)° and Z = 8, and the structure has been refined to R(Rw) = 0.045(0.051) for 3 281 observed reflections with Fo > 2.0σ(Fo). The clean high-yield elimination of a metal centre from a polyhedral metallaborane or metallaheteroborane species is very rare.

Bis(μ-carboxylato)dienerhodium(I) Complexes - Synthesis, Characterization and Catalytic Activity

2008 ◽  
Vol 73 (8-9) ◽  
pp. 1205-1221 ◽  
Author(s):  
Jiří Zedník ◽  
Jan Sedláček ◽  
Jan Svoboda ◽  
Jiří Vohlídal ◽  
Dmitrij Bondarev ◽  
...  
Keyword(s):  
Catalytic Activity ◽  
Diffraction Analysis ◽  
Spectroscopic Methods ◽  
X Ray Diffraction ◽  
X Ray

Dinuclear rhodium(I) η2:η2-cycloocta-1,5-diene (series a) and η2:η2-norborna-2,5-diene (series b) complexes with μ-RCOO- ligands, where R is linear C21H43 (complexes 1a, 1b), CH2CMe3 (2a, 2b), 1-adamantyl (3a, 3b) and benzyl (4a, 4b), have been prepared and characterized by spectroscopic methods. Structures of complexes 2b, 3a and 4a were determined by X-ray diffraction analysis. Complexes prepared show low to moderate catalytic activity in polymerization of phenylacetylene in THF giving high-cis-transoid polymers, but they show only oligomerization activity in dichloromethane.

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