Structural Inhomogeneities Of SiO2 Quartz Gláss

1987 ◽  
Vol 105 ◽  
Author(s):  
Zenon Bochyński
Keyword(s):  
Amorphous Materials ◽  
Structural Parameters ◽  
Direct Determination ◽  
Great Success ◽  
X Ray Diffraction ◽  
Crystalline Materials ◽  
X Ray ◽  
Accuracy Of Results ◽  
Inorganic Glasses

AbstractTill now the only effective method of direct determination of structural parameters has been X-ray diffraction structural analysis. This method applied to crystalline materials has proved a great success and applied to noncrystalline substances like for example inorganic glasses, is becoming more and more successful.Beginning with the W. Ostwald proposition /1913/ carried out by W. Friedrich /1913/ and P. Debye /1915/ through the papers by B.E. Warren et al. /1934–1942/ or by E.A. Poray-Koshits et al. /1934–1942/ till the most recently published papers devoted to structural studies of noncrystalline /amorphous/ materials we follow a significant progress in technology and methodology of these studies.The resulting significant improvement to the accuracy of results yields much more accurate structural models of non-crystalline materials.

Direct Determination of Stress Levels in Sputtered Films by means of X-Ray Diffraction Topographic Method

1987 ◽  
Vol 26 (Part 1, No. 1) ◽  
pp. 157-161 ◽  
Author(s):  
Osamu Nittono ◽  
Yoshihiro Sadamoto ◽  
Sheng Kai Gong
Keyword(s):  
Direct Determination ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sputtered Films ◽  
Stress Levels

Experimental Method of Determination of Structural Correlations in Surface Layers of Oxide Glass

1990 ◽  
Vol 216 ◽  
Author(s):  
Zenon BochyŃski
Keyword(s):  
Structural Changes ◽  
Lattice Models ◽  
Molecular Size ◽  
Oxide Glass ◽  
X Ray Diffraction ◽  
Surface Layers ◽  
X Ray ◽  
The Real ◽  
Inorganic Glasses

ABSTRACTA new method of X-ray diffraction analysis of structural inhomogeneities in the quartz/Si02/n based inorganic glasses is presented. The method enables the determination of structural changes occuring in the real nodal lattice in the regions of 10…20 Å or more as well as substructural changes in the regions 5…15 Å comparable to the molecular size of SiO2…SiO4. In consequence these changes can be correlated with approximate nodal lattice models of different degree of ordering. The applied method provided the possibility of constructing structural models of nodal lattices describing the surface and inner layers of the real glasses, changes in the local inhomogeneities as well as boundaries in water-gel associates.

Direct determination of strain and composition in InGaAs nano-islands using anomalous grazing incidence x-ray diffraction

2004 ◽  
Vol 36 (1-3) ◽  
pp. 11-19 ◽  
Author(s):  
M. Sztucki ◽  
T.U. Schülli ◽  
T.H. Metzger ◽  
E. Beham ◽  
D. Schuh ◽  
...  
Keyword(s):  
Direct Determination ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray

D-5 The Direct Determination of X-ray Diffraction Data from Specific Depths

2004 ◽  
Vol 19 (2) ◽  
pp. 195-195
Author(s):  
A. Broadhurst ◽  
K. D. Rogers ◽  
D. W. Lane ◽  
T. W. Lowe
Keyword(s):  
Diffraction Data ◽  
Direct Determination ◽  
X Ray Diffraction ◽  
X Ray

The direct determination of X-ray diffraction data from specific depths

2005 ◽  
Vol 20 (3) ◽  
pp. 233-240
Author(s):  
A. Broadhurst ◽  
K. D. Rogers ◽  
D. W. Lane ◽  
T. W. Lowe
Keyword(s):  
Diffraction Data ◽  
Direct Method ◽  
Direct Determination ◽  
Simulated Data ◽  
X Ray Diffraction ◽  
Linear Absorption ◽  
X Ray ◽  
Measured Angle ◽  
Data Collections

A direct method for determining powder diffraction data from a range of depths is described, where the linear absorption coefficient may vary with depth. A series of traditional data collections with varying angles of incidence are required, and the X-ray diffraction data arising from specific depths will be calculated by the transformation of these measured, angle-dependent spectra. These may then be analysed using any conventional method in order to gain information about characteristics of the sample in question at specific depths. Regularisation techniques have been used to solve the governing Fredholm integral equation to determine the depth-dependent diffractograms. The method has been validated by the use of simulated data having known model profiles, and has also been applied to experimental data from polycrystalline thin film samples.

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