Thermoelectric Measurements of Ni Nanojunctions
Keyword(s):
ABSTRACTWe investigated the thermoelectric voltage (TEV) of atomic contacts of nickel (Ni) by using a scanning tunneling microscope. The TEV of nanoscale junctions show fluctuation in stepwise manner. Histogram analysis of TEV observed in the Ni point contact with the conductance of 1.2 G0 (G0 = 2e2/h is the quantum of charge conductance) revealed multiple voltage peaks at larger and smaller values observed at conductance of 2.5 G0, which showed a single sharp voltage peak. Fluctuation observed in our results suggest that there is transition of the transport channel distribution caused by the thermal motion of Ni atoms.
1991 ◽
Vol 49
◽
pp. 378-379
1993 ◽
Vol 51
◽
pp. 68-69
1993 ◽
Vol 51
◽
pp. 704-705
1988 ◽
Vol 49
(C6)
◽
pp. C6-55-C6-59
◽