Infrared ellipsometry and near-infrared-to-vacuum-ultraviolet ellipsometry study of free-charge carrier properties in In-polar p-type InN
Keyword(s):
P Type
◽
ABSTRACTWe apply infrared spectroscopic ellipsometry (IRSE) in combination with near-infrared to vacuum-ultraviolet ellipsometry to study the concentration and mobility of holes in a set of Mg-doped In-polar InN samples of different Mg-concentrations. P-type behavior is found in the IRSE spectra for Mg-concentrations between 1x1018 cm-3 and 3x1019 cm-3. The free-charge carrier parameters are determined using a parameterized model that accounts for phonon-plasmon coupling. From the NIR-VUV data information about layer thicknesses, surface roughness, and structural InN layer properties are extracted and related to the IRSE results.
Keyword(s):
2008 ◽
Vol 5
(5)
◽
pp. 1350-1353
◽
Keyword(s):
Keyword(s):
Keyword(s):
Keyword(s):
Keyword(s):
Free charge carrier repartition over the surface of photosensitive materials: Why and how to manage?
2008 ◽
Vol 78
(5)
◽
pp. 1070-1080
◽
Keyword(s):