Comparison of Epitaxial Graphene on Si-face and C-face 6H-SiC

2011 ◽  
Vol 1284 ◽  
Author(s):  
Shin Mou ◽  
J. J. Boeckl ◽  
L. Grazulis ◽  
B. Claflin ◽  
Weijie Lu ◽  
...  
Keyword(s):  
Thermal Decomposition ◽  
Raman Spectroscopy ◽  
High Vacuum ◽  
Hall Effect Measurement ◽  
Radiative Heating ◽  
Furnace Chamber ◽  
Vacuum Furnace ◽  
Force Microscopy ◽  
Atomic Force ◽  
Graphene Films

ABSTRACTWe present atomic force microscopy (AFM), Hall-effect measurement, and Raman spectroscopy results from graphene films on 6H-SiC (0001) and (000-1) faces (Si-face and C-face, respectively) produced by radiative heating in a high vacuum furnace chamber through thermal decomposition. We observe that the formation of graphene on the two faces of SiC is different in terms of the surface morphology, graphene thickness, Hall mobility, and Raman spectra. In general, graphene films on the SiC C-face are thicker with higher mobilities than those grown on the Si-face.

Graphene Growth on SiC and Metal Surfaces by Solid Source Carbon Deposition

2010 ◽  
Vol 1246 ◽  
Author(s):  
W. C. Mitchel ◽  
J. H. Park ◽  
H. E. Smith ◽  
L. Grazulis
Keyword(s):  
Thermal Decomposition ◽  
Raman Spectroscopy ◽  
Photoelectron Spectroscopy ◽  
Carbon Flux ◽  
Carbon Deposition ◽  
Carbon Sources ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Graphene Films

AbstractGraphene has been grown by direct deposition of carbon from solid sources on both SiC and Ta films on SiC in an MBE environment. Carbon fluxes were obtained from thermally evaporated C60 and from a heated graphite filament. The graphene films were characterized by Raman spectroscopy, X-ray photoelectron spectroscopy and atomic force microscopy. Graphene films on Si-face SiC grown by carbon source MBE (CSMBE) were compared with graphene grown by the standard epitaxial graphene process using SiC thermal decomposition. CSMBE on SiC was found to grow at lower temperatures (1200°C) and to have fewer pits and a more uniform surface. Uniform graphene films were found to grow on Ta films after exposure to both carbon sources at 1200°C but Raman measurements showed no signs of graphene on films exposed to the same temperature without a carbon flux.

scholarly journals Exploring Intramolecular Methyl–Methyl Coupling on a Metal Surface for Edge-Extended Graphene Nanoribbons

2021 ◽  
Vol 03 (02) ◽  
pp. 128-133
Author(s):  
Zijie Qiu ◽  
Qiang Sun ◽  
Shiyong Wang ◽  
Gabriela Borin Barin ◽  
Bastian Dumslaff ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
High Resolution ◽  
Graphene Nanoribbons ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Methyl Methyl ◽  
Atomic Force ◽  
Edge Extension

Intramolecular methyl–methyl coupling on Au (111) is explored as a new on-surface protocol for edge extension in graphene nanoribbons (GNRs). Characterized by high-resolution scanning tunneling microscopy, noncontact atomic force microscopy, and Raman spectroscopy, the methyl–methyl coupling is proven to indeed proceed at the armchair edges of the GNRs, forming six-membered rings with sp3- or sp2-hybridized carbons.

Characterization of carbon films microstructure by atomic force microscopy and Raman spectroscopy

1994 ◽  
Vol 76 (6) ◽  
pp. 3443-3447 ◽  
Author(s):  
J. M. Yáñez‐Limón ◽  
F. Ruiz ◽  
J. González‐Hernández ◽  
C. Vázquez‐López ◽  
E. López‐Cruz
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Carbon Films ◽  
Force Microscopy ◽  
Atomic Force

In Situ Atomic Force Microscopy Tip-Induced Deformations and Raman Spectroscopy Characterization of Single-Wall Carbon Nanotubes

Nano Letters ◽  
2012 ◽  
Vol 12 (8) ◽  
pp. 4110-4116 ◽  
Author(s):  
P. T. Araujo ◽  
N. M. Barbosa Neto ◽  
H. Chacham ◽  
S. S. Carara ◽  
J. S. Soares ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Single Wall Carbon Nanotubes ◽  
Single Wall Carbon ◽  
Force Microscopy ◽  
Atomic Force

Laser cleaning of exfoliated graphene

2012 ◽  
Vol 1455 ◽  
Author(s):  
Oliver Ochedowski ◽  
Benedict Kleine Bußmann ◽  
Marika Schleberger
Keyword(s):  
Local Heating ◽  
High Vacuum ◽  
Ultra High Vacuum ◽  
Ambient Conditions ◽  
Kelvin Probe ◽  
Structural Modifications ◽  
Force Microscopy ◽  
Exfoliated Graphene ◽  
Atomic Force ◽  
P Type

ABSTRACTWe have employed atomic force and Kelvin-Probe force microscopy to study graphene sheets exfoliated on TiO2 under the influence of local heating achieved by laser irradiation. Exfoliation and irradiation took place under ambient conditions, the measurements were performed in ultra high vacuum. We show that after irradiation times of 6 min, an increase of the surface potential is observed which indicates a decrease of p-type carrier concentration. We attribute this effect to the removal of adsorbates like water and oxygen. After irradiation times of 12 min our topography images reveal severe structural modifications of graphene. These resemble the nanocrystallite network which form on graphene/SiO2 but after much longer irradiation times. From our results we propose that short laser heating at moderate powers might offer a way to clean graphene without inducing unwanted structural modifications.

Atomic force microscopy and Raman spectroscopy of Pb1−xSnxTe surfaces polished after treatment with H2O2–HBr–ethylene glycol etchants

2019 ◽  
Vol 10 (8) ◽  
pp. 2717-2722
Author(s):  
G. P. Malanych ◽  
O. F. Kolomys ◽  
A. A. Korchovyi ◽  
N. V. Safriuk ◽  
V. M. Tomashyk
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Ethylene Glycol ◽  
Force Microscopy ◽  
Atomic Force
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