Scanning Probe Microscopy with Diamond Tip in Tribo-nanolithography

2011 ◽  
Vol 1318 ◽  
Author(s):  
Oleg Lysenko ◽  
Vladimir Grushko ◽  
Evgeni Mitskevich ◽  
Athanasios Mamalis
Keyword(s):  
Scanning Probe Microscopy ◽  
Experimental Studies ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Boron Doped Diamond ◽  
High Stiffness ◽  
Boron Doped ◽  
Afm Cantilever ◽  
The Stability

ABSTRACTThe results obtained by direct nano-patterning demonstrate the potential of the SPM-based techniques that include surface scratching to create 3D nanostructures. Such techniques became known as tribo-nanolithography and have prospects of being successfully implemented in the future nanofabrication industry. An important obstacle to this, however, is the effect of wear at the nanometer scale which is critical to the stability of tribo-nanolithoraphic processes. Such stability is achievable via in-depth theoretical and experimental studies of friction at the nanoscale along with the development of pioneering equipment. Our work presents the results of experimental fabrication of nanostructures formed by nanoscratching with the use of the multifunctional scanning tunneling microscopy previously developed by the authors. The authors attempted scratching the silicon surface by using a boron-doped diamond tip. This operation was undertaken in the same direction sequentially with the tip sliding a side of the groove by one of the tip’s facets and the consequent surface scanning. Although not being applicable to non-conductive surfaces, the proposed technique has significant advantages. One advantage is related to the high stiffness of the tunneling probe as compared to the stiffness of the AFM cantilever. High stiffness and perpendicularity of the tip to the surface during surface processing eliminates bending beam effects on the typical AFM and ensures machining effectiveness. Purposely synthesized boron-doped single-crystal diamonds were used as a tip material. The results of experimental fabrication of nanostructures formed by nanoscratching with the use of the multifunctional scanning probe are demonstrated and discussed.

SCANNING PROBE MICROSCOPY BASED NANOSCALE PATTERNING AND FABRICATION

COSMOS ◽  
2007 ◽  
Vol 03 (01) ◽  
pp. 1-21 ◽  
Author(s):  
XIAN NING XIE ◽  
HONG JING CHUNG ◽  
ANDREW THYE SHEN WEE
Keyword(s):  
Integrated Circuits ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Nanoscale Patterning ◽  
Atomic Force ◽  
Probe Microscope ◽  
Molecular Manipulation

Nanotechnology is vital to the fabrication of integrated circuits, memory devices, display units, biochips and biosensors. Scanning probe microscope (SPM) has emerged to be a unique tool for materials structuring and patterning with atomic and molecular resolution. SPM includes scanning tunneling microscopy (STM) and atomic force microscopy (AFM). In this chapter, we selectively discuss the atomic and molecular manipulation capabilities of STM nanolithography. As for AFM nanolithography, we focus on those nanopatterning techniques involving water and/or air when operated in ambient. The typical methods, mechanisms and applications of selected SPM nanolithographic techniques in nanoscale structuring and fabrication are reviewed.

STM Study of Diamond(001) Surface

1992 ◽  
Vol 242 ◽  
Author(s):  
Takashi Tsuno ◽  
Takahiro Imai ◽  
Yoshiki Nishibayashi ◽  
Naoji Fujimori
Keyword(s):  
Methane Concentration ◽  
Chemical Vapor ◽  
Epitaxial Films ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Boron Doped Diamond ◽  
Boron Doped ◽  
Partially Observed ◽  
Type Reconstruction ◽  
B Doping

ABSTRACTUndoped and boron-doped diamond epitaxial films were deposited on diamond(001) substrate by micro-wave plasma assisted chemical vapor deposition and their surfaces were studied by scanning tunneling microscopy in air. An atomic order resolution was confirmed for the observation.For the undoped epitaxial films, which showed 2×1 and 1×2 RHEED patterns, dimer type reconstruction was observed and it was considered that the growth occurs through the dimer row extension. In the case of B-doped films, the dimer reconstruction was also observed. However, 2×2 structure due to the absence of dimer was partially observed.The effect of boron concentration and methane concentration during epitaxial growth on the surface morphology were also studied. The morphology observed by STM became flatter, as the concentration of B-doping and methane concentration, during growth, increased.

Recognition, Specificity, Scanning Probe Microscopy and Biomaterials

2001 ◽  
Vol 7 (S2) ◽  
pp. 130-131
Author(s):  
Buddy D. Ratner ◽  
Reto Luginbühll ◽  
Rene Overney ◽  
Michael Garrison ◽  
Thomas Boland
Keyword(s):  
Scanning Probe Microscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Film Structure ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Specific Information ◽  
Tunneling Microscopy ◽  
Probe Microscopy ◽  
Biomaterial Surfaces ◽  
Nucleotide Bases

Although scanning probe microscopy (SPM) can generate images of surface topography, this class of techniques is exceptionally valuable in its ability to provide quantitative and chemically specific information about biomaterial surfaces with high spatial definition. Since engineered biomaterials are designed to deliver chemically defined information, often arrayed in specific geometries, tools that can characterize such materials are needed.A few years ago, we demonstrated how the atomic force microscope (AFM) could precisely distinguish between each of the four nucleotide bases that comprise DNA, measure the nucleotide-nucleotide force of interaction and spatially localize that information on a surface (1). in particular, we found that the nucleotide bases could self-assemble on gold. The assembly process was imaged using scanning tunneling microscopy (STM) and this led to an understanding of the structure of the assembled film. The assembled film structure was further characterized using electron spectroscopy for chemical analysis (ESCA) and secondary ion mass spectrometry (SIMS).

Topology of synthetic, boron-doped diamond by scanning tunneling microscopy

1994 ◽  
Vol 3 (1-2) ◽  
pp. 94-97 ◽  
Author(s):  
Shenda M. Baker ◽  
George R. Rossman ◽  
John D. Baldeschwieler
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Boron Doped Diamond ◽  
Boron Doped

scholarly journals Исследование пленок диметилдиимида перилентетракарбоновой кислоты методами циклической термодесорбции и сканирующей зондовой микроскопии

2018 ◽  
Vol 60 (2) ◽  
pp. 255
Author(s):  
А.Е. Почтенный ◽  
А.Н. Лаппо ◽  
И.П. Ильюшонок
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Bandgap Width ◽  
Kelvin Probe ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Probe Spectroscopy

AbstractSome results of studying the direct-current (DC) conductivity of perylenetetracarboxylic acid dimethylimide films by cyclic oxygen thermal desorption are presented. The microscopic parameters of hopping electron transport over localized impurity and intrinsic states were determined. The bandgap width and the sign of major current carriers were determined by scanning probe microscopy methods (atomic force microscopy, scanning probe spectroscopy, and photoassisted Kelvin probe force microscopy). The possibility of the application of photoassisted scanning tunneling microscopy for the nanoscale phase analysis of photoconductive films is discussed.

Industrial Applications of Scanning Probe Microscopy

1998 ◽  
Vol 4 (S2) ◽  
pp. 522-523
Author(s):  
S. Magonov
Keyword(s):  
Scanning Probe Microscopy ◽  
High Vacuum ◽  
Sample Surface ◽  
Industrial Applications ◽  
Ultra High Vacuum ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Probe Microscopy ◽  
Force Microscopy

The evolution of scanning tunneling microscopy (STM) into atomic force microscopy (AFM) have led to a family of scanning probe techniques which are widely applied in fundamental research and in industry. Visualization of the atomic- and molecular-scale structures and the possibility of modifying these structures using a sharp probe were demonstrated with the techniques on many materials. These unique capabilities initiated the further development of AFM and related methods generalized as scanning probe microscopy (SPM). The first STM experiments were performed in the clean conditions of ultra-high vacuum and on well-defined conducting or semi-conducting surfaces. These conditions restrict SPM applications to the real world that requires ambient-condition operation on the samples, many of which are insulators. AFM, which is based on the detection of forces between a tiny cantilever carrying a sharp tip and a sample surface, was introduced to satisfy these requirements. High lateral resolution and unique vertical resolution (angstrom scale) are essential AFM features.

Scanning-probe microscopy of polymers

1993 ◽  
Vol 51 ◽  
pp. 874-875
Author(s):  
Darrell H. Reneker ◽  
Rajkumari Patil ◽  
Seog J. Kim ◽  
Vladimir Tsukruk
Keyword(s):  
Scanning Probe Microscopy ◽  
Domain Boundary ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Lamellar Crystal ◽  
Probe Microscopy ◽  
Atomic Force ◽  
Resolution Observation ◽  
Lamellar Crystals

Scanning probe microscopy techniques, particularly atomic force microscopy (AFM) and scanning tunneling microscopy (STM) are finding a rapidly growing number of applications to both synthetic and biological polymers. Segments of individual polymer molecules can often be observed with atom scale resolution. Observation of polymeric objects as large as 100 microns with nanometer resolution is possible with contemporary AFM, although features caused by the convolution of the shape of the sample and the shape of the tip must be recognized and properly interpreted. The vertical resolution of the atomic force microscope readily provides precise data about the heights of molecules, crystals, and other objects.Lamellar crystals of polyethylene are well characterized objects with many features which can be observed with scanning probe microscopes. Figure 1 shows the fold surface near a fold domain boundary of a lamellar crystal of polyethylene, as observed with an AFM. The folded chain crystal is about 15 nm thick.

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