Effects of dislocations and sub-grain boundaries on X-ray response maps of CdZnTe radiation detectors

2011 ◽  
Vol 1341 ◽  
Author(s):  
A. Hossain ◽  
A. E. Bolotnikov ◽  
G. S. Camarda ◽  
Y. Cui ◽  
R. Gul ◽  
...  
Keyword(s):  
Grain Boundaries ◽  
High Spatial Resolution ◽  
Radiation Detectors ◽  
National Synchrotron Light Source ◽  
X Ray ◽  
Response Mapping ◽  
Mapping System ◽  
Te Inclusions ◽  
Synchrotron Light

ABSTRACTThe imperfect quality of CdZnTe (CZT) crystals for radiation detectors seriously diminishes their suitability for different applications. Dislocations and other dislocation-related defects, such as sub-grain boundaries and dislocation fields around Te inclusions, engender significant charge losses and, consequently, cause fluctuations in the detector’s output signals, thereby hindering their spectroscopic responses. In this paper, we discuss our results from characterizing CZT material by using a high-spatial-resolution X-ray response mapping system at BNL’s National Synchrotron Light Source. In this paper, we emphasize the roles of these dislocation-related defects and their contributions in degrading the detector’s performance. Specifically, we compare the effects of the sub-grain- and coherent twin-boundaries on the X-ray response maps.

Development of Diamond-Based X-ray Detection for High Flux Beamline Diagnostics

2009 ◽  
Vol 1203 ◽  
Author(s):  
Jen Bohon ◽  
John Smedley ◽  
Erik M. Muller ◽  
Jeffrey W. Keister
Keyword(s):  
Single Crystal ◽  
Linear Response ◽  
Voltage Dependence ◽  
Cvd Diamond ◽  
High Flux ◽  
National Synchrotron Light Source ◽  
X Ray ◽  
Single Crystal Diamond ◽  
Synchrotron Light ◽  
Pulse Structure

AbstractHigh quality single crystal and polycrystalline CVD diamond detectors with platinum contacts have been tested at the white beam X28C beamline at the National Synchrotron Light Source under high-flux conditions. The voltage dependence of these devices has been measured under DC and pulsed-bias conditions, establishing the presence or absence of photoconductive gain in each device. Linear response has been achieved over eleven orders of magnitude when combined with previous low flux studies. Temporal measurements with single crystal diamond detectors have resolved the ns scale pulse structure of the NSLS.

scholarly journals Design and performance of an X-ray scanning microscope at the Hard X-ray Nanoprobe beamline of NSLS-II

2017 ◽  
Vol 24 (6) ◽  
pp. 1113-1119 ◽  
Author(s):  
E. Nazaretski ◽  
H. Yan ◽  
K. Lauer ◽  
N. Bouet ◽  
X. Huang ◽  
...  
Keyword(s):  
Material Science ◽  
Phase Contrast ◽  
Heat Dissipation ◽  
Regulation System ◽  
Scanning Microscope ◽  
National Synchrotron Light Source ◽  
X Ray ◽  
Synchrotron Light ◽  
Differential Phase Contrast ◽  
And Performance

A hard X-ray scanning microscope installed at the Hard X-ray Nanoprobe beamline of the National Synchrotron Light Source II has been designed, constructed and commissioned. The microscope relies on a compact, high stiffness, low heat dissipation approach and utilizes two types of nanofocusing optics. It is capable of imaging with ∼15 nm × 15 nm spatial resolution using multilayer Laue lenses and 25 nm × 26 nm resolution using zone plates. Fluorescence, diffraction, absorption, differential phase contrast, ptychography and tomography are available as experimental techniques. The microscope is also equipped with a temperature regulation system which allows the temperature of a sample to be varied in the range between 90 K and 1000 K. The constructed instrument is open for general users and offers its capabilities to the material science, battery research and bioscience communities.

Microstructure and Texture in Copper Sheets after Reverse and Cross Rolling

2005 ◽  
Vol 105 ◽  
pp. 309-314 ◽  
Author(s):  
M. Ostafin ◽  
Jan Pospiech ◽  
Robert A. Schwarzer
Keyword(s):  
Grain Boundaries ◽  
Crystal Orientation ◽  
High Spatial Resolution ◽  
Rolling Direction ◽  
Orientation Measurement ◽  
Orientation Data ◽  
Cross Rolling ◽  
X Ray ◽  
Orientation Mapping ◽  
The Individual

The objectives of this investigation are structural effects in electrolytic copper sheets which are caused by the change of the direction of rolling. Unidirectional, reverse as well as cross-rolling at 90° respectively at 45° to the precedent rolling direction have been applied down to final deformations as low as 80% reduction in thickness. Texture has been determined by ACOM (Automated Crystal Orientation Measurement, “Automated EBSD”) in the SEM and by X-ray pole figure measurement. The main benefits of ACOM are a high spatial resolution which enables the investigation of texture gradients from the mid plane to the surface of the sheet, and the visualization of the microstructure by crystal orientation mapping. In addition to local texture, statistical distributions of misorientations across grain boundaries and of S grain boundaries have been derived from the individual grain orientation data. The change of the path of plastic deformation induces a destabilization of the substructure which is formed during the primary step of unidirectional rolling. A distinct change of texture is found depending on the deformation process. In cross rolling, the b fiber changes into the unstable b90 fiber which almost disappears with progressive deformation along the new rolling direction.

Tests of small X-ray Active Matrix Pixel Sensor prototypes at the National Synchrotron Light Source

2009 ◽  
Vol 4 (03) ◽  
pp. P03014-P03014 ◽  
Author(s):  
G A Carini ◽  
W Chen ◽  
A Dragone ◽  
J Fried ◽  
J Jakoncic ◽  
...  
Keyword(s):  
Light Source ◽  
National Synchrotron Light Source ◽  
Active Matrix ◽  
X Ray ◽  
Small X ◽  
Synchrotron Light

scholarly journals Design Status of the 2.5 GeV National Synchrotron Light Source X-Ray Ring

1979 ◽  
Vol 26 (3) ◽  
pp. 3806-3808 ◽  
Author(s):  
S. Krinsky ◽  
L. Blumberg ◽  
J. Bittner ◽  
J. Galayda ◽  
R. Heese ◽  
...  
Keyword(s):  
Light Source ◽  
National Synchrotron Light Source ◽  
X Ray ◽  
Synchrotron Light

SPECTROMICROSCOPY OF BIOLOGICAL AND ENVIRONMENTAL SYSTEMS AT STONY BROOK: INSTRUMENTATION AND ANALYSIS

2002 ◽  
Vol 09 (01) ◽  
pp. 185-191 ◽  
Author(s):  
C. JACOBSEN ◽  
T. BEETZ ◽  
M. FESER ◽  
A. OSANNA ◽  
A. STEIN ◽  
...  
Keyword(s):  
Principal Component Analysis ◽  
Data Analysis ◽  
Environmental Science ◽  
National Laboratory ◽  
Principal Component ◽  
Brookhaven National Laboratory ◽  
National Synchrotron Light Source ◽  
X Ray ◽  
Synchrotron Light ◽  
Data Analysis Methods

Soft X-ray microscopy allows one to study nanoscale heterogeneities in dry and wet environmental science, biological, polymer, and geochemical specimens. Recent advances in instrumentation at the X-1A beamline at the National Synchrotron Light Source at Brookhaven National Laboratory are described. Spectromicroscopy data analysis methods including component mapping and principal component analysis (PCA) are then discussed.

scholarly journals Developments in synchrotron x-ray computed microtomography at the National Synchrotron Light Source

1999 ◽  
Author(s):  
Betsy A. Dowd ◽  
Graham H. Campbell ◽  
Robert B. Marr ◽  
Vivek V. Nagarkar ◽  
Sameer V. Tipnis ◽  
...  
Keyword(s):  
Light Source ◽  
National Synchrotron Light Source ◽  
X Ray ◽  
Computed Microtomography ◽  
X Ray Computed ◽  
Synchrotron Light

Scanning Soft X-Ray Microscopy With A Fresnel Zoneplate At The National Synchrotron Light Source

1984 ◽  
Author(s):  
John M. Kenney ◽  
Janos Kirz ◽  
Harvey Rarback ◽  
Ralph Feder ◽  
David Sayre ◽  
...  
Keyword(s):  
Light Source ◽  
National Synchrotron Light Source ◽  
X Ray ◽  
Synchrotron Light
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