Scaling Challenges for NAND and Replacement Memory Technology
Keyword(s):
ABSTRACTPlanar NAND technology is rapidly approaching its fundamental limits and will likely transition to a three dimensional structure. The scaling challenges facing NAND will be reviewed. Emerging memory technologies, such as the cross-point, will be discussed. The materials challenges facing emerging memories will be reviewed.
2008 ◽
Vol 180
(4)
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pp. 2313-2321
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2005 ◽
2004 ◽
Vol 172
(9)
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pp. 5684-5692
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Keyword(s):
1987 ◽
Vol 45
◽
pp. 650-651
1987 ◽
Vol 45
◽
pp. 633-635
1990 ◽
Vol 48
(1)
◽
pp. 282-283