scholarly journals Excitons in scintillator materials: Optical properties and electron-energy loss spectra of NaI, LaBr3, BaI2, and SrI2

2016 ◽  
Vol 32 (1) ◽  
pp. 56-63 ◽  
Author(s):  
André Schleife ◽  
Xiao Zhang ◽  
Qi Li ◽  
Paul Erhart ◽  
Daniel Åberg
Keyword(s):  
Optical Properties ◽  
Energy Loss ◽  
Electron Energy ◽  
Image Position ◽  
Electron Energy Loss ◽  
Electron Energy Loss Spectra

Abstract

Measuring optical properties of individual SnO2 nanowires via valence electron energy-loss spectroscopy

2017 ◽  
Vol 32 (13) ◽  
pp. 2479-2486 ◽  
Author(s):  
Derek R. Miller ◽  
Robert E. Williams ◽  
Sheikh A. Akbar ◽  
Pat A. Morris ◽  
David W. McComb
Keyword(s):  
Optical Properties ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Valence Electron ◽  
Sno2 Nanowires ◽  
Image Position ◽  
Electron Energy Loss

Abstract

scholarly journals Optical properties of nickel derived from reflection electron energy loss spectra

2014 ◽  
Vol 488 (13) ◽  
pp. 132007
Author(s):  
R J Bereczky ◽  
J Tóth ◽  
B Da ◽  
S F Mao ◽  
Z J Ding ◽  
...  
Keyword(s):  
Optical Properties ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss ◽  
Electron Energy Loss Spectra

Comparison of Calculated and Recorded Electron Energy-Loss Spectra of Aluminium and Carbon

1990 ◽  
Vol 48 (2) ◽  
pp. 64-65
Author(s):  
L. Reimer ◽  
R. Oelgeklaus
Keyword(s):  
Fourier Transform ◽  
Energy Loss ◽  
Electron Energy ◽  
Rotational Symmetry ◽  
Mean Free Path ◽  
Single Scattering ◽  
Specimen Thickness ◽  
Two Dimensional ◽  
Image Position ◽  
Electron Energy Loss

Quantitative electron energy-loss spectroscopy (EELS) needs a correction for the limited collection aperture α and a deconvolution of recorded spectra for eliminating the influence of multiple inelastic scattering. Reversely, it is of interest to calculate the influence of multiple scattering on EELS. The distribution f(w,θ,z) of scattered electrons as a function of energy loss w, scattering angle θ and reduced specimen thickness z=t/Λ (Λ=total mean-free-path) can either be recorded by angular-resolved EELS or calculated by a convolution of a normalized single-scattering function ϕ(w,θ). For rotational symmetry in angle (amorphous or polycrystalline specimens) this can be realised by the following sequence of operations :(1)where the two-dimensional distribution in angle is reduced to a one-dimensional function by a projection P, T is a two-dimensional Fourier transform in angle θ and energy loss w and the exponent -1 indicates a deprojection and inverse Fourier transform, respectively.

Parallel Detection of Electron Energy Loss Spectra in Direct Mode

1990 ◽  
Vol 48 (2) ◽  
pp. 82-83
Author(s):  
Eckhard Quandt ◽  
Stephan laBarré ◽  
Andreas Hartmann ◽  
Heinz Niedrig
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Energy Resolution ◽  
Large Angle ◽  
Maximum Energy ◽  
Semiconductor Detectors ◽  
Parallel Detection ◽  
Photodiode Arrays ◽  
Electron Energy Loss ◽  
Electron Energy Loss Spectra

Due to the development of semiconductor detectors with high spatial resolution -- e.g. charge coupled devices (CCDs) or photodiode arrays (PDAs) -- the parallel detection of electron energy loss spectra (EELS) has become an important alternative to serial registration. Using parallel detection for recording of energy spectroscopic large angle convergent beam patterns (LACBPs) special selected scattering vectors and small detection apertures lead to very low intensities. Therefore the very sensitive direct irradiation of a cooled linear PDA instead of the common combination of scintillator, fibre optic, and semiconductor has been investigated. In order to obtain a sufficient energy resolution the spectra are optionally magnified by a quadrupole-lens system.The detector used is a Hamamatsu S2304-512Q linear PDA with 512 diodes and removed quartz-glas window. The sensor size is 13 μm ∗ 2.5 mm with an element spacing of 25 μm. Along with the dispersion of 3.5 μm/eV at 40 keV the maximum energy resolution is limited to about 7 eV, so that a magnification system should be attached for experiments requiring a better resolution.

A Poor Man’s Approach to Semi-Quantitative Analysis with Electron Energy Loss Spectroscopy

1980 ◽  
Vol 38 ◽  
pp. 110-111
Author(s):  
M. Isaacson
Keyword(s):  
Quantitative Analysis ◽  
Energy Loss ◽  
Electron Energy ◽  
Cross Section ◽  
Electron Energy Loss Spectroscopy ◽  
Excitation Cross Section ◽  
Incident Electron ◽  
Integral Cross Section ◽  
Image Position ◽  
Electron Energy Loss

In an earlier paper1 it was found that to a good approximation, the efficiency of collection of electrons that had lost energy due to an inner shell excitation could be written as where σE was the total excitation cross-section and σE(θ, Δ) was the integral cross-section for scattering within an angle θ and with an energy loss up to an energy Δ from the excitation edge, EE. We then obtained: where , with P being the momentum of the incident electron of velocity v. The parameter r was due to the assumption that d2σ/dEdΩ∞E−r for energy loss E. In reference 1 it was assumed that r was a constant.

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