scholarly journals Transmission electron microscopy with in situ ion irradiation

2015 ◽  
Vol 30 (9) ◽  
pp. 1214-1221 ◽  
Author(s):  
Jonathan Andrew Hinks
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Ion Irradiation ◽  
Transmission Electron ◽  
Image Position

Abstract

scholarly journals Effect of He-appm/DPA ratio on the damage microstructure of tungsten

MRS Advances ◽  
2016 ◽  
Vol 1 (42) ◽  
pp. 2893-2899 ◽  
Author(s):  
R.W. Harrison ◽  
H. Amari ◽  
G. Greaves ◽  
J.A. Hinks ◽  
S.E. Donnelly
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Ion Irradiation ◽  
Dislocation Loops ◽  
Vacancy Clusters ◽  
Transmission Electron ◽  
Damage Structure ◽  
Ordered Array ◽  
20 Nm

AbstractIn-situ ion irradiation and transmission electron microscopy has been used to examine the effects of the He appm to DPA ratio, temperature and dose on the damage structure of tungsten (W). Irradiations were performed with 15 or 60 keV He+ ions, achieving He-appm/displacements per atom (DPA) ratios of ∼40,000 and ∼2000, respectively, at temperatures between 500 and 1000°C to a dose of ∼3 DPA. A high number of small dislocation loops with sizes around 5–20 nm and a He bubble lattice were observed for both He-appm/DPA ratios at 500°C with a bubble size ∼1.5 nm. Using the g.b=0 criterion the loops were characterised as b = ±1/2<111> type. At 750°C bubbles do not form an ordered array and are larger in size compared to the irradiations at 500°C, with a diameter of ∼3 nm. Fewer dislocation loops were observed at this temperature and were also characterised to be b = ±1/2<111> type. At 1000°C, no dislocation loops were observed and bubbles grew as a function of fluence attributed to vacancy mobility being higher and vacancy clusters becoming mobile.

scholarly journals Recent Development in In-situ Ion Irradiation Transmission Electron Microscopy

2013 ◽  
Vol 19 (S2) ◽  
pp. 438-439
Author(s):  
K. Hattar ◽  
S.M. Hoppe ◽  
C. Chisholm ◽  
O.J. El-Atwani ◽  
B.A. Hernandez-Sanchez ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Ion Irradiation ◽  
Transmission Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Ion Beam-Induced Amorphization of (Mg, Fe)2SiO4 Olivine Series: An In Situ Transmission Electron Microscopy Study

1991 ◽  
Vol 235 ◽  
Author(s):  
L. M. Wang ◽  
R. C. Ewing
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Energy Loss ◽  
Computer Modelling ◽  
Ion Irradiation ◽  
Ion Beam ◽  
High Resolution Electron Microscopy ◽  
Bond Ionicity ◽  
Transmission Electron

ABSTRACTEffects of ion beam irradiation of five members of the (Mg, Fe)2SiO4 olivine series, from synthetic pure fayalite (Fe2SiO4) to naturally occurring (Mg0.88Fe0.12)2SiO4, have been studied by in situ transmission electron microscopy (TEM). Under 1.5 MeV Kr+ ion room temperature irradiations, all of the samples have been amorphized. The critical amorphization dose or the total collision energy loss required for amorphization increased rapidly with the increasing Mg:Fe ratio which coincides with an increasing melting temperature (bond strength) and an increasing average bond ionicity. A 400 keV He+ ion irradiation of (Mg0.88Fe0.12)2-SiO4, which mainly results in ionization energy loss in the sample, did not cause amorphization even at a much higher dose rate and a much higher final dose. This indicates nuclear interactions (collisions) are primarily responsible for ion beam induced amorphization. Also, high resolution electron microscopy (HREM) images of the defect structure at a low ion dose have been obtained and compared with the displacement cascade structure generated by computer modelling.

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