In-situ tensile testing of single-crystal molybdenum-alloy fibers with various dislocation densities in a scanning electron microscope

2011 ◽  
Vol 27 (3) ◽  
pp. 508-520 ◽  
Author(s):  
Kurt E. Johanns ◽  
Andreas Sedlmayr ◽  
P. Sudharshan Phani ◽  
Reiner Mönig ◽  
Oliver Kraft ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Single Crystal ◽  
Tensile Testing ◽  
Molybdenum Alloy ◽  
Dislocation Densities ◽  
Image Position ◽  
Scanning Electron ◽  
In Situ Tensile Testing

Abstract

In situ tensile testing of tin (Sn) whiskers in a focused ion beam (FIB)/scanning electron microscope (SEM)

2017 ◽  
Vol 79 ◽  
pp. 314-320 ◽  
Author(s):  
Renuka Vallabhaneni ◽  
Ehsan Izadi ◽  
Carl R. Mayer ◽  
C. Shashank Kaira ◽  
Sudhanshu S. Singh ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Tensile Testing ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Sn Whiskers ◽  
Scanning Electron ◽  
In Situ Tensile Testing

Mounting an individual submicrometer sized single crystal

1996 ◽  
Vol 211 (6) ◽  
Author(s):  
R. B. Neder ◽  
M. Burghammer ◽  
Th. Grasl ◽  
H. Schulz
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Single Crystal ◽  
Single Crystals ◽  
High Vacuum ◽  
Nanometer Resolution ◽  
Micro Manipulator ◽  
Scanning Electron

AbstractWe developed a new micro manipulator for mounting individual sub-micrometer sized single crystals within a scanning electron microscope. The translations are realized via a commercially available piezomicroscope, adapted for high vacuum usage and realize nanometer resolution. With this novel instrument it is routinely possible to mount individual single crystals with sizes down to 0.1

Microstructures of Low Angle Boundaries of the Second Generation Single Crystal Superalloy DD6

2011 ◽  
Vol 284-286 ◽  
pp. 1584-1587
Author(s):  
Zhen Xue Shi ◽  
Jia Rong Li ◽  
Shi Zhong Liu ◽  
Jin Qian Zhao
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Thin Layer ◽  
Single Crystal ◽  
Second Generation ◽  
Three Dimensional ◽  
Single Crystal Superalloy ◽  
Transition Electron ◽  
Scanning Electron

The specimens of low angle boundaries were machined from the second generation single crystal superalloy DD6 blades. The microstructures of low angle boundaries (LAB) were investigated from three scales of dendrite, γ′ phase and atom with optical microscopy (OM), scanning electron microscope (SEM), transition electron microscope (TEM) and high resolution transmission electrion microscopy (HREM). The results showed that on the dendrite scale LAB is interdendrite district formed by three dimensional curved face between the adjacent dendrites. On the γ′ phase scale LAB is composed by a thin layer γ phase and its bilateral imperfect cube γ′ phase. On the atom scale LAB is made up of dislocations within several atom thickness.

Effect of Briquetting Pressure on the Performance of In Situ Formed Sialon in Al2O3-C Refractory Bricks

2014 ◽  
Vol 881-883 ◽  
pp. 1049-1052 ◽  
Author(s):  
Nai Peng ◽  
Cheng Ji Deng ◽  
Hong Xi Zhu
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
X Ray Diffraction ◽  
X Ray ◽  
Z Value ◽  
Refractory Bricks ◽  
Scanning Electron

In this paper, the effects of briquetting pressure on the performance of in-situ formed Sialon in Al2O3-C refractory bricks are investigated. The phase compositions and microstructure of the Al2O3-C refractory were investigated by X-ray diffraction (XRD) and scanning electron microscope (SEM).The results show the briquetting pressure hardly has effect on the phase of the sintered specimens, two new phases of Sialon with a Z value of 2 and SiC formed. The micrographs of Sialon crystals have the shape of both column and tabular column, but with a cone tip in the specimens sintered at 200MPa and 300MPa and smooth tip in specimens sintered at 400MPa and 500MPa.

In-situ Fracturing of Wood in the Scanning Electron Microscope

Holzforschung ◽  
1996 ◽  
Vol 50 (6) ◽  
pp. 487-490 ◽  
Author(s):  
Josef Bodner ◽  
Gerhard Grüll ◽  
Michael Georg Schlag
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Scanning Electron
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