In situ transmission electron microscope study of interface sliding and migration in an ultrafine lamellar structure

2006 ◽  
Vol 21 (10) ◽  
pp. 2453-2459 ◽  
Author(s):  
L.M. Hsiung ◽  
J. Zhou ◽  
T.G. Nieh
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Lamellar Structure ◽  
Cooperative Movement ◽  
Transmission Electron ◽  
Transmission Electron Microscope Study ◽  
Interfacial Dislocations ◽  
And Migration ◽  
Interface Sliding

The instability of interfaces in an ultrafine TiAl-(γ)/Ti3Al-(α2) lamellar structure by straining at room temperature has been investigated using in situ straining techniques performed in a transmission electron microscope. The purpose of this study was to obtain experimental evidence to support the creep mechanisms based upon the interface sliding in association with a cooperative movement of interfacial dislocations, which was proposed previously to rationalize a nearly linear creep behavior of ultrafine lamellar TiAl alloys. The results reveal that the sliding and migration of lamellar interfaces can take place simultaneously as a result of the cooperative movement of interfacial dislocations, which can lead to an adverse effect in the performance of ultrafine lamellar TiAl alloy.

scholarly journals In-Situ Tem Study of Interface Sliding and Migration in an Ultrafine Lamellar Structure

2005 ◽  
Vol 880 ◽  
Author(s):  
Luke L.M. Hsiung ◽  
T.G. Nieh
Keyword(s):  
Lamellar Structure ◽  
In Situ Tem ◽  
Tial Alloys ◽  
Cooperative Movement ◽  
Transmission Electron ◽  
Interfacial Dislocations ◽  
And Migration ◽  
The Stability ◽  
Interface Sliding

AbstractThe stability of interfaces in an ultrafine TiAl-(y)/Ti3Al-(α2) lamellar structure by straining at room temperature has been investigated using in-situ straining techniques performed in a transmission electron microscope. The purpose of this study is to obtain experimental evidence to support the previously proposed creep mechanisms in ultrafine lamellar TiAl alloys based upon the interface sliding in association with a cooperative movement of interfacial dislocations. The results have revealed that both the sliding and migration of lamellar interfaces can take place simultaneously as a result of the cooperative motion of interfacial dislocations.

Transformation of mackinawite to greigite; an in situ X-ray powder diffraction and transmission electron microscope study

1997 ◽  
Vol 82 (3-4) ◽  
pp. 302-309 ◽  
Author(s):  
Alistair R. Lennie ◽  
Simon A. T. Redfern ◽  
Pamela E. Champness ◽  
Chris P. Stoddart ◽  
Paul F. Schofield ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Powder Diffraction ◽  
Transmission Electron Microscope ◽  
Microscope Study ◽  
Electron Microscope Study ◽  
X Ray ◽  
Transmission Electron ◽  
Transmission Electron Microscope Study

Remote On-Line Control of a High-Voltage in situ Transmission Electron Microscope with A Rational User Interface

1996 ◽  
Vol 54 ◽  
pp. 384-385
Author(s):  
M.A. O’Keefe ◽  
J. Taylor ◽  
D. Owen ◽  
B. Crowley ◽  
K.H. Westmacott ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
User Interface ◽  
Transmission Electron Microscope ◽  
High Voltage ◽  
Materials Science ◽  
Transmission Electron ◽  
On Line ◽  
Electron Microscopes

Remote on-line electron microscopy is rapidly becoming more available as improvements continue to be developed in the software and hardware of interfaces and networks. Scanning electron microscopes have been driven remotely across both wide and local area networks. Initial implementations with transmission electron microscopes have targeted unique facilities like an advanced analytical electron microscope, a biological 3-D IVEM and a HVEM capable of in situ materials science applications. As implementations of on-line transmission electron microscopy become more widespread, it is essential that suitable standards be developed and followed. Two such standards have been proposed for a high-level protocol language for on-line access, and we have proposed a rational graphical user interface. The user interface we present here is based on experience gained with a full-function materials science application providing users of the National Center for Electron Microscopy with remote on-line access to a 1.5MeV Kratos EM-1500 in situ high-voltage transmission electron microscope via existing wide area networks. We have developed and implemented, and are continuing to refine, a set of tools, protocols, and interfaces to run the Kratos EM-1500 on-line for collaborative research. Computer tools for capturing and manipulating real-time video signals are integrated into a standardized user interface that may be used for remote access to any transmission electron microscope equipped with a suitable control computer.

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