Chemical solution deposition of lanthanum zirconate barrier layers applied to low-cost coated-conductor fabrication

2004 ◽  
Vol 19 (7) ◽  
pp. 2117-2123 ◽  
Author(s):  
S. Sathyamurthy ◽  
M. Paranthaman ◽  
H.Y. Zhai ◽  
S. Kang ◽  
T. Aytug ◽  
...  
Keyword(s):  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Low Cost ◽  
High Surface ◽  
Sol Gel ◽  
Buffer Layers ◽  
Coated Conductor ◽  
Lanthanum Zirconate ◽  
Barrier Layers

Epitaxial lanthanum zirconate (LZO) buffer layers have been grown by sol-gel processing on Ni–W substrates. We report on the application of these oxide films as seed and barrier layers in coated conductor fabrication as potentially simpler, lower cost coated-conductor architecture. The LZO films, about 80–100-nm thick, were found to have dense, crack-free surfaces with high surface crystallinity. Using 0.2-μm YBCO deposited by pulsed laser deposition, a critical current density of 2 MA/cm2 has been demonstrated on the LZO films (YBCO/LZO/Ni–W). Using 0.8-μm YBCO deposited using metal organic decomposition, a critical current density of 1.7 MA/cm2 and a critical current of 135 A/cm have been demonstrated on the LZO barrier layer with a sputtered CeO2 cap layer (YBCO/CeO2/LZO/Ni–W). These results offer promise to replace several of the vacuum-deposited layers in the typical coated conductor architecture (YBCO/CeO2/YSZ/Y2O3/Ni/Ni-W).

Fabrication of High Jc YBa2Cu3O7-δ Coated Conductors Using Sol-Gel Buffer Layers On Nickel and Nickel Alloy Substrates

2001 ◽  
Vol 689 ◽  
Author(s):  
S. Sathyamurthy ◽  
M. Paranthaman ◽  
B. W. Kang ◽  
H. Y. Zhai ◽  
T. Aytug ◽  
...  
Keyword(s):  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Sol Gel ◽  
Rf Sputtering ◽  
Cube Texture ◽  
Dip Coating ◽  
Coated Conductors ◽  
Buffer Layers ◽  
Ybco Films

Sol-gel processing of La2Zr2O7 (LZO) buffer layers on biaxially textured Ni-3 at.% W alloy substrates using a continuous reel-to-reel dip-coating unit has been studied. The epitaxial LZO films obtained have a strong cube texture and uniform microstructure. The effect of increasing the annealing speed on the texture, microstructure and the carbon content retained in the film were studied. On top of the LZO films, epitaxial layers of Yttria Stabilized Zirconia (YSZ) and Ceria (CeO2) were deposited using rf sputtering, and YBa2Cu3Ox (YBCO) films were then deposited using Pulsed Laser Deposition (PLD). A critical current density (Jc) of 1.9 MA/cm2 at 77K and self-field and 0.34 MA/cm2 at 77K and 0.5T have been obtained on these films. These values are comparable to those obtained on YBCO films deposited on all-vacuum deposited buffer layers, and are the highest ever obtained using solution seed layers. The use of all-solution buffers for coated conductor processing has also been explored. A critical current density of 1.1 MA/cm2 at 77 K and self-field was obtained on YBCO films grown be PLD on LZO buffered nickel substrates.

scholarly journals Influence of Gas Flow and Improvement of Homogeneity on the Distribution of Critical Current Density in YBCO Coated Conductor Processed by TFA-MOD Method

2012 ◽  
Vol 36 ◽  
pp. 1637-1642
Author(s):  
Kei Shiohara ◽  
Kohei Higashikawa ◽  
Teppei Kawaguchi ◽  
Masayoshi Inoue ◽  
Takanobu Kiss ◽  
...  
Keyword(s):  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Gas Flow ◽  
Coated Conductor ◽  
Ybco Coated Conductor

scholarly journals Enhancement of Critical Current Density of Yttrium Barium Copper Oxide Thin Films by Introducing Nano dimensional Cerium Oxide Defects

2018 ◽  
Vol 10 (6) ◽  
pp. 109
Author(s):  
Tochukwu Emeakaroha ◽  
Floyd James ◽  
Abebe Kebede
Keyword(s):  
Thin Films ◽  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
High Temperature Superconductors ◽  
Flux Line ◽  
Buffer Layers ◽  
Line Lattice ◽  
Ceo2 Films ◽  
Magnetic Flux Line

The critical current density, Jc  has been the most important parameter used in the design and engineering of effective devices which is one of the implementation of high temperature superconductors (HTSC). In this work, an effort has been made to further improve the critical current density of YBa2Cu3O7-x (YBCO) thin films by preventing the magnetic flux line lattice against the Lorentz force by pinning it in place with the aid of nano-dimensional defects. These defects were generated by distributing nano sized CeO2 islands after YBCO layer was created on LaAlO3 substrates perpendicular to the film using pulsed laser deposition (PLD) technique. Three samples with buffer layers of CeO2 were prepared. CeO2 with 50 pulses, 100 pulses and 150 pulses, after each 1000 pulses of YBCO were prepared five layers for each of the samples. The structural characterization of YBCO/CeO2 and YBCO pristine films were carried out using x-ray diffraction (XRD) and scanning electron microscopy (SEM). Superconducting proprieties were measured using a vibrating sample magnetometer (VSM). Jc  for the pure YBCO and the YBCO/CeO2 films were calculated from magnetization (M) versus Field (H) loops using Bean’s model. Jc  for the 50 pulses of YBCO/CeO2 films was found to be increased slightly by an order of magnitude of about 40% with respect to those of YBCO films without the nano dimensional defects.

LaNiO3 buffer layers for high critical current density YBa2Cu3O7−δ and Tl2Ba2CaCu2O8−δ films

1999 ◽  
Vol 75 (16) ◽  
pp. 2479-2481 ◽  
Author(s):  
C. M. Carlson ◽  
P. A. Parilla ◽  
M. P. Siegal ◽  
D. S. Ginley ◽  
Y.-T. Wang ◽  
...  
Keyword(s):  
Critical Current Density ◽  
Critical Current ◽  
Current Density ◽  
Buffer Layers ◽  
High Critical Current Density
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