Organic molecular-beam deposition of perylene on Cu(110): Results from near-edge x-ray absorption spectroscopy, x-ray photoelectron spectroscopy, and atomic force microscopy

2004 ◽  
Vol 19 (7) ◽  
pp. 2049-2056 ◽  
Author(s):  
K. Hänel ◽  
S. Söhnchen ◽  
S. Lukas ◽  
G. Beernink ◽  
A. Birkner ◽  
...  

The growth of the polycyclic aromatic hydrocarbon perylene on (110) oriented copper substrates has been studied by means of x-ray photoelectron spectroscopy, near-edge x-ray absorption spectroscopy, and atomic force microscopy. In the monolayer regime, the molecules are orientated with their molecular plane parallel to the substrate, whereas they adopt a tilted arrangement in multilayer films. For multilayers with thicknesses exceeding 10 nm, the molecules grow in a bulk-like structure with their long axes orientated upright to the substrate surface.

Author(s):  
Z. Zhang ◽  
E. S. Yamaguchi ◽  
M. Kasrai ◽  
G. M. Bancroft

The growth and morphology of tribofilms, generated from zinc dialkyldithiophosphate (ZDDP) and an ashless dialkyldithiophosphate (DDP) over a wide range of rubbing times (10 seconds to 10 hours) and concentrations (0.1 to 5 wt % ZDDP), have been examined using atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS), and X-ray absorption near edge structure (XANES) spectroscopy at the O, P and S K-edges, and the P, S, and Fe L-edges. The physical aspects of the growth and morphology of the tribofilms will be presented here (Part I) and the chemistry of the films will be discussed in (Part II).


2001 ◽  
Author(s):  
M. GIRASOLE ◽  
A. CRICENTI ◽  
A. CONGIU-CASTELLANO ◽  
A. MARCONI ◽  
C. DAVOLI ◽  
...  

1998 ◽  
Vol 72 (17) ◽  
pp. 2105-2107 ◽  
Author(s):  
M. M. Garcı́a ◽  
I. Jiménez ◽  
L. Vázquez ◽  
C. Gómez-Aleixandre ◽  
J. M. Albella ◽  
...  

2018 ◽  
Vol 51 (2) ◽  
pp. 246-253
Author(s):  
Dev Raj Chopra ◽  
Justin Seth Pearson ◽  
Darius Durant ◽  
Ritesh Bhakta ◽  
Anil R. Chourasia

2013 ◽  
Vol 28 (2) ◽  
pp. 68-71 ◽  
Author(s):  
Thomas N. Blanton ◽  
Debasis Majumdar

In an effort to study an alternative approach to make graphene from graphene oxide (GO), exposure of GO to high-energy X-ray radiation has been performed. X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and atomic force microscopy (AFM) have been used to characterize GO before and after irradiation. Results indicate that GO exposed to high-energy radiation is converted to an amorphous carbon phase that is conductive.


Sign in / Sign up

Export Citation Format

Share Document