Highly localized acoustic emission monitoring of nanoscale indentation contacts

This study evaluated a novel approach for acoustic emission (AE) monitoring of nanoindentation. The technique utilizes a miniature AE sensor integrated into a calibrated diamond indenter tip on a commercial nanoindentation system. The evaluation focused on the yield -point phenomenon in W (100); MgO (100); and sapphire C (0001); R (1012); A (1210); and M (1010) single-crystal surfaces. The minimum amount of elastic energy release sufficient to produce AE signal detectable with the indenter tip sensor was nearly two orders of magnitude lower than the minimum energy level required for conventional AE sensors. Wave forms detected with the indenter tip sensor were independent of sample size. A linear relationship between released elastic energies and the corresponding AE energies was observed for all three evaluated materials. The scaling coefficient of the linear relationship was independent of indenter tip size/shape and indentation depth. The differences between the mechanisms of the initial stages of plasticity for the various crystallographic orientations of sapphire were reflected in the following aspects of AE activity: detection of a specific type of AE wave form that correlated to the presence of linear surface features near the indentation sites; AE signal associated with the yield point, consisting either of one or two distinct wave forms; and presence or absence of AE signals after the yield point. The possibility of plasticity onset in sapphire involving both slip and twinning is discussed.