The effect of doping Ag on the microstructure of La2/3Sr1/3MnO3 films

2002 ◽  
Vol 17 (10) ◽  
pp. 2712-2719 ◽  
Author(s):  
Q. Zhan ◽  
R. Yu ◽  
L. L. He ◽  
D. X. Li ◽  
J. Li ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Grain Boundaries ◽  
Doping Level ◽  
Analytical Electron Microscopy ◽  
High Resolution Electron Microscopy ◽  
Plan View ◽  
Ag Doping ◽  
Low Field ◽  
Resolution Electron ◽  
Magnetic Spin

The microstructure of Ag-doped La2/3Sr1/3MnO3 (LSMO) thin films deposited on (001) LaAlO3 single-crystal substrates was systematically investigated in cross section and plan view by high-resolution electron microscopy and analytical electron microscopy. The results showed that the films deposited at 750 °C were perfectly epitaxial with or without Ag-doping. No Ag in the doped film was detected. On the other hand, the LSMO films deposited at 400 °C were less perfect. With increasing Ag-doping level, the shape of LSMO grains became irregular, and the grain size increased gradually. Large polycrystalline clusters consisting of LSMO, AgO, and Ag grains formed in the doped films, and the amount and size of them increased with increasing Ag-doping level. Ag existed at the LSMO grain boundaries in its elemental state. A growth process for the LSMO-Ag system is discussed based on the experimental results. The enhancement of the magnetic spin disorders at the grain boundaries and interfaces caused by doping Ag could result in an improvement of low-field magnetoresistance.

Interface structures in polycrystalline ceramic materials

1986 ◽  
Vol 44 ◽  
pp. 468-471
Author(s):  
K. J. Morrissey
Keyword(s):  
Electron Microscopy ◽  
Analytical Electron Microscopy ◽  
Physical And Mechanical Properties ◽  
High Resolution Electron Microscopy ◽  
Ceramic Materials ◽  
Polycrystalline Materials ◽  
Transmission Electron ◽  
Resolution Electron ◽  
Interface Structures

Grain boundaries and interfaces play an important role in determining both physical and mechanical properties of polycrystalline materials. To understand how the structure of interfaces can be controlled to optimize properties, it is necessary to understand and be able to predict their crystal chemistry. Transmission electron microscopy (TEM), analytical electron microscopy (AEM,), and high resolution electron microscopy (HREM) are essential tools for the characterization of the different types of interfaces which exist in ceramic systems. The purpose of this paper is to illustrate some specific areas in which understanding interface structure is important. Interfaces in sintered bodies, materials produced through phase transformation and electronic packaging are discussed.

High-resolution electron microscopy of nanostructured materials

1995 ◽  
Vol 53 ◽  
pp. 172-173
Author(s):  
M. José-Yacamán
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Grain Boundaries ◽  
Nanostructured Materials ◽  
High Resolution Electron Microscopy ◽  
Hrem Image ◽  
Small Particles ◽  
Resolution Electron ◽  
Nanophase Materials

Electron microscopy is a fundamental tool in materials characterization. In the case of nanostructured materials we are looking for features with a size in the nanometer range. Therefore often the conventional TEM techniques are not enough for characterization of nanophases. High Resolution Electron Microscopy (HREM), is a key technique in order to characterize those materials with a resolution of ~ 1.7A. High resolution studies of metallic nanostructured materials has been also reported in the literature. It is concluded that boundaries in nanophase materials are similar in structure to the regular grain boundaries. That work therefore did not confirm the early hipothesis on the field that grain boundaries in nanostructured materials have a special behavior. We will show in this paper that by a combination of HREM image processing, and image calculations, it is possible to prove that small particles and coalesced grains have a significant surface roughness, as well as large internal strain.

scholarly journals Analysis of Stresses and Strains around Dislocations at Grain Boundaries by Quantitative High-Resolution Electron Microscopy

2006 ◽  
Vol 12 (S02) ◽  
pp. 894-895
Author(s):  
M Hytch ◽  
J-L Putaux ◽  
J Thibault
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Grain Boundaries ◽  
High Resolution Electron Microscopy ◽  
Resolution Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Structure, Composition and Stability of Heterophase Boundaries

1997 ◽  
Vol 3 (S2) ◽  
pp. 673-674
Author(s):  
M. Rühle ◽  
T. Wagner ◽  
S. Bernath ◽  
J. Plitzko ◽  
C. Scheu ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Elevated Temperatures ◽  
Analytical Electron Microscopy ◽  
High Resolution Electron Microscopy ◽  
Advanced Materials ◽  
Bulk Crystals ◽  
Transmission Electron ◽  
Resolution Electron ◽  
The Stability

Heterophase boundaries play an important role in advanced materials since those materials often comprise different components. The properties of the materials depend strongly on the properties of the interface between the components. Thus, it is important to investigate the stability of the microstructure with respect to annealing at elevated temperatures. In this paper results will be presented on the structure and composition of the interfaces between Cu and (α -Al2O3. The interfaces were processed either by growing a thin Cu overlayer on α- Al2O3 in a molecular beam epitaxy (MBE) system or by diffusion bonding bulk crystals of the two constituents in an UHV chamber. To improve the adhesion of Cu to α -Al2O3 ultrathin Ti interlayers were deposited between Cu and α - Al2O3.Interfaces were characterized by different transmission electron microscopy (TEM) techniques. Quantitative high-resolution electron microscopy (QHRTEM) allows the determination of the structure (coordinates of atoms) while analytical electron microscopy (AEM) allows the determination of the composition with high spatial resolution.

High Resolution Electron Microscopy of Grain Boundaries in Sintered Fe77Nd15B8Permanent Magnets

1985 ◽  
Vol 24 (Part 2, No. 1) ◽  
pp. L30-L32 ◽  
Author(s):  
Kenji Hiraga ◽  
Makoto Hirabayashi ◽  
Masato Sagawa ◽  
Yutaka Matsuura
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Grain Boundaries ◽  
High Resolution Electron Microscopy ◽  
Resolution Electron

An investigation of grain boundaries in submicrometer-grained Al-Mg solid solution alloys using high-resolution electron microscopy

1996 ◽  
Vol 11 (8) ◽  
pp. 1880-1890 ◽  
Author(s):  
Zenji Horita ◽  
David J. Smith ◽  
Minoru Furukawa ◽  
Minoru Nemoto ◽  
Ruslan Z. Valiev ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Solid Solution ◽  
High Resolution ◽  
Grain Boundaries ◽  
Boundary Migration ◽  
Boundary Energy ◽  
High Resolution Electron Microscopy ◽  
High Energy ◽  
Structural Features ◽  
Resolution Electron

High-resolution electron microscopy was used to examine the structural features of grain boundaries in Al–1.5% Mg and Al–3% Mg solid solution alloys produced with submicrometer grain sizes using an intense plastic straining technique. The grain boundaries were mostly curved or wavy along their length, and some portions were corrugated with regular or irregular arrangements of facets and steps. During exposure to high-energy electrons, grain boundary migration occurred to reduce the number of facets and thus to reduce the total boundary energy. The observed features demonstrate conclusively that the grain boundaries in these submicrometer-grained materials are in a high-energy nonequilibrium configuration.

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