Simulation of sub-micron indentation tests with spherical and Berkovich indenters
2001 ◽
Vol 16
(7)
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pp. 2149-2157
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Keyword(s):
The present work is concerned with the methods of simulation of data obtained from depth-sensing submicron indentation testing. Details of analysis methods for both spherical and Berkovich indenters using multiple or single unload points are presented followed by a detailed treatment of a method for simulating an experimental load–displacement response where the material properties such as elastic modulus and hardness are given as inputs. A comparison between simulated and experimental data is given.
1996 ◽
Vol 11
(9)
◽
pp. 2358-2367
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2001 ◽
Vol 16
(6)
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pp. 1579-1584
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Keyword(s):
2001 ◽
Vol 16
(6)
◽
pp. 1660-1667
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Keyword(s):
2009 ◽
Vol 01
(01)
◽
pp. 61-84
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2014 ◽
Vol 606
◽
pp. 197-200
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Keyword(s):
Keyword(s):
2013 ◽
Vol 29
(3)
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pp. 292-302
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1998 ◽
Vol 13
(4)
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pp. 1049-1058
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2011 ◽
Vol 70
◽
pp. 219-224
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