Modulation of carbon nanotube yield and type through the collective effects of initially deposited catalyst amount and MgO underlayer annealing temperature

MRS Advances ◽  
2018 ◽  
Vol 4 (3-4) ◽  
pp. 139-146
Author(s):  
Takashi Tsuji ◽  
Guohai Chen ◽  
Kenji Hata ◽  
Don N. Futaba ◽  
Shunsuke Sakurai
Keyword(s):  
Carbon Nanotube ◽  
Annealing Temperature ◽  
Catalyst Surface ◽  
Catalyst System ◽  
Forest Growth ◽  
Collective Effects ◽  
High Yield ◽  
Force Microscopy ◽  
Atomic Force ◽  
Fe Catalysts

ABSTRACTRecently, the millimetre-scale, highly efficient growth of single-wall carbon nanotube (SWCNT) forests from iron (Fe) catalysts has been reported through the annealing of the magnesia (MgO) underlayer. Here, we report the modulation of the CNT yield (height) and average number of CNT walls for a Fe/MgO catalyst system through the collective effects of initial Fe amount and MgO annealing temperature. Our results revealed the existence of a well-defined region for high yield SWCNT forest growth in the domain of deposited Fe thickness and MgO annealing temperature. Through topographic examinations of the catalyst surface using atomic force microscopy, we confirmed that our results stem from the collective effects of increased amounts of surface-bound Fe through the amount of deposition and suppression of Fe subsurface diffusion, together govern the amount of surface-bound catalyst. The combination of these mechanisms determined the final nanoparticle size, density, and stability and could explain the three distinctly defined regions: low yield SWCNT growth, high yield SWCNT growth, and high yield multiwall CNT growth. Furthermore, we explained the observed borders between these three regions.

Development of Ge Nanoparticles Embedded in GeO2 Matrix

2008 ◽  
Vol 8 (8) ◽  
pp. 4081-4085 ◽  
Author(s):  
Y. Batra ◽  
D. Kabiraj ◽  
D. Kanjilal
Keyword(s):  
Electron Microscopy ◽  
Annealing Temperature ◽  
Spectroscopic Studies ◽  
Electron Beam Evaporation ◽  
Granular Structure ◽  
Raman Analysis ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Ge Nanocrystals

Germanium (Ge) nanoparticles have attracted a lot of attention due to their excellent optical properties. In this paper, we report on the formation of Ge nanoparticles embedded in GeO2 matrix prepared by electron beam evaporation and subsequent annealing. Transmission electron microscopy (TEM) studies clearly indicate the formation of Ge nanocrystals in the films annealed at 500 °C. Fourier transform infrared (FTIR) spectroscopic studies are carried out to verify the evolution of the structure after annealingat each stage. Micro-Raman analysis also confirms the formation of Ge nanoparticles in the annealed films. Development of Ge nanoparticles is also established by photoluminescence (PL) analysis. Surface morphology study is carried out by atomic force microscopy (AFM). It shows the evolution of granular structure of the films with increasing annealing temperature.

Electrical tomography using atomic force microscopy and its application towards carbon nanotube-based interconnects

2012 ◽  
Vol 23 (30) ◽  
pp. 305707 ◽  
Author(s):  
A Schulze ◽  
T Hantschel ◽  
A Dathe ◽  
P Eyben ◽  
X Ke ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Electrical Tomography ◽  
Force Microscopy ◽  
Atomic Force

Millimetre-scale growth of single-wall carbon nanotube forests using an aluminium nitride catalyst underlayer

MRS Advances ◽  
2019 ◽  
Vol 4 (3-4) ◽  
pp. 177-183
Author(s):  
Takashi Tsuji ◽  
Naoyuki Matsumoto ◽  
Hirokazu Takai ◽  
Shunsuke Sakurai ◽  
Don N. Futaba
Keyword(s):  
Carbon Nanotube ◽  
Photoelectron Spectroscopy ◽  
High Efficiency ◽  
Ostwald Ripening ◽  
Average Diameter ◽  
Aluminium Nitride ◽  
High Yield ◽  
Force Microscopy ◽  
Transmission Electron ◽  
Carbon Nanotube Forests

ABSTRACTWe have demonstrated the high yield (∼900 μm) and highly single-wall selective (>95%) growth of carbon nanotube (CNT) forest using aluminium nitride (AlN) as a catalyst underlayer. Such high efficiency and single-wall selectivity have not been previously reported using this underlayer system. Evaluation with transmission electron microscopy showed that the average diameter of the grown carbon nanotubes was ∼3.0 nm, which is similar to those grown on alumina underlayers. In addition, characterization of the catalyst/underlayer system using atomic force microscopy and X-ray photoelectron spectroscopy suggests that neither Ostwald ripening along the surface nor catalyst subsurface diffusion into the AlN underlayer are severely occurring at the growth temperature, leading to the creation of the stable and dense small nanoparticle array to achieve an efficient growth of single-wall CNTs.

The Attachment of Carbon Nanotube on a Blunt AFM Tip Using Electric Fields

2004 ◽  
Author(s):  
Hyung Woo Lee ◽  
Soon Geun Kwon ◽  
Soo Hyun Kim ◽  
Yoon Keun Kwak ◽  
Chang Soo Han
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Electric Fields ◽  
Low Cost ◽  
Reliable Technique ◽  
Force Microscopy ◽  
Atomic Force

We report a simple, low cost, reliable technique of making carbon nanotube (CNT) modified atomic force microscopy (AFM) tip. We used the dielectrophoresis and the electrophoresis to align and deposit carbon nanotubes on the end of the AFM tip. From the simulation and the various experiments, we obtained the optimal electric condition, 0.32Vpp/μm. Also, we found that the blunt shape of the tip’s apex is more effective than sharpened one. Through the experiments, we verified that the blunt shape is more effective over 50% than the sharpened one in the attachment of CNTs. By comparing the scanning results between the CNT modified tip and a normal AFM tip, we obtained the improvement in efficiency of 23%.

Frequency Response of Carbon Nanotube Probes during Tapping Mode of Atomic Force Microscopy

2013 ◽  
Vol 378 ◽  
pp. 466-471
Author(s):  
Po Jen Shih ◽  
Shang Hao Cai
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Atomic Force Microscope ◽  
Frequency Response ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Frequency Responses ◽  
Atomic Force ◽  
Frequency Drop ◽  
Atomic Force Microscope Measurement

The dynamic behaviors of carbon nanotube probes applied in Atomic Force Microscope measurement are of interest in advanced nanoscalar topography. In this paper, we developed the characteristic equations and applied the model analysis to solve the eigenvalues of the microcantilever and the carbon nanotube. The eigenvalues were then used in the tapping mode system to predict the frequency responses against the tip-sample separations. It was found that the frequency drop steeply if the separation was less than certain distances. This instability of frequency is deduced from the jump of microcantilever or the jump of the carbon nanotube. Various lengths and binding angles of the carbon nanotube were considered, and the results indicated that the binding angle dominated the frequency responses and jumps.

Atomic Force Microscopy Studies of DNA-Wrapped Carbon Nanotube Structure and Binding to Quantum Dots

2008 ◽  
Vol 130 (32) ◽  
pp. 10648-10655 ◽  
Author(s):  
Jennifer F. Campbell ◽  
Ingrid Tessmer ◽  
H. Holden Thorp ◽  
Dorothy A. Erie
Keyword(s):  
Quantum Dots ◽  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Force Microscopy ◽  
Atomic Force

Dispersibility of Carbon Nanotubes

2007 ◽  
Vol 537-538 ◽  
pp. 161-168 ◽  
Author(s):  
T. Gábor ◽  
D. Aranyi ◽  
Katalin Papp ◽  
F.H. Kármán ◽  
Erika Kálmán
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Polymer Composites ◽  
Ionic Surfactant ◽  
Geometrical Parameters ◽  
Stable Carbon ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dispersion Agent

Availability of a stable carbon nanotube suspension is a prerequisite for production of polymer composites with carbon nanotube as additives. In this work nanotube suspensions, which have been prepared from various nanotubes in different dispersion agents, were compared. Dispersibility of the samples was investigated by scanning electon microscopy and atomic force microscopy. Solution of a non-ionic surfactant was also used successfully as a new dispersion agent. Geometrical parameters of the carbon nanotubes were determined by using atomic force microscopy. Correlation was found between the dispersibility and the parameters of the nanotubes and relative permittivity of the different solvents.

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