Self-Cleaning and Controlled Adhesion of Gecko Feet and Their Bioinspired Micromanipulators

MRS Advances ◽  
2018 ◽  
Vol 3 (29) ◽  
pp. 1641-1646
Author(s):  
Yiyang Wan ◽  
Zhenhai Xia
Keyword(s):  
Atomic Force Microscope ◽  
Glass Substrate ◽  
Nano Particles ◽  
Potential Solution ◽  
Substrate Interface ◽  
Substrate Adhesion ◽  
Atomic Force ◽  
Self Cleaning ◽  
Gecko Feet

ABSTRACTBioinspired micromanipulators have been made based on gecko dynamic self-cleaning mechanism. Various particles such as spherical SiO2/polystyrene, and short fibrous glass can be captured, transmitted and dropped on glass substrate with precisely predesigned patterns, by using the micromanipulator with the help of atomic force microscope (AFM). It has been demonstrated that particle-pad interface and particle-substrate interface exhibit diverse adhesion behaviors under different z-piezo retracting speed. The particle-substrate adhesion increases faster than the particle-pad adhesion with increasing the detaching velocity, which makes it possible to manipulate the particles by adjusting the retreating speed only. Probability tests was performed to better choose suitable parameters for picking and dropping operations. This work provides a potential solution to manipulation of micro/nano particles for precise assembly.

Production of Transparent Heat Windows of TiO2/Ag/TiO2, and Investigation of their Nanostructures

2011 ◽  
Vol 110-116 ◽  
pp. 3856-3859
Author(s):  
Mohammad Reza Behforooz ◽  
Haleh Kangarloo
Keyword(s):  
Atomic Force Microscope ◽  
Glass Substrate ◽  
Silver Film ◽  
High Vacuum ◽  
Vertical Deposition ◽  
Spectrophotometric Methods ◽  
Atomic Force ◽  
Least Energy ◽  
Deposition Angle ◽  
Deposition Conditions

Using the resistive heated method, TiO2/Ag/TiO2thin files (Transparent heat windows) in vertical deposition angle were deposited on SiO2substrate, in high vacuum (HV) condition and 100°c. The thickness of TiO2on glass substrate was 50°A, Silver film 125°A and 225°A and the upper layer TiO2with 115°A. All other deposition conditions were same for both samples .Atomic force microscope (AFM), and spectrophotometric methods were used to study the nanostructures of these samples in the range of FTIR. The purpose of this work is to find and produce the structure with the least energy waste.

Robust Integral of NN and Error Sign Control for Nanomanipulation Using AFM

2014 ◽  
pp. 641-652
Author(s):  
Qinmin Yang ◽  
Jiangang Lu
Keyword(s):  
Neural Network ◽  
Stability Analysis ◽  
Atomic Force Microscope ◽  
Nano Particles ◽  
Tracking Performance ◽  
Feedback Signal ◽  
Roughness Effect ◽  
Atomic Force ◽  
Applied Forces ◽  
Control Methodology

This paper presents a novel control methodology for automatically manipulating nano particles on the substrate by using Atomic Force Microscope (AFM). The interactive forces and dynamics between the tip, particle and substrate are modeled and analyzed including the roughness effect of the substrate. Further, the control signal is designed to consist of the robust integral of a neural network (NN) output plus the sign of the error feedback signal multiplied with an adaptive gain. Using the NN-based adaptive force controller, the task of pushing nano particles is demonstrated in simulation environment. Finally, the asymptotical tracking performance of the closed-loop system, boundedness of the NN weight estimates and applied forces are shown by using the Lyapunov-based stability analysis.

Preparation and Tribological Behavior of PAH/PAA Molecular Deposition Films

2005 ◽  
Author(s):  
Deguo Wang ◽  
Xuexin Yu ◽  
Siwei Zhang ◽  
Dapeng Feng
Keyword(s):  
Atomic Force Microscope ◽  
Friction Force ◽  
Glass Substrate ◽  
Tribological Behavior ◽  
Lateral Force ◽  
Atomic Force ◽  
Number Of Layers ◽  
In The Beginning ◽  
Deposition Technology ◽  
Increasing Load

PAH/PAA polymer multilayer ultrathin film was prepared by molecular deposition technology. The morphology and nano-tribological behaviors of the film were investigated by using atomic force microscope (AFM). It has been found that the friction force of the PAH/PAA polymer molecular deposition film is obviously less then that of the glass substrate, and the friction force increased with increasing load. However, the friction force decreased in the beginning and increased in the sequel with increase in the number of layers, which might be attributed to the change of surface topography with different layers. Moreover, it was found that the profile of both topography and lateral force has good coherence by analyzing the AFM images.

Tip Based Nano Manipulation Through Successive Directional Push

2010 ◽  
Author(s):  
Wei Zhao ◽  
Kangmin Xu ◽  
Xiaoping Qian ◽  
Rong Wang
Keyword(s):  
Atomic Force Microscope ◽  
Target Position ◽  
Forward Direction ◽  
Nano Particles ◽  
Base Line ◽  
Precise Information ◽  
Atomic Force ◽  
Novel Method ◽  
Parallel Scan ◽  
Line Direction

Nano manipulation refers to the process of transporting nanoscale components. It has found applications in nano device prototyping and biomolecular and cellular investigation. In this paper, we present an atomic force microscope (AFM) based approach for automated manipulation of nano particles to form designed patterns. The automated manipulation is based on a novel method, successive directional push. This method keeps pushing along a fixed forward direction until the particle reaches the baseline of the target position, and it then repeats the pushing process along the base line direction. This process is iterated until the particle reaches its target position. By examining the topography of several local parallel scan lines, this method can determine the lateral coordinate of the particle. The novelty of this method lies in the fact that further pushing along the same pushing direction can be conducted without precise information about the forward position. The successive directional push method has been successfully implemented into an AFM system. We demonstrate that complex designed patterns including over one hundred latex particles of 50 nm diameter can be fabricated with this method.

scholarly journals An Investigation of the Adsorption of Xanthate on Bornite in Aqueous Solutions using an Atomic Force Microscope

Minerals ◽  
2021 ◽  
Vol 11 (8) ◽  
pp. 906
Author(s):  
Jinhong Zhang
Keyword(s):  
Aqueous Solutions ◽  
Atomic Force Microscope ◽  
Force Measurement ◽  
Attenuated Total Reflection ◽  
Solution Ph ◽  
Substrate Adhesion ◽  
Atomic Force ◽  
Measurement Results ◽  
Industry Practice

An atomic force microscope (AFM) was applied to study of the adsorption of xanthate on bornite surfaces in situ in aqueous solutions. AFM images showed that xanthate, i.e., potassium ethyl xanthate (KEX) and potassium amyl xanthate (PAX), adsorbed strongly on bornite, and the adsorbate bound strongly with the mineral surface without being removed by flushing with ethanol alcohol. The AFM images also showed that the adsorption increased with the increased collector concentration and contact time. Xanthate adsorbed on bornite in a similar manner when the solution pH changed to pH 10. The AFM force measurement results showed that the probe–substrate adhesion increased due to the adsorption of xanthate on bornite. The sharp “jump-in” and “jump-off” points on force curve suggest that the adsorbate is not “soft” in nature, ruling out the existence of dixanthogen, an oily substance. Finally, the ATR-FTIR (attenuated total reflection-Fourier-transform infrared) result confirms that the adsorbate on bornite in xanthate solutions is mainly in the form of insoluble cuprous xanthate (CuX) instead of dixanthogen. This xanthate/bornite adsorption mechanism is very similar to what is obtained with the xanthate/chalcocite system, while it is different from the xanthate/chalcopyrite system, for which oily dixanthogen is the main adsorption product on the chalcopyrite surface. The present study helps clarify the flotation mechanism of bornite in industry practice using xanthate as a collector.

Experimental Manipulation of Gold Nano-Particles by Atomic Force Microscope and Investigating Effect of Various Working Parameters

2013 ◽  
Vol 829 ◽  
pp. 831-835
Author(s):  
Seyed Abbas Shahmoradi Zavareh ◽  
Hamid Akbari Moayyer ◽  
Mohammad Amin Ahouei
Keyword(s):  
Experimental Study ◽  
Atomic Force Microscope ◽  
Scanning Speed ◽  
Experimental Manipulation ◽  
Nano Particles ◽  
Mica Surface ◽  
Contact Mode ◽  
Atomic Force ◽  
Gold Nano Particles ◽  
Working Parameters

Due to involvement of various fields of engineering and bio researchers in nanoprojects and their need in achieving certain layout of nanoparticles (NPs) in many research studies, considerable attention is paid to nanomanipulation nowadays. The present experimental study employs Atomic Force Microscope (AFM) in order to push gold nanoparticles on a highly flat mica surface. A silicon probe in contact mode is used to both image and manipulate nanoparticles and Topo and L-R images have been obtained to show the successes of manipulation when proper conditions are fulfilled. The effect of AFM parameters such as applied force, scanning speed and number of pixels of image on nanomanipulation efficiency is investigated. Moreover, the tip is moved along a special path which can be set by software to study manipulation of nanoparticles aggregates. Finally, possible applications of nanomanipulation in nanomechanics, nanoelectronics, nanomaterials and bio-technology are reported and further experimental research works on nanomanipulation are proposed.

The Characterization of TiO2 Films Prepared by Pyrolysis

2012 ◽  
Vol 476-478 ◽  
pp. 2407-2410
Author(s):  
Xiao Tian Hu ◽  
Bing Xie ◽  
Shao Hua Zhang
Keyword(s):  
Thin Films ◽  
Surface Morphology ◽  
Atomic Force Microscope ◽  
Glass Substrate ◽  
X Ray ◽  
Atomic Force

Preparation of TiO2 thin films by pyrolysis was investigated. Butyl titanate and ACAC were dispersed in ethanol solvent, then transferring the whole solution on the glass substrate and getting TiO2 films by vaporizing and decomposing the chelating butyl titanate at a certain temperature. The surface morphology of the prepared TiO2 films was characterized by X-ray diffractometer (XRD) and atomic force microscope (AFM), showing the influences on the surface morphology at different preparation temperatures and chelant amount.

Characterization of photosystem II with the atomic-force microscope

1992 ◽  
Vol 50 (2) ◽  
pp. 1146-1147
Author(s):  
Kathleen M. Marr ◽  
Mary K. Lyon
Keyword(s):  
Photosystem Ii ◽  
Atomic Force Microscope ◽  
Three Dimensional ◽  
Biologically Active ◽  
Atomic Force ◽  
Freeze Etching ◽  
Image Averaging ◽  
Oxygen Evolving ◽  
Averaging Techniques

Photosystem II (PSII) is different from all other reaction centers in that it splits water to evolve oxygen and hydrogen ions. This unique ability to evolve oxygen is partly due to three oxygen evolving polypeptides (OEPs) associated with the PSII complex. Freeze etching on grana derived insideout membranes revealed that the OEPs contribute to the observed tetrameric nature of the PSIl particle; when the OEPs are removed, a distinct dimer emerges. Thus, the surface of the PSII complex changes dramatically upon removal of these polypeptides. The atomic force microscope (AFM) is ideal for examining surface topography. The instrument provides a topographical view of individual PSII complexes, giving relatively high resolution three-dimensional information without image averaging techniques. In addition, the use of a fluid cell allows a biologically active sample to be maintained under fully hydrated and physiologically buffered conditions. The OEPs associated with PSII may be sequentially removed, thereby changing the surface of the complex by one polypeptide at a time.

Imaging polymers, proteins and dna in aqueous solutions with the atomic force microscope

1989 ◽  
Vol 47 ◽  
pp. 32-33
Author(s):  
S.A.C. Gould ◽  
B. Drake ◽  
C.B. Prater ◽  
A.L. Weisenhorn ◽  
S.M. Lindsay ◽  
...  
Keyword(s):  
Amino Acids ◽  
Dna Sequencing ◽  
Aqueous Solutions ◽  
Atomic Force Microscope ◽  
Piezoelectric Crystal ◽  
Atomic Force ◽  
Structure Of Molecules ◽  
Optical Lever

The atomic force microscope (AFM) is an instrument that can be used to image many samples of interest in biology and medicine. Images of polymerized amino acids, polyalanine and polyphenylalanine demonstrate the potential of the AFM for revealing the structure of molecules. Images of the protein fibrinogen which agree with TEM images demonstrate that the AFM can provide topographical data on larger molecules. Finally, images of DNA suggest the AFM may soon provide an easier and faster technique for DNA sequencing.The AFM consists of a microfabricated SiO2 triangular shaped cantilever with a diamond tip affixed at the elbow to act as a probe. The sample is mounted on a electronically driven piezoelectric crystal. It is then placed in contact with the tip and scanned. The topography of the surface causes minute deflections in the 100 μm long cantilever which are detected using an optical lever.

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