Growth Control of Twin InSb/GaAs Nano-Stripes by Molecular Beam Epitaxy

MRS Advances ◽  
2017 ◽  
Vol 2 (51) ◽  
pp. 2943-2949 ◽  
Author(s):  
Phisut Narabadeesuphakorn ◽  
Jirayu Supasil ◽  
Supachok Thainoi ◽  
Aniwat Tandaechanurat ◽  
Suwit Kiravittaya ◽  
...  
Keyword(s):  
Molecular Beam Epitaxy ◽  
Growth Mechanism ◽  
Growth Temperature ◽  
Molecular Beam ◽  
Lattice Mismatch ◽  
High Energy ◽  
Band Alignment ◽  
Type I ◽  
Growth Duration ◽  
Quantum Nanostructures

ABSTRACTInSb has been considered as a promising material for spintronic applications owing to its pronounced spin effects as a result of large intrinsic electronic g-factor. In addition, embedding InSb quantum nanostructures in a GaAs matrix could create type-II band alignment, where radiation lifetimes are longer than those of the typical type-I systems. Such characteristics are promising for memory devices and infrared photonic applications. The growth of InSb/GaAs quantum nanostructures by strain driven mechanism using molecular beam epitaxy with low growth temperature, slow growth rate, Sb soaking process prior to In deposition, and small amount of In deposition typically creates a mixture of twin and single nano-stripe structures with truncated pyramid shape. In this work, we further investigate the growth mechanism of such twin InSb/GaAs nano-stripes by controlling the growth conditions, consisting of nanostructure growth duration and growth temperature. When the growth temperature is kept to less than 300°C and In deposition is set to only a few monolayers, we found that 25-40% of formed nanostructures are twin InSb/GaAs nano-stripes. However, when the In deposition is stopped immediately after the spotty reflection high-energy electron diffraction patterns are observed, the ratio of twin nano-stripes to single ones is increased to 50-60%. We therefore describe the growth mechanism of twin nano-stripes as the early state of single nano-stripe formation, where the twin nano-stripes are initially formed during the first monolayer of InSb formation as a result of large lattice mismatch of 14.6%. When In deposition is increased to a few monolayers, the gap between twin nano-stripes is filled up and consequently forms the single nano-stripes instead. With this particular twin nano-stripe growth mechanism, the preservation of high ratio of twin nano-stripe formation can be expected by further reducing the growth temperature, i.e. less than 260°C. These twin nano-stripes may find applications in the fields of spintronics and novel interference nano-devices.

Photovoltaic effect of ferroelectric Pb(Zr0.52,Ti0.48)O3 deposited on SrTiO3 buffered n-GaAs by laser molecular beam epitaxy

2017 ◽  
Vol 10 (04) ◽  
pp. 1750036 ◽  
Author(s):  
Yunxia Zhou ◽  
Jun Zhu ◽  
Xingpeng Liu ◽  
Zhipeng Wu
Keyword(s):  
Thin Film ◽  
Molecular Beam Epitaxy ◽  
Buffer Layer ◽  
Molecular Beam ◽  
Lattice Mismatch ◽  
Photovoltaic Effect ◽  
Short Circuit ◽  
High Energy ◽  
Text Type ◽  
Laser Molecular Beam Epitaxy

Ferroelectric Pb(Zr[Formula: see text],Ti[Formula: see text]O3(PZT) thin film was grown on [Formula: see text]-type GaAs (001) substrate with SrTiO3 (STO) buffer layer by laser molecular beam epitaxy (L-MBE). The epitaxial process of the STO was in situ monitored by reflection high-energy electron diffraction (RHEED). The crystallographical growth orientation relationship was revealed to be (002) [Formula: see text] PZT//(002) [Formula: see text] STO//(001) [Formula: see text] GaAs by RHEED and X-ray diffraction (XRD). It was found that a small lattice mismatch between PZT and GaAs with a 45[Formula: see text] in-plane rotation relationship can be formed by inserting of a buffer layer STO. Besides, the enhanced electrical properties of the heterostructure were obtained with the short-circuit photocurrent increased to 52[Formula: see text]mA/cm2 and the better power conversation efficiency increased by 20% under AM1.5[Formula: see text]G (100[Formula: see text]mW/cm[Formula: see text] illumination. The work could provide a way for the application of this kind of heterostructure with high photocurrent response in optoelectronic thin film devices.

Growth and Characterization of InxGa1−xP(x≤0.38) on GaP(1OO) with a Linearly Graded Buffer Layer by Gas-Source Molecular Beam Epitaxy

1992 ◽  
Vol 281 ◽  
Author(s):  
T. P. Chin ◽  
J. C. P. Chang ◽  
K. L. Kavanagh ◽  
C. W. Tu ◽  
P. D. Kirchner ◽  
...  
Keyword(s):  
Molecular Beam Epitaxy ◽  
Buffer Layer ◽  
Molecular Beam ◽  
Lattice Mismatch ◽  
High Energy ◽  
Threading Dislocation ◽  
Dislocation Loops ◽  
Double Crystal ◽  
X Ray ◽  
Gas Source

ABSTRACTInxGa1−xP(x>0.27) grown on a GaP substrate has a large direct-bandgap, which is suitable for yellow light emission on a transparent substrate. Because of the large lattice mismatch, usually a thick (10–20 μm) graded buffer layer was required to reduce the threading dislocation density. In this work we report that a thin (1.2 μm for x≃0.35), linearly graded buffer layer can filter out dislocations effectively. The structures were grown by gas-source molecular beam epitaxy. Reflection high-energy electron diffraction (RHEED) intensity oscillations and X-ray double-crystal diffraction were used to control and determine the composition, respectively. Threading dislocations are well confined in the buffer layer, as shown under transmission electron microscopy. Dislocation loops injected into the substrate were observed, similar to those observed in the Six Ge1−x/Si system. X-ray analysis also shows that the 3% mismatched buffer layer is fully relaxed. This relaxed buffer layer then can serve as a substrate for further growth. Homojunction and heterojunction light emitting diodes were fabricated to demonstrate the material quality.

GaN Epitaxial Growth Process at High Growth Temperature by NH3 Source Molecular Beam Epitaxy

2003 ◽  
Vol 798 ◽  
Author(s):  
Naoki Ohshima ◽  
Akihiro Sugihara ◽  
Naoya Yoshida ◽  
Naohiko Okabe
Keyword(s):  
Molecular Beam Epitaxy ◽  
Epitaxial Layer ◽  
Growth Temperature ◽  
Molecular Beam ◽  
High Growth ◽  
High Energy ◽  
Force Microscopy ◽  
Gas Source ◽  
Atomic Force ◽  
Surface Morphologies

ABSTRACTWe have investigated in detail dependence of annealing GaN buffer layer and GaN growth processes on a sapphire substrate at a high temperature of 1000 degree C. The GaN layers are grown by NH3 gas source molecular beam epitaxy. The behavior of GaN buffer and epitaxial layer has been observed by in-situ reflection high-energy electron diffraction and the surface morphologies of as-grown and chemically etched GaN layers by atomic force microscopy. It is found that there is distinct difference in the surface morphology of epitaxial GaN layer between at growth temperatures of below 950 degree C and that of 1000 degree C. It has been considered that the growth kinetics of GaN epitaxial layer extremely depends on the growth temperature.

Optical and structural prorerties of InAs epilayer on graded InGaAs

2001 ◽  
Vol 696 ◽  
Author(s):  
Gu Hyun Kim ◽  
Jung Bum Choi ◽  
Joo In Lee ◽  
Se-Kyung Kang ◽  
Seung Il Ban ◽  
...  
Keyword(s):  
Molecular Beam Epitaxy ◽  
Residual Strain ◽  
Molecular Beam ◽  
Lattice Mismatch ◽  
Peak Position ◽  
Excitation Intensity ◽  
Total Thickness ◽  
Ingaas Layer ◽  
X Ray Diffraction ◽  
X Ray

AbstractWe have studied infrared photoluminescence (PL) and x-ray diffraction (XRD) of 400 nm and 1500 nm thick InAs epilayers on GaAs, and 4 nm thick InAs on graded InGaAs layer with total thickness of 300 nm grown by molecular beam epitaxy. The PL peak positions of 400 nm, 1500 nm and 4 nm InAs epilayer measured at 10 K are blue-shifted from that of InAs bulk by 6.5, 4.5, and 6 meV, respectively, which can be largely explained by the residual strain in the epilayer. The residual strain caused by the lattice mismatch between InAs and GaAs or graded InGaAs/GaAs was observed from XRD measurements. While the PL peak position of 400 nm thick InAs layer is linearly shifted toward higher energy with increase in excitation intensity ranging from 10 to 140 mW, those of 4 nm InAs epilayer on InGaAs and 1500 nm InAs layer on GaAs is gradually blue-shifted and then, saturated above a power of 75 mW. These results suggest that adopting a graded InGaAs layer between InAs and GaAs can efficiently reduce the strain due to lattice mismatch in the structure of InAs/GaAs.

The effect of high energy electrons during the growth of ZnSe and ZnMgSe by molecular beam epitaxy

2001 ◽  
Vol 30 (6) ◽  
pp. 785-788 ◽  
Author(s):  
B. L. Vanmil ◽  
A. J. Ptak ◽  
N. C. Giles ◽  
T. H. Myers ◽  
P. J. Treado ◽  
...  
Keyword(s):  
Molecular Beam Epitaxy ◽  
Molecular Beam ◽  
High Energy ◽  
High Energy Electrons

A Study on the Growth of Cubic GaN Films Using an AlGaAs Buffer Layer Grown on GaAs (100) by Plasma-Assisted Molecular Beam Epitaxy

2000 ◽  
Vol 639 ◽  
Author(s):  
Ryuhei Kimura ◽  
Kiyoshi Takahashi ◽  
H. T. Grahn
Keyword(s):  
Molecular Beam Epitaxy ◽  
Buffer Layer ◽  
Molecular Beam ◽  
High Energy ◽  
Rf Plasma ◽  
Cubic Phase ◽  
X Ray Diffraction ◽  
X Ray ◽  
Cubic Gan

ABSTRACTAn investigation of the growth mechanism for RF-plasma assisted molecular beam epitaxy of cubic GaN films using a nitrided AlGaAs buffer layer was carried out by in-situ reflection high energy electron diffraction (RHEED) and high resolution X-ray diffraction (HRXRD). It was found that hexagonal GaN nuclei grow on (1, 1, 1) facets during nitridation of the AlGaAs buffer layer, but a highly pure, cubic-phase GaN epilayer was grown on the nitrided AlGaAs buffer layer.

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