Deposition of Cobalt Doped Zinc Oxide Thin Film Nano-Composites Via Pulsed Electron Beam Ablation

MRS Advances ◽  
2016 ◽  
Vol 1 (6) ◽  
pp. 433-439 ◽  
Author(s):  
Asghar Ali ◽  
Patrick Morrow ◽  
Redhouane Henda ◽  
Ragnar Fagerberg
Keyword(s):  
Zinc Oxide ◽  
Electron Beam ◽  
Binding Energy ◽  
Photoelectron Spectroscopy ◽  
Xrd Analysis ◽  
Sem Analysis ◽  
Oxide Thin Film ◽  
X Ray ◽  
Pulsed Electron Beam ◽  
Deposited Films

AbstractThis study reports on the preparation of cobalt doped zinc oxide (Co:ZnO) films via pulsed electron beam ablation (PEBA) from a single target containing 20 w% Co on sapphire (0001) and silicon (100) substrates. The films have been deposited at various temperatures (350оC, 400оC, 450оC) and pulse frequencies (2 Hz, 4 Hz), under a background argon (Ar) pressure of about 3 mtorr, and an accelerating voltage of 14 kV. The surface morphology has been examined by atomic force microscopy (AFM) and scanning electron microscopy (SEM). According to SEM analysis, the films consist of nano-globules whose size is in the range of 80-178 nm. Energy dispersive x-ray spectroscopy (EDX) reveals that deposition is congruent and the prepared films contain ∼20±5 w% cobalt. It has been found that the nano-globules in the deposited films are cobalt-rich zones containing ∼70 w% Co. From x-ray photoelectron spectroscopy (XPS) analysis, Co 2p3/2 peaks indicate that the deposited films contain CoO (binding energy = 780.5 eV) as well as metallic Co (binding energy = 778.1-778.5 eV). X-ray diffraction (XRD) analysis supports the presence of metallic Co hcp phase (2ϴ = 44.47° and 47.43°) in the films.

COMPOSITION AND NANOHARDNESS OF SiC FILMS DEPOSITED BY ELECTRON BEAM PHYSICAL VAPOR DEPOSITION

2009 ◽  
Vol 23 (06n07) ◽  
pp. 1910-1915 ◽  
Author(s):  
MIN TENG ◽  
XIAODONG HE ◽  
YUE SUN
Keyword(s):  
Electron Beam ◽  
Chemical Bonding ◽  
Vapor Deposition ◽  
Photoelectron Spectroscopy ◽  
Physical Vapor Deposition ◽  
Current Intensity ◽  
X Ray ◽  
Deposited Films ◽  
Sic Films

SiC films with a quantity of carbon and silicon were obtained by electron beam physical vapor deposition (EB-PVD) from a sintered SiC target with different current intensity of EB. The X-ray photoelectron spectroscopy (XPS) was used for characterization of chemical bonding states of C and Si elements in SiC films in order to study the influence of current intensity of EB on the compositions in the deposited films. At the same time, the nanohardness of the deposited films was investigated.

The effect of high-current pulsed electron beam modification on the surface wetting property of polyamide 6

e-Polymers ◽  
2017 ◽  
Vol 17 (1) ◽  
pp. 23-29 ◽  
Author(s):  
Yuan Fang Chen ◽  
Tao Zhang ◽  
Meng Tang ◽  
Ding Xie ◽  
Qian Long ◽  
...  
Keyword(s):  
Electron Beam ◽  
Photoelectron Spectroscopy ◽  
Polyamide 6 ◽  
High Current ◽  
Surface Wetting ◽  
Water Contact ◽  
X Ray ◽  
Pulsed Electron Beam ◽  
Wetting Property ◽  
Scanning Electron

AbstractThis study demonstrates that different modification pulse voltages affect the wetting property of the surface of polyamide 6 (PA6) with a certain regularity. Broadly, the hydrophilic property of PA6’s surface increases with increasing pulsed voltage. Based on scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS) analysis, this paper discusses the mechanism by which high current pulsed electron beam (HCPEB) etching modification influences the surface wettability of PA6. Within a certain range below 28 kV, this effect is caused by an increase of in surface roughness due to HCPEB bombardment of the surface. Within a certain range above 28 kV, HCPEB changes the surface morphology, resulting in changes to the wetting property. Furthermore, by using various pulsed voltages to modify the PA6 surface, this study investigated the ability of the Wenzel model to explain changes in the water contact angle and wetting property of PA6’s surface.

Depth-Profiling Study on Amorphous Indium–Gallium–Zinc Oxide Thin-Film Transistors by X-ray Photoelectron Spectroscopy

2013 ◽  
Vol 52 (3S) ◽  
pp. 03BB03 ◽  
Author(s):  
Shinnosuke Iwamatsu ◽  
Kazushige Takechi ◽  
Toru Yahagi ◽  
Yoshiyuki Watanabe ◽  
Hiroshi Tanabe ◽  
...  
Keyword(s):  
Thin Film ◽  
Zinc Oxide ◽  
Photoelectron Spectroscopy ◽  
Thin Film Transistors ◽  
Depth Profiling ◽  
Oxide Thin Film ◽  
Indium Gallium Zinc Oxide ◽  
Zinc Oxide Thin Film ◽  
X Ray ◽  
Indium Gallium

X-ray Photoelectron Spectroscopy of Surface Layers of Faceted Zinc Oxide Nanorods

2021 ◽  
Vol 26 (6) ◽  
pp. 481-490
Author(s):  
Z.V. Shomakhov ◽  
◽  
S.S. Nalimova ◽  
A.A. Bobkov ◽  
V.A. Moshnikov ◽  
...  
Keyword(s):  
Zinc Oxide ◽  
Binding Energy ◽  
Photoelectron Spectroscopy ◽  
Photoelectron Spectra ◽  
Zinc Oxide Nanorods ◽  
Hydroxyl Groups ◽  
Surface Layers ◽  
Defective Structure ◽  
X Ray ◽  
Oxide Nanorods

The control of the nanomaterials surface’s hydrophilic properties is of interest for various applications, including optics, photocatalysis, and spintronics. In this work, techniques for designing the defective structure of the surface layers of faceted zinc oxide nanorods during sacrificial doping with iodine by hydrothermal synthesis were considered. The features of the chemical composition of the surface of the obtained layers were studied using X-ray photoelectron spectroscopy (XPS). It was found that peaks corresponding to the binding energy of iodine were not observed in the X-ray photoelectron spectra. An additional peak with a binding energy of 531.8 eV, corresponding to the oxygen of OH groups, was observed in the O 1s level spectrum for zinc oxide nanorods doped with iodine. During the heat treatment of the synthesized layers, iodine evaporates, which leads to a change in the surface composition and an increase in the oxygen content of the surface hydroxyl groups. A model has been proposed to explain the experimental results. It has been established that XPS techniques are effective for analyzing the defective surface structure of functional layers based on faceted zinc oxide nanorods.

scholarly journals Preparation, structure and optical properties of transparent conducting gallium-doped zinc oxide thin films

2015 ◽  
Vol 33 (3) ◽  
pp. 470-481 ◽  
Author(s):  
J. H. Gu ◽  
Z. Lu ◽  
L. Long ◽  
Z. Y. Zhong ◽  
C. Y. Yang ◽  
...  
Keyword(s):  
Thin Films ◽  
Zinc Oxide ◽  
Growth Temperature ◽  
Photoelectron Spectroscopy ◽  
Energy Gap ◽  
Optical Energy Gap ◽  
Optical Energy ◽  
Characterization Methods ◽  
X Ray ◽  
Deposited Films

Abstract Highly conductive gallium-doped zinc oxide (GZO) transparent thin films were deposited on glass substrates by RF mag­netron sputtering. The deposited films were characterized by X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), four-point probe and UV-Vis spectrophotometer, respectively. The effect of growth temperature on the structure and optoelectrical properties of the films was investigated. The results demonstrate that high quality GZO films oriented with their crystal­lographic c-axis perpendicular to the substrates are obtained. The structure and optoelectrical properties of the films are highly dependent on the growth temperature. It is found that with increasing growth temperature, the average visible transmittance of the deposited films is enhanced and the residual stress in the thin films is obviously relaxed. The GZO films deposited at the growth temperature of 400°C, which have the largest grain size (74.3 nm), the lowest electrical resistivity (1.31×10-3 Ω·cm) and the maximum figure of merit (1.46×1O-2Ω-1), exhibit the best optoelectrical properties. Furthermore, the optical proper­ties of the deposited films were determined by the optical characterization methods and the optical energy-gaps were evaluated by extrapolation method. A blue shift of the optical energy gap is observed with an increase in the growth temperature.

scholarly journals Surface Stoichiometry and Depth Profile of Tix-CuyNz Thin Films Deposited by Magnetron Sputtering

Materials ◽  
2021 ◽  
Vol 14 (12) ◽  
pp. 3191
Author(s):  
Arun Kumar Mukhopadhyay ◽  
Avishek Roy ◽  
Gourab Bhattacharjee ◽  
Sadhan Chandra Das ◽  
Abhijit Majumdar ◽  
...  
Keyword(s):  
Magnetron Sputtering ◽  
Photoelectron Spectroscopy ◽  
Film Surface ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Relative Composition ◽  
Transmission Electron ◽  
Deposited Film ◽  
Deposited Films

We report the surface stoichiometry of Tix-CuyNz thin film as a function of film depth. Films are deposited by high power impulse (HiPIMS) and DC magnetron sputtering (DCMS). The composition of Ti, Cu, and N in the deposited film is investigated by X-ray photoelectron spectroscopy (XPS). At a larger depth, the relative composition of Cu and Ti in the film is increased compared to the surface. The amount of adventitious carbon which is present on the film surface strongly decreases with film depth. Deposited films also contain a significant amount of oxygen whose origin is not fully clear. Grazing incidence X-ray diffraction (GIXD) shows a Cu3N phase on the surface, while transmission electron microscopy (TEM) indicates a polycrystalline structure and the presence of a Ti3CuN phase.

scholarly journals An Insight into Chemistry and Structure of Colloidal 2D-WS2 Nanoflakes: Combined XPS and XRD Study

Nanomaterials ◽  
2021 ◽  
Vol 11 (8) ◽  
pp. 1969
Author(s):  
Riccardo Scarfiello ◽  
Elisabetta Mazzotta ◽  
Davide Altamura ◽  
Concetta Nobile ◽  
Rosanna Mastria ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Xrd Analysis ◽  
Crystal Habit ◽  
Phase Identification ◽  
X Ray Diffraction ◽  
X Ray ◽  
Morphological Evaluation ◽  
Rational Understanding ◽  
Structural Inspection

The surface and structural characterization techniques of three atom-thick bi-dimensional 2D-WS2 colloidal nanocrystals cross the limit of bulk investigation, offering the possibility of simultaneous phase identification, structural-to-morphological evaluation, and surface chemical description. In the present study, we report a rational understanding based on X-ray photoelectron spectroscopy (XPS) and structural inspection of two kinds of dimensionally controllable 2D-WS2 colloidal nanoflakes (NFLs) generated with a surfactant assisted non-hydrolytic route. The qualitative and quantitative determination of 1T’ and 2H phases based on W 4f XPS signal components, together with the presence of two kinds of sulfur ions, S22− and S2−, based on S 2p signal and related to the formation of WS2 and WOxSy in a mixed oxygen-sulfur environment, are carefully reported and discussed for both nanocrystals breeds. The XPS results are used as an input for detailed X-ray Diffraction (XRD) analysis allowing for a clear discrimination of NFLs crystal habit, and an estimation of the exact number of atomic monolayers composing the 2D-WS2 nanocrystalline samples.

Influence of High Current Pulsed Electron Beam Irradiation on Ni-P Electroless Plating

2011 ◽  
Vol 299-300 ◽  
pp. 77-81
Author(s):  
Yang Xu ◽  
Sheng Zhi Hao ◽  
Xiang Dong Zhang ◽  
Min Cai Li ◽  
Chuang Dong
Keyword(s):  
Electroless Plating ◽  
Electron Beam Irradiation ◽  
Xrd Analysis ◽  
High Current ◽  
X Ray Diffraction ◽  
X Ray ◽  
Pulsed Electron Beam ◽  
6063 Aluminum Alloy ◽  
Pre Treatment ◽  
Better Than

The surface irradiation of 6063 aluminum alloy by high current pulsed electron was conducted with the aim of replacing the complicated pre-treatment in the processes of electroless plating. To explore the microstructure changes, optical metallography, SEM (scanning electron microscope), XRD (X-ray diffraction) analyses were carried out, and the sliding tests were used for the detection of wear resistance. It was concluded that the HCPEB irradiation could replace the pre-treatment of aluminum substrate as required in conventional electroless plating with a decreased surface roughness of Ni-P alloy plating layer. The plates exhibited an amorphous microstructure as demonstrated by XRD analysis. The plates, produced with the routine of HCPEB irradiation, activation and electroless plating possess, also exhibited good quality, even better than that of conventional electroless plating technique.

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