Exciton absorption spectra of RbPb2Cl5 and Rb6Pb5Cl16 thin films

2019 ◽  
Vol 26 (2) ◽  
Keyword(s):  
Thin Films ◽  
Absorption Spectra ◽  
Exciton Absorption

Exciton absorption spectra in GaSe thin films

1981 ◽  
Vol 75 (3) ◽  
pp. L7-L9 ◽  
Author(s):  
A.G. Abdullayev ◽  
I.G. Aksianov ◽  
A.I. Mamedov ◽  
K.I. Abdullayev
Keyword(s):  
Thin Films ◽  
Absorption Spectra ◽  
Exciton Absorption

Exciton absorption spectra of thin films of RbCu2Cl3 and Rb2Cu3Cl5 ternary compounds

2021 ◽  
Vol 47 (5) ◽  
pp. 427-432
Author(s):  
E. N. Kovalenko ◽  
O. N. Yunakova ◽  
N. N. Yunakov
Keyword(s):  
Thin Films ◽  
Absorption Spectra ◽  
Exciton Absorption ◽  
Ternary Compounds

scholarly journals Exciton absorption spectra of KPb2Br5 thin films

2016 ◽  
Vol 23 (4) ◽  
pp. 570-575 ◽  
Author(s):  
V.V. Kovalenko ◽  
Keyword(s):  
Thin Films ◽  
Absorption Spectra ◽  
Exciton Absorption

Fine Structures of the X-Ray Absorption Spectra for Thin Films of Metallic Coppers

1970 ◽  
Vol 9 (11) ◽  
pp. 1372-1377
Author(s):  
Hayao Kubo ◽  
Hiroo Nakamori ◽  
Kenjiro Tsutsumi
Keyword(s):  
Thin Films ◽  
Absorption Spectra ◽  
X Ray ◽  
Fine Structures ◽  
X Ray Absorption

Optical Absorption in Co-Deposited Mixed-Phase Hydrogenated Amorphous/Nanocrystalline Silicon Thin Films

2010 ◽  
Vol 1245 ◽  
Author(s):  
Lee Wienkes ◽  
Aaron Besaw ◽  
Curtis Anderson ◽  
David Bobela ◽  
Paul Stradins ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Absorption ◽  
Absorption Spectra ◽  
Defect Density ◽  
Amorphous Material ◽  
Nanocrystalline Silicon ◽  
Esr Spectra ◽  
Hydrogenated Silicon ◽  
Silicon Thin Films ◽  
Electron Donation

AbstractThe conductivity of amorphous/nanocrystalline hydrogenated silicon thin films (a/nc-Si:H) deposited in a dual chamber co-deposition system exhibits a non-monotonic dependence on the nanocrystal concentration. Optical absorption measurements derived from the constant photocurrent method (CPM) and preliminary electron spin resonance (ESR) data for similarly prepared materials are reported. The optical absorption spectra, in particular the subgap absorption, are found to be independent of nanocrystalline density for relatively small crystal fractions (< 4%). For films with a higher crystalline content, the absorption spectra indicate broader Urbach slopes and higher midgap absorption. The ESR spectra show an approximately constant defect density across all of the films. These data are interpreted in terms of a model involving electron donation from the nanocrystals into the amorphous material.

Observation of the Berreman Effect in Infrared Reflection-Absorption Spectra of Amorphous Titanium Oxide Thin Films Deposited on Aluminum

2000 ◽  
Vol 54 (5) ◽  
pp. 687-691 ◽  
Author(s):  
B. C. Trasferetti ◽  
C. U. Davanzo ◽  
N. C. da Cruz ◽  
M. A. B. de Moraes
Keyword(s):  
Thin Films ◽  
Absorption Spectra ◽  
Optical Constants ◽  
Polarized Light ◽  
Chemical Vapor ◽  
Layered System ◽  
Infrared Reflection ◽  
Fresnel Equation ◽  
Successful Technique

Infrared reflection-absorption spectra of plasma-enhanced chemical vapor deposition (PECVD) amorphous TiO2 thin films on aluminum were obtained with s- and p-polarized light and oblique incidence angles. Such spectra were analyzed by means of spectral simulations based on a Fresnel equation for a three-layered system. The optical constants used in the simulations were obtained through the Kramers–Krönig analysis of the reflectance spectra of a pellet of powdered amorphous TiO2. LO-TO energy-loss functions were also calculated from these optical constants, and a splitting was observed. A good qualitative agreement between experimental and simulated spectra was achieved, and the Berreman effect was observed in both cases when p-polarized light was used. It was shown, therefore, that the Berreman effect makes infrared reflection-absorption spectroscopy a successful technique for the characterization of an amorphous TiO2 thin layer on aluminum.

Sign in / Sign up

Export Citation Format

Share Document