scholarly journals AN XPS AND TPD STUDY OF GOLD OXIDE FILMS OBTAINED BY EXPOSURE TO RF-ACTIVATED OXYGEN

2015 ◽  
Vol 56 (3) ◽  
Keyword(s):  
Oxide Films ◽  
Gold Oxide ◽  
Activated Oxygen

An XPS and TPD study of gold oxide films obtained by exposure to RF-activated oxygen

2015 ◽  
Vol 56 (3) ◽  
pp. 557-565 ◽  
Author(s):  
A. I. Stadnichenko ◽  
S. V. Koshcheev ◽  
A. I. Boronin
Keyword(s):  
Oxide Films ◽  
Gold Oxide ◽  
Activated Oxygen

scholarly journals Structures and stabilities of gold oxide films on gold surfaces in O2 atmosphere

2014 ◽  
Vol 628 ◽  
pp. 41-49 ◽  
Author(s):  
Keju Sun ◽  
Masanori Kohyama ◽  
Shingo Tanaka ◽  
Seiji Takeda
Keyword(s):  
Oxide Films ◽  
Gold Surfaces ◽  
Gold Oxide

Controllable Localized Surface Plasmonic Resonance Phenomena in Reduced Gold Oxide Films

2014 ◽  
Vol 26 (5) ◽  
pp. 1799-1806 ◽  
Author(s):  
Yu-Lun Liu ◽  
Cheng-Yi Fang ◽  
Chen-Chieh Yu ◽  
Tai-Chi Yang ◽  
Hsuen-Li Chen
Keyword(s):  
Oxide Films ◽  
Plasmonic Resonance ◽  
Gold Oxide ◽  
Surface Plasmonic Resonance ◽  
Resonance Phenomena

scholarly journals Gold oxide films grown in the confined aqueous layer between gold and organic solvents

2014 ◽  
Vol 728 ◽  
pp. 94-101 ◽  
Author(s):  
L.M. Gassa ◽  
Jorge Omar Zerbino ◽  
A. Meyra ◽  
M.G. Sustersic ◽  
S. Siboni ◽  
...  
Keyword(s):  
Organic Solvents ◽  
Oxide Films ◽  
Gold Oxide ◽  
Aqueous Layer

Resolving Crystallites in Zirconium Oxide Films

1969 ◽  
Vol 27 ◽  
pp. 140-141
Author(s):  
R.A. Ploc
Keyword(s):  
Electron Microscope ◽  
Inelastic Scattering ◽  
Zirconium Oxide ◽  
Oxide Films ◽  
Optic Axis ◽  
Objective Lens ◽  
Microscope Objective ◽  
Linear Optic ◽  
A Current ◽  
Microscope Objective Lens

The optic axis of an electron microscope objective lens is usually assumed to be straight and co-linear with the mechanical center. No reason exists to assume such perfection and, indeed, simple reasoning suggests that it is a complicated curve. A current centered objective lens with a non-linear optic axis when used in conjunction with other lenses, leads to serious image errors if the nature of the specimen is such as to produce intense inelastic scattering.

Analysis of Sputtered Zinc Oxide Films

1980 ◽  
Vol 38 ◽  
pp. 416-417
Author(s):  
T. A. Emma ◽  
M. P. Singh
Keyword(s):  
Electron Microscopy ◽  
Zinc Oxide ◽  
Piezoelectric Materials ◽  
Oxide Films ◽  
Optical Quality ◽  
Zno Films ◽  
Rf Power ◽  
X Ray Diffraction ◽  
Sputtered Films ◽  
Zinc Oxide Films

Optical quality zinc oxide films have been characterized using reflection electron diffraction (RED), replication electron microscopy (REM), scanning electron microscopy (SEM), and X-ray diffraction (XRD). Significant microstructural differences were observed between rf sputtered films and planar magnetron rf sputtered films. Piezoelectric materials have been attractive for applications to integrated optics since they provide an active medium for signal processing. Among the desirable physical characteristics of sputtered ZnO films used for this and related applications are a highly preferred crystallographic texture and relatively smooth surfaces. It has been found that these characteristics are very sensitive to the type and condition of the substrate and to the several sputtering parameters: target, rf power, gas composition and substrate temperature.

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