Rotationally Tunable Two-Beam Interferometer with a Fixed Photosensitive Element. Part I. Interferometer Based on a Beam-Splitter Cube

2016 ◽  
Keyword(s):  
Beam Splitter ◽  
Photosensitive Element ◽  
Beam Splitter Cube ◽  
Fixed Photosensitive Element

scholarly journals Polarizing beam splitter cube for circularly and elliptically polarized light

2019 ◽  
Vol 27 (11) ◽  
pp. 16258 ◽  
Author(s):  
Sawyer Miller ◽  
Xingzhou Tu ◽  
Linan Jiang ◽  
Stanley Pau
Keyword(s):  
Beam Splitter ◽  
Polarized Light ◽  
Elliptically Polarized Light ◽  
Elliptically Polarized ◽  
Polarizing Beam Splitter ◽  
Beam Splitter Cube

Transmission digital holographic microscopy based on a beam-splitter cube interferometer

2009 ◽  
Vol 48 (15) ◽  
pp. 2778 ◽  
Author(s):  
Weijuan Qu ◽  
Kallol Bhattacharya ◽  
Chee Oi Choo ◽  
Yingjie Yu ◽  
Anand Asundi
Keyword(s):  
Beam Splitter ◽  
Digital Holographic Microscopy ◽  
Holographic Microscopy ◽  
Beam Splitter Cube

scholarly journals Design of a novel TiO2/airgap-based polarizing micro beam splitter cube

2019 ◽  
Vol 1319 ◽  
pp. 012006
Author(s):  
M J Maciel ◽  
S Pimenta ◽  
J F Ribeiro ◽  
J H Correia
Keyword(s):  
Beam Splitter ◽  
Beam Splitter Cube

scholarly journals Dispersion error of a beam splitter cube in white-light spectral interferometry

2008 ◽  
Vol 16 (4) ◽  
Author(s):  
P. Hlubina ◽  
J. Luňáček ◽  
D. Ciprian ◽  
R. Chlebus
Keyword(s):  
Thin Film ◽  
Phase Function ◽  
Path Length ◽  
Beam Splitter ◽  
Michelson Interferometer ◽  
Film Structure ◽  
Dispersion Error ◽  
Length Difference ◽  
Path Length Difference ◽  
Beam Splitter Cube

AbstractWe revealed that the phase function of a thin-film structure measured by a white-light spectral interferometric technique depends on the path length difference adjusted in a Michelson interferometer. This phenomenon is due to a dispersion error of a beam splitter cube, the effective thickness of which varies with the adjusted path length difference. A technique for eliminating the effect in measurement of the phase function is described. In a first step, the Michelson interferometer with same metallic mirrors is used to measure the effective thickness of the beam splitter cube as a function of the path length difference. In a second step, one of the mirrors of the interferometer is replaced by a thin-film structure and its phase function is measured for the same path length differences as those adjusted in the first step. In both steps, the phase is retrieved from the recorded spectral interferograms by using a windowed Fourier transform applied in the wavelength domain.

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