Electromigration in thin films and electronic devices

Author(s):  
Choong-Un Kim
Nanoscale ◽  
2017 ◽  
Vol 9 (37) ◽  
pp. 13938-13946 ◽  
Author(s):  
C. Polop ◽  
E. Vasco ◽  
A. P. Perrino ◽  
R. Garcia

From aircraft to electronic devices, and even in Formula One cars, stress is the main cause of degraded material performance and mechanical failure in applications incorporating thin films and coatings.


Electronics ◽  
2021 ◽  
Vol 10 (8) ◽  
pp. 960
Author(s):  
Mira Naftaly ◽  
Satyajit Das ◽  
John Gallop ◽  
Kewen Pan ◽  
Feras Alkhalil ◽  
...  

Conductive thin films are an essential component of many electronic devices. Measuring their conductivity accurately is necessary for quality control and process monitoring. We compare conductivity measurements on films for flexible electronics using three different techniques: four-point probe, microwave resonator and terahertz time-domain spectroscopy. Multiple samples were examined, facilitating the comparison of the three techniques. Sheet resistance values at DC, microwave and terahertz frequencies were obtained and were found to be in close agreement.


2019 ◽  
Vol 772 ◽  
pp. 532-536 ◽  
Author(s):  
Biswajit Barman ◽  
Kasturi V. Bangera ◽  
G.K. Shivakumar

1988 ◽  
Vol 92 (11) ◽  
pp. 1261-1266 ◽  
Author(s):  
Francis Garnier ◽  
Gilles Horowitz ◽  
Jean Roncali ◽  
Marc Lemaire

2017 ◽  
Vol 183 ◽  
pp. 99-103 ◽  
Author(s):  
André L.F. Cauduro ◽  
Roberto dos Reis ◽  
Gong Chen ◽  
Andreas K. Schmid ◽  
Horst-Günter Rubahn ◽  
...  

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