scholarly journals Generalizacija linija i AutoCAD Map

Geoadria ◽  
2017 ◽  
Vol 6 (1) ◽  
pp. 17
Author(s):  
Nada Vučetić ◽  
Miljenko Lapaine
Keyword(s):  
Line Width ◽  
Original Research ◽  
Line Simplification ◽  
Buffer Width

The paper offers the results of original research made on the application of AutoCADMap in line generalisation. The differences and similarities have been found out between theDouglas-Peucker method and the method of line simplification that is incorporated inAutoCAD Map. There have been also the inaccuracies found out in AutoCAD Map manualrelating to the issues of buffer width and tolerance, and the line width before and aftersimplification. The paper gives recommendations about pseudo nodes dissolving. It has beennoticed that AutoCAD Map simplification method is not independent of the order of points.The application of the method is illustrated by an example of coastal line of Istria.

Scientific progress is like doing a puzzle, not building a wall

2018 ◽  
Vol 41 ◽  
Author(s):  
Alexa M. Tullett ◽  
Simine Vazire
Keyword(s):  
Scientific Progress ◽  
Original Research ◽  
Jigsaw Puzzle ◽  
Replication Research

AbstractWe contest the “building a wall” analogy of scientific progress. We argue that this analogy unfairly privileges original research (which is perceived as laying bricks and, therefore, constructive) over replication research (which is perceived as testing and removing bricks and, therefore, destructive). We propose an alternative analogy for scientific progress: solving a jigsaw puzzle.

On The Radii of Ap Stars

1976 ◽  
Vol 32 ◽  
pp. 49-55 ◽  
Author(s):  
F.A. Catalano ◽  
G. Strazzulla
Keyword(s):  
Observational Data ◽  
Line Width ◽  
Main Sequence ◽  
Main Sequence Stars ◽  
Ap Stars

SummaryFrom the analysis of the observational data of about 100 Ap stars, the radii have been computed under the assumption that Ap are main sequence stars. Radii range from 1.4 to 4.9 solar units. These values are all compatible with the Deutsch's period versus line-width relation.

LVSEM: Past Present and Future

1990 ◽  
Vol 48 (1) ◽  
pp. 364-365
Author(s):  
James B. Pawley
Keyword(s):  
Field Emission ◽  
Line Width ◽  
Time Scales ◽  
Silicon Oxide ◽  
Beam Current ◽  
High Brightness ◽  
High Beam ◽  
Fixed Charges ◽  
Beam Voltage ◽  
Deposited Metal

Past: In 1960 Thornley published the first description of SEM studies carried out at low beam voltage (LVSEM, 1-5 kV). The aim was to reduce charging on insulators but increased contrast and difficulties with low beam current and frozen biological specimens were also noted. These disadvantages prevented widespread use of LVSEM except by a few enthusiasts such as Boyde. An exception was its use in connection with studies in which biological specimens were dissected in the SEM as this process destroyed the conducting films and produced charging unless LVSEM was used.In the 1980’s field emission (FE) SEM’s came into more common use. The high brightness and smaller energy spread characteristic of the FE-SEM’s greatly reduced the practical resolution penalty associated with LVSEM and the number of investigators taking advantage of the technique rapidly expanded; led by those studying semiconductors. In semiconductor research, the SEM is used to measure the line-width of the deposited metal conductors and of the features of the photo-resist used to form them. In addition, the SEM is used to measure the surface potentials of operating circuits with sub-micrometer resolution and on pico-second time scales. Because high beam voltages destroy semiconductors by injecting fixed charges into silicon oxide insulators, these studies must be performed using LVSEM where the beam does not penetrate so far.

The Return of Tourniquets: Original Research Evaluates the Effectiveness of Prehospital Tourniquets for Civilian Penetrating Extremity Injuries

2008 ◽  
Vol 33 (8) ◽  
pp. 44-46 ◽  
Author(s):  
Jeffrey Kalish ◽  
Peter Burke ◽  
Jim Feldman ◽  
Suresh Agarwal ◽  
Andrew Glantz ◽  
...  
Keyword(s):  
Original Research ◽  
Extremity Injuries

SIZE DEPENDENT FMR LINE-SHIFT AND LINE-WIDTH STUDIES IN POLYCRYSTALLINE FERRITES AND GARNETS

1977 ◽  
Vol 38 (C1) ◽  
pp. C1-267-C1-269 ◽  
Author(s):  
C. M. SRIVASTAVA ◽  
M. J. PATNI ◽  
N. G. NANADIKAR
Keyword(s):  
Line Width ◽  
Line Shift ◽  
Size Dependent

EDITORIAL

1970 ◽  
Vol 1 (1) ◽  
pp. i-iv
Author(s):  
A K M A Islam
Keyword(s):  
Environmental Science ◽  
Academic Career ◽  
Scientific Research ◽  
Editorial Policy ◽  
Research Community ◽  
Hard Copy ◽  
Original Research ◽  
Scientific Publications ◽  
Advisory Boards

Journal of Scientific Research EDITORIAL Do we need a new journal? The answer lies in the fact that currently no international journal (online and print) with interdisciplinary character which specifically caters to the academic needs of the international community operates from Bangladesh. This journal aims to fill this lacuna and to be a bridge for the scientists from the east and the west. This is the first issue of the Journal of Scientific Research (JSR). The idea of launching a journal that hopes to publish quality scientific works was planted in early 2008 during a science faculty meeting at Rajshahi University. Now it is our pleasure to see the idea blossom into the first issue of first volume (1 January 2009) that contains scientific work not only of Asian regions but of much beyond that. The inaugural issue indicates the type of journal we hope to become. It is wide ranging and interdisciplinary. Our contributors include scholars at every stage of their academic career. As regards editorial policy and scope the Journal of Scientific Research is a peer-reviewed international journal originally intended for publication annually. But due to a satisfactory flow of manuscripts since the first announcements the publication frequency has now been increased to 3 online issues (one print volume) per year.The journal is a unifying force, going across the barriers between disciplines, addressing all related topics and materials. An international Editorial Board (along with an Advisory Board) comprising of renowned academics from various fields guides our editorial policy and direction. The journal is devoted to the publication of original research (research paper, review paper, short communication) covering the following fields:Section A:  Physical and Mathematical Sciences: Physics, Mathematics, Statistics, Geophysics, Computer, Environmental Science, Communications and Information Technology, Engineering and related branches.Section B:  Chemical and Biological Sciences: Chemistry, Biochemistry, Pharmacy, Biology, Genetics, Fisheries and related branches.The articles selected for the first issue have been reviewed by two discipline-specialists, and their recommendations have been appropriately incorporated. Submissions from the world research community are encouraged to fulfill our mission and aim for the journal to stand for the international scientific publishing standards.    It was clear during the planning and development of this first issue that the Asian region needs a forum through which research could be shared and acknowledged. I hope that this journal will soon be recognised by the wider research community as their forum for the dissemination of knowledge. We hope that the journal will not simply act as a place for publication of material, though obviously this is important, but should act as a catalyst for the advancement of science both within and outside the region.The journal is being published both online and in print. Online publishing, unique in nature, is faster and far less expensive than traditional hard copy publishing. Access of online journals is easier and better images, storage and multimedia are other advantages. I must thank the International Network for the availability of Scientific Publications (INASP) for helping us publish via BanglaJOL – and the help of Ms. Sioux Cumming in this regard is worthy of mention.The success of a journal depends on the quality of its Editorial Board and the reviewers. The effort that I have seen from them speaks well for the future of the new born journal.  Both the Editorial and Advisory Boards should deserve thanks for their indispensable advice and support during the planning phases of the journal. I should also thank the reviewers who contributed their valuable time to complete reviews within a reasonable time. I truly hope that the diversity contained in this first issue of the journal will be the hallmark of future issues. A K M A Islam email: [email protected]  website: www.banglajol.info/index.php/JSR           © 2009 JSR Publications. ISSN: 2070-0237 (Print); 2070-0245 (Online). All rights reserved.DOI: 10.3329/jsr.vlil.1703    

The Real School Safety Problem

2016 ◽  
Author(s):  
Aaron Kupchik
Keyword(s):  
Police Officers ◽  
School Safety ◽  
Zero Tolerance ◽  
Safe Schools ◽  
Original Research ◽  
School Security ◽  
Safety Problem ◽  
The Real ◽  
K 12 ◽  
The U.S

Since the 1990s, K-12 schools across the U.S. have changed in important ways in an effort to maintain safe schools. They have added police officers, surveillance cameras, zero tolerance policies, and other equipment and personnel, while increasingly relying on suspension and other punishments. Unfortunately, we have implemented these practices based on assumptions that they will be effective at maintaining safety and helping youth, not based on evidence. The Real School Safety Problem addresses this problem in two ways. One, it provides a clear discussion of what we know and what we don’t yet know about the school security and punishment practices and their effects on students and schools. Two, it offers original research that extends what we know in important ways, showing how school security and punishment affects students, their families, their schools and their communities years into the future. Schools are indeed in crisis. But the real school safety problem is not that students are either out of control or in danger. Rather, the real school safety problem is that our efforts to maintain school safety have gone too far and in the wrong directions. As a result, we over-police and punish students in a way that hurts students, their families and their communities in broad and long-lasting ways.

Performance and Reliability of a MEMS-based tunable optical filter operating in the 1565 nm-1525 nm wavelength range

2002 ◽  
Vol 722 ◽  
Author(s):  
T. S. Sriram ◽  
B. Strauss ◽  
S. Pappas ◽  
A. Baliga ◽  
A. Jean ◽  
...  
Keyword(s):  
Silicon Nitride ◽  
Line Width ◽  
Insertion Loss ◽  
Optical Filter ◽  
Single Mode ◽  
Single Mode Fiber ◽  
Reliability Testing ◽  
Silicon Nitride Membrane ◽  
Tunable Optical Filter ◽  
Extensive Performance

AbstractThis paper describes the results of extensive performance and reliability characterization of a silicon-based surface micro-machined tunable optical filter. The device comprises a high-finesse Fabry-Perot etalon with one flat and one curved dielectric mirror. The curved mirror is mounted on an electrostatically actuated silicon nitride membrane tethered to the substrate using silicon nitride posts. A voltage applied to the membrane allows the device to be tuned by adjusting the length of the cavity. The device is coupled optically to an input and an output single mode fiber inside a hermetic package. Extensive performance characterization (over operating temperature range) was performed on the packaged device. Parameters characterized included tuning characteristics, insertion loss, filter line-width and side mode suppression ratio. Reliability testing was performed by subjecting the MEMS structure to a very large number of actuations at an elevated temperature both inside the package and on a test board. The MEMS structure was found to be extremely robust, running trillions of actuations without failures. Package level reliability testing conforming to Telcordia standards indicated that key device parameters including insertion loss, filter line-width and tuning characteristics did not change measurably over the duration of the test.

Dual Damascene Process for FatWires in Copper/FSG Technology

2003 ◽  
Vol 766 ◽  
Author(s):  
J. Gambino ◽  
T. Stamper ◽  
H. Trombley ◽  
S. Luce ◽  
F. Allen ◽  
...  
Keyword(s):  
Line Width ◽  
Lower Cost ◽  
Process Window ◽  
Cmos Process ◽  
Dual Damascene ◽  
Damascene Process ◽  
Interconnect Technology

AbstractA trench-first dual damascene process has been developed for fat wires (1.26 μm pitch, 1.1 μm thickness) in a 0.18 μm CMOS process with copper/fluorosilicate glass (FSG) interconnect technology. The process window for the patterning of vias in such deep trenches depends on the trench depth and on the line width of the trench, with the worse case being an intermediate line width (lines that are 3X the via diameter). Compared to a single damascene process, the dual damascene process has comparable yield and reliability, with lower via resistance and lower cost.

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