Laser Induced Damage in Fluoride Glasses: A Status Report

Laser Induced Damage of Optical Elements–a Status Report

Applied Optics ◽

10.1364/ao.12.000637 ◽

1973 ◽

Vol 12 (4) ◽

pp. 637 ◽

Cited By ~ 101

Author(s):

Alexander J. Glass ◽

Arthur H. Guenther

Keyword(s):

Status Report ◽

Optical Elements ◽

Laser Induced Damage

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Progress in the compilation of the FK5

International Astronomical Union Colloquium ◽

10.1017/s0252921100074388 ◽

1978 ◽

Vol 48 ◽

pp. 421-432 ◽

Cited By ~ 7

Author(s):

W. Fricke ◽

W. Gliese

Keyword(s):

Status Report ◽

Magnitude Range

Abstract:Presented is a status report on work on FK5 giving information on the following items: (a) the intended increase of the number of fundamental stars and their magnitude range in FK5, (b) available material for the improvement of the system, (c) methods for the determination of systematic differences, (d) the determination of equator and equinox of FK5, and (e) the elimination of the motion of the FK4 equinox.

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UHV-TEM studies of laser-induced damage

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100087471 ◽

1991 ◽

Vol 49 ◽

pp. 632-633

Author(s):

T.S. Savage ◽

R. Ai ◽

D. Dunn ◽

L.D. Marks

Keyword(s):

Surface Science ◽

Rapid Heating ◽

Local Heating ◽

Routine Practice ◽

Transmission Electron ◽

Northwestern University ◽

Laser Induced Damage ◽

Set Up ◽

Focusing Lens ◽

Diffusion Of Impurities

The use of lasers for surface annealing, heating and/or damage has become a routine practice in the study of materials. Lasers have been closely looked at as an annealing technique for silicon and other semiconductors. They allow for local heating from a beam which can be focused and tuned to different wavelengths for specific tasks. Pulsed dye lasers allow for short, quick bursts which can allow the sample to be rapidly heated and quenched. This short, rapid heating period may be important for cases where diffusion of impurities or dopants may not be desirable.At Northwestern University, a Candela SLL - 250 pulsed dye laser, with a maximum power of 1 Joule/pulse over 350 - 400 nanoseconds, has been set up in conjunction with a Hitachi UHV-H9000 transmission electron microscope. The laser beam is introduced into the surface science chamber through a series of mirrors, a focusing lens and a six inch quartz window.

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Scanning tunneling microscopy of polymers: A status report

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100153622 ◽

1989 ◽

Vol 47 ◽

pp. 330-331

Author(s):

P.E. Russell ◽

I.H. Musselman

Keyword(s):

High Resolution ◽

Scanning Tunneling Microscopy ◽

Sample Surface ◽

Atomic Scale ◽

Constant Current ◽

Scanning Tunneling ◽

Status Report ◽

Tunneling Microscopy ◽

Research Issues ◽

Wide Range

Scanning tunneling microscopy (STM) has evolved rapidly in the past few years. Major developments have occurred in instrumentation, theory, and in a wide range of applications. In this paper, an overview of the application of STM and related techniques to polymers will be given, followed by a discussion of current research issues and prospects for future developments. The application of STM to polymers can be conveniently divided into the following subject areas: atomic scale imaging of uncoated polymer structures; topographic imaging and metrology of man-made polymer structures; and modification of polymer structures. Since many polymers are poor electrical conductors and hence unsuitable for use as a tunneling electrode, the related atomic force microscopy (AFM) technique which is capable of imaging both conductors and insulators has also been applied to polymers.The STM is well known for its high resolution capabilities in the x, y and z axes (Å in x andy and sub-Å in z). In addition to high resolution capabilities, the STM technique provides true three dimensional information in the constant current mode. In this mode, the STM tip is held at a fixed tunneling current (and a fixed bias voltage) and hence a fixed height above the sample surface while scanning across the sample surface.

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