The Use of Self-Focusing in the Prevention of Laser-Induced Damage

2009 ◽  
pp. 557-557-11 ◽  
Author(s):  
MJ Soileau ◽  
WE Williams ◽  
EW Van Stryland ◽  
SF Brown
Keyword(s):  
Use Of Self ◽  
Self Focusing ◽  
Laser Induced Damage

scholarly journals Laser-Induced Damage And The Role Of Self-Focusing

1989 ◽  
Vol 28 (10) ◽  
Author(s):  
M. J. Soileau ◽  
William E. Williams ◽  
Nastaran Mansour ◽  
Eric W. Van Stryland
Keyword(s):  
Self Focusing ◽  
Laser Induced Damage

Evaluation of self-focusing influence on laser-induced damage threshold of anti-reflective coated windows

2005 ◽  
Author(s):  
T. Rakickas ◽  
V. Kudriašov ◽  
V. Sirutkaitis ◽  
R. Grigonis ◽  
E. Gaižauskas
Keyword(s):  
Damage Threshold ◽  
Self Focusing ◽  
Laser Induced Damage

Use of self-focusing for measurements of ultrasmall (less than λ/3000) wave-front distortions

2002 ◽  
Vol 19 (4) ◽  
pp. 650 ◽  
Author(s):  
Anatoly K. Poteomkin ◽  
Anatoly N. Mal’shakov ◽  
Nikolay F. Andreev ◽  
David H. Reitze
Keyword(s):  
Wave Front ◽  
Use Of Self ◽  
Self Focusing

Technique to enhance the throughput on a near-field aperture by the use of self-focusing effect

2002 ◽  
Vol 80 (16) ◽  
pp. 2827-2829 ◽  
Author(s):  
Ki-Bong Song ◽  
Jeongyong Kim ◽  
Kang-Ho Park
Keyword(s):  
Near Field ◽  
Use Of Self ◽  
Focusing Effect ◽  
Self Focusing

Influence Of Self-Focusing On Bulk Laser-Induced Damage

1988 ◽  
Author(s):  
M J. Soileau ◽  
Eric W. VanStryland ◽  
William E. Williams
Keyword(s):  
Self Focusing ◽  
Laser Induced Damage

Reshaping high-power ultrashort laser pulses by use of self-focusing

1996 ◽  
Author(s):  
Yuzhen Shen ◽  
Qirong Xing ◽  
Jiying Shi ◽  
Qingyue Wang
Keyword(s):  
High Power ◽  
Laser Pulses ◽  
Ultrashort Laser Pulses ◽  
Use Of Self ◽  
Self Focusing ◽  
Ultrashort Laser

Minimization of Cut-Off Effect by Use of Self-Focusing Effect to Enhance Throughput on Near-Field Aperture

2002 ◽  
Vol 41 (Part 1, No. 3B) ◽  
pp. 1724-1727 ◽  
Author(s):  
Ki-Bong Song ◽  
Jeongyong Kim ◽  
Kang-Ho Park
Keyword(s):  
Near Field ◽  
Use Of Self ◽  
Focusing Effect ◽  
Self Focusing

UHV-TEM studies of laser-induced damage

1991 ◽  
Vol 49 ◽  
pp. 632-633
Author(s):  
T.S. Savage ◽  
R. Ai ◽  
D. Dunn ◽  
L.D. Marks
Keyword(s):  
Surface Science ◽  
Rapid Heating ◽  
Local Heating ◽  
Routine Practice ◽  
Transmission Electron ◽  
Northwestern University ◽  
Laser Induced Damage ◽  
Set Up ◽  
Focusing Lens ◽  
Diffusion Of Impurities

The use of lasers for surface annealing, heating and/or damage has become a routine practice in the study of materials. Lasers have been closely looked at as an annealing technique for silicon and other semiconductors. They allow for local heating from a beam which can be focused and tuned to different wavelengths for specific tasks. Pulsed dye lasers allow for short, quick bursts which can allow the sample to be rapidly heated and quenched. This short, rapid heating period may be important for cases where diffusion of impurities or dopants may not be desirable.At Northwestern University, a Candela SLL - 250 pulsed dye laser, with a maximum power of 1 Joule/pulse over 350 - 400 nanoseconds, has been set up in conjunction with a Hitachi UHV-H9000 transmission electron microscope. The laser beam is introduced into the surface science chamber through a series of mirrors, a focusing lens and a six inch quartz window.

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