A Contactless Method of

2009 ◽  
pp. 225-225-14
Author(s):  
RL Verkuil ◽  
MS Pak
Keyword(s):  
Contactless Method

scholarly journals Multi-Camera Based Setup for Geometrical Measurement of Free-Falling Molten Glass Gob

Sensors ◽  
2021 ◽  
Vol 21 (4) ◽  
pp. 1041
Author(s):  
Mazhar Hussain ◽  
Mattias O’Nils ◽  
Jan Lundgren
Keyword(s):  
Free Fall ◽  
Frame Rate ◽  
Geometrical Parameters ◽  
Contactless Method ◽  
Molten Material ◽  
Dynamic Changes ◽  
Direct Measurements ◽  
Molten Materials ◽  
Free Falling

High temperatures complicate the direct measurements needed for continuous characterization of the properties of molten materials such as glass. However, the assumption that geometrical changes when the molten material is in free-fall can be correlated with material characteristics such as viscosity opens the door to a highly accurate contactless method characterizing small dynamic changes. This paper proposes multi-camera setup to achieve accuracy close to the segmentation error associated with the resolution of the images. The experimental setup presented shows that the geometrical parameters can be characterized dynamically through the whole free-fall process at a frame rate of 600 frames per second. The results achieved show the proposed multi-camera setup is suitable for estimating the length of free-falling molten objects.

scholarly journals Membrane permeabilization of mammalian cells using bursts of high magnetic field pulses

PeerJ ◽  
2017 ◽  
Vol 5 ◽  
pp. e3267 ◽  
Author(s):  
Vitalij Novickij ◽  
Janja Dermol ◽  
Audrius Grainys ◽  
Matej Kranjc ◽  
Damijan Miklavčič
Keyword(s):  
Mammalian Cells ◽  
Fluorescent Dyes ◽  
Pulse Generator ◽  
Chinese Hamster ◽  
Electrical Conductance ◽  
Single Pulse ◽  
Membrane Permeabilization ◽  
Contactless Method ◽  
Dependent Manner ◽  
Cell Permeabilization

Background Cell membrane permeabilization by pulsed electromagnetic fields (PEMF) is a novel contactless method which results in effects similar to conventional electroporation. The non-invasiveness of the methodology, independence from the biological object homogeneity and electrical conductance introduce high flexibility and potential applicability of the PEMF in biomedicine, food processing, and biotechnology. The inferior effectiveness of the PEMF permeabilization compared to standard electroporation and the lack of clear description of the induced transmembrane transport are currently of major concern. Methods The PEMF permeabilization experiments have been performed using a 5.5 T, 1.2 J pulse generator with a multilayer inductor as an applicator. We investigated the feasibility to increase membrane permeability of Chinese Hamster Ovary (CHO) cells using short microsecond (15 µs) pulse bursts (100 or 200 pulses) at low frequency (1 Hz) and high dB/dt (>106 T/s). The effectiveness of the treatment was evaluated by fluorescence microscopy and flow cytometry using two different fluorescent dyes: propidium iodide (PI) and YO-PRO®-1 (YP). The results were compared to conventional electroporation (single pulse, 1.2 kV/cm, 100 µs), i.e., positive control. Results The proposed PEMF protocols (both for 100 and 200 pulses) resulted in increased number of permeable cells (70 ± 11% for PI and 67 ± 9% for YP). Both cell permeabilization assays also showed a significant (8 ± 2% for PI and 35 ± 14% for YP) increase in fluorescence intensity indicating membrane permeabilization. The survival was not affected. Discussion The obtained results demonstrate the potential of PEMF as a contactless treatment for achieving reversible permeabilization of biological cells. Similar to electroporation, the PEMF permeabilization efficacy is influenced by pulse parameters in a dose-dependent manner.

scholarly journals Measurement of clips geometry for elements fastening rail to sleepers

2019 ◽  
Vol 2019 (3) ◽  
pp. 1-11
Author(s):  
Mirosław Guzik ◽  
Piotr Lesiak
Keyword(s):  
Data Sheet ◽  
Contactless Method ◽  
Tolerance Limits ◽  
Optical Scanner ◽  
The Future

Measuring results of SB4 clips geometry that are used to fasten rails to sleepers have been presented in this paper. The measurements were carried out in compliance with suggestions presented by PKP PLK S.A., with the use of contactless method. This method uses 3D optical scanner along with dedicated software to precisely measure the geometry of the clip. It allowed authors to check if all dimensions of the clip whose parameters are specified in its data sheet are within tolerance limits. It turns out that some dimensions significantly differ from their nominal values. It results from the fact that the geometry of real clips is partially simplified. In the future, authors are going to increase the population of examined clips and the period of observation of the change of their dimensions.

scholarly journals A Contactless Method for Determining the Carrier Mobility Sum in Silicon Wafers

2012 ◽  
Vol 2 (1) ◽  
pp. 41-46 ◽  
Author(s):  
Fiacre E. Rougieux ◽  
Peiting Zheng ◽  
Matthieu Thiboust ◽  
Jason Tan ◽  
Nicholas E. Grant ◽  
...  
Keyword(s):  
Carrier Mobility ◽  
Silicon Wafers ◽  
Contactless Method

scholarly journals PP-42 THE NEW CONTACTLESS METHOD FOR TROPHECTODERM BIOPSY

2012 ◽  
Vol 24 ◽  
pp. S21
Author(s):  
Yulia Khramova ◽  
Sergey Sergeev ◽  
Inna Ilina ◽  
Dmitry Sitnikov ◽  
Andrey Ovchinnikov ◽  
...  
Keyword(s):  
Contactless Method ◽  
Trophectoderm Biopsy

Strain monitoring on pre-stressed CFRP laminates through computer vision

2019 ◽  
Author(s):  
Bruno Santos ◽  
Jónatas Valença ◽  
Filipe Dourado ◽  
Eduardo Júlio
Keyword(s):  
Computer Vision ◽  
Fiber Reinforced Polymer ◽  
Added Value ◽  
Contactless Method ◽  
Correct Operation ◽  
Cfrp Laminates ◽  
Strain Monitoring ◽  
Reinforced Polymer ◽  
Dependent Behavior ◽  
Periodic Inspections

<p>Strengthening reinforced concrete (RC) members with Carbon Fiber Reinforced Polymer (CFRP) solutions is currently a widespread technique. The success in increasing the strength and/or in controlling the deformation of structural members using CFRPs has been recognized worldwide, and most relevant aspects have been thoroughly studied and published. For large-span beams and slabs, the method is much more effective if pre- stressed CFRP laminates are adopted. Therefore, onsite measurements of the applied strain state, as well as of its evolution with time due to pre-stress losses, are mandatory to ensure a correct operation and to monitor the time-dependent behavior. Presently, the former is assessed only indirectly, through load control when pre-stress is applied, and the latter simply is not conducted since there is no budget to comply with.</p><p>In this paper a first step of a vision-based method to measure the strain level in CFRP laminates during the strengthening operations, as well as during periodic inspections later on, is presented. The method uses computer vision and was applied and validated in computational simulations. The results achieved allowed to establish the limits of validation of the algorithms developed and implemented. The contactless method proposed will represent a major added value for the already widespread technique of reinforcement of RC members with pre-stressed CFRP laminates.</p>

In SEM a New Method of Internal Micrographic Visualization of Semiconductor Materials and IC by Crossing the Surface

2001 ◽  
Vol 7 (S2) ◽  
pp. 484-485
Author(s):  
Ling Xiao ◽  
Zhuguan Liang ◽  
Yawen Li ◽  
Jian Wang ◽  
Kailin Zhou ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Integrated Circuit ◽  
Silicon Oxide ◽  
Detection Method ◽  
New Method ◽  
Semiconductor Materials ◽  
Contactless Method ◽  
Quality And Reliability ◽  
Nitride Layers ◽  
Scanning Electron

In the paper, we firstly publish a new method of internal micrographic visualization of semiconductor and IC. The quality and reliability of the semiconductor materials (SM) and the integrated circuits (IC) have always been concerned Having a high resolution, high reliable and nondestructive detection method is the key element for their improvements.Silicon oxide layers are used to provide the electrical insulation in the multi-structured ICs. The IC device surfaces are often protected by silicon oxide and silicon nitride layers. Therefore, these insulation layers also cover any inhomogeneity and defect located within the IC devices. It is necessary to have an examining method to detect those defects that are under the insulation layers without damaging the samples. However, the conventional scanning electron microscope (SEM) cannot be utilized to image and examine the surfaces that are positioned below the insulation layers.Novel nondestructive and contactless method has been developed in our laboratory to obtain the internal micrograph that crosses the surface of the semiconductor material and the integrated circuit.

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